Hall probe simulator circuit
A simulated Hall probe, provide EPR coil driver, and/or perform a time-domain full scan sinusoidal deconvolution of EPR signals. The simulated Hall probe can return a Hall Effect voltage from a coil current that creates a magnetic field within a coil magnet and the reference current that would be fed to an actual Hall probe. From these values, the Hall Effective voltage can be determined which can be used to determine the magnetic field flux, which can then be used to regulate the magnetic field.
1. A Hall probe simulator circuit for producing a simulated Hall effect voltage VH generatable by a Hall probe if the Hall probe were placed in a magnetic field created within a coil of wire, without actual use of the Hall probe, the Hall probe simulator circuit comprising:
a reference current input configured to measure a reference voltage across a reference resistor by converting a reference current which is input into the reference resistor into a measured reference voltage VR;
a current sensor comprising a current sense resistor configured to sense a coil current in the coil of wire;
a controller coupled with the reference current input and the current sensor, wherein the controller is configured to produce the simulated Hall effect voltage VH, wherein producing the simulated Hall effect voltage VH comprises a multiplier for multiplying the sensed coil current times the measured reference voltage VR and a constant; and
a water-cooled heat sink,
wherein the current sense resistor is attached to the water-cooled heat sink,
wherein the water-cooled heat sink is also used for a magnet power supply, and
wherein the current sense resistor has a low resistance and a low temperature coefficient.
2. The Hall probe simulator circuit according to claim 1 , wherein the controller is further configured to determine a magnitude of a magnetic field produced by the coil of wire.
3. The Hall probe simulator circuit according to claim 1 , further comprising a temperature regulator coupled at least partially with the reference resistor and configured to regulate the temperature of the reference resistor.
4. The Hall probe simulator circuit according to claim 1 ,
wherein the current sensor is configured to sense a current sense voltage across the current sense resistor, wherein the current sense voltage is proportional to the coil current,
wherein the constant comprises a first constant, and
wherein determining the simulated Hall effect voltage comprises multiplying the current sense voltage times the measured reference voltage and a second constant.
5. The Hall probe simulator circuit according to claim 4 , further comprising a temperature regulator coupled at least partially with the current sense resistor and configured to regulate the temperature of the current sense resistor.
6. The Hall probe simulator circuit according to claim 1 , wherein the constant comprises a Hall effect constant.
7. The Hall probe simulator circuit according to claim 1 , wherein the controller is further configured to regulate the coil current in response to the simulated Hall effect voltage.
8. The Hall probe simulator circuit of claim 1 , comprised in a system that further comprises:
a Hall probe, separate from the Hall probe simulator; and
a switch configured to enable switching between using the Hall probe simulator and the Hall probe.
9. A method for operating a Hall probe simulator circuit for producing a simulated Hall Effect voltage VH generatable by a Hall probe if the Hall probe were placed in a magnetic field created within a coil of wire, without actual use of the Hall probe, the method comprising:
sensing a coil current in the coil of wire using a current sense resistor of a current sensor;
sensing a reference voltage across a reference resistor so as to by converting a reference current input into the reference resistor into a measured reference voltage VR;
producing the simulated Hall effect voltage VH using a controller coupled with the reference current input and the current sensor by using a multiplier to multiply the coil current times the measured reference voltage and a constant;
attaching the current sense resistor to a water-cooled heat sink such that the current sense resistor exhibits a low resistance and a low temperature coefficient; and
using the water-cooled heat sink for a magnet power supply.
10. The method of claim 9 , further comprising determining a magnitude of a magnetic field produced by the coil of wire.
11. The method of claim 9 , wherein sensing the coil current comprises sensing a current sense voltage across the current sense resistor in series with the coil of wire,
wherein the constant comprises a first constant, and
wherein determining the simulated the Hall effect voltage comprises multiplying the current sense voltage times the measured reference voltage and a second constant, wherein the current sense voltage is proportional to the coil current.
12. The method of claim 11 , further comprising regulating the temperature of the current sense resistor.
13. The method of claim 9 , further comprising regulating the coil current in response to the simulated Hall effect voltage.
14. A Hall probe simulator circuit for producing a simulated Hall effect voltage VH generatable by a Hall probe if the Hall probe were placed in a magnetic field created within a coil of wire, without actual use of the Hall probe, the Hall probe simulator circuit comprising:
a reference current input configured to measure a reference voltage across a reference resistor by converting a reference current which is input into the reference resistor into a measured reference voltage VR; and
a current sensor comprising a current sense resistor configured to sense a coil current in the coil of wire;
a controller coupled with the reference current input and the current sensor, wherein the controller is configured to produce the simulated Hall effect voltage VH, wherein producing the simulated Hall effect voltage VH comprises multiplying the sensed coil current times the measured reference voltage VR and a constant; and
a switch configured to enable switching between using the Hall probe simulator circuit and an actual Hall probe, the actual Hall probe being separate from the Hall probe simulator circuit,
wherein the Hall probe simulator is configured to:
detect a signal phase from the actual Hall probe,
adjust a signal phase of the Hall probe simulator to match the signal phase from the actual Hall probe, and
engage a phase reversal switch, which can allow for connecting a magnet current so that it flows in either direction through the Hall probe simulator circuit.
15. The Hall probe simulator circuit of claim 14 , further comprising a temperature regulator coupled at least partially with the reference resistor and configured to regulate the temperature of the reference resistor.
16. The Hall probe simulator circuit of claim 14 ,
wherein the current sensor is configured to sense a current sense voltage across the current sense resistor, wherein the current sense voltage is proportional to the coil current,
wherein the constant comprises a first constant, and
wherein determining the simulated Hall effect voltage comprises multiplying the current sense voltage times the measured reference voltage and a second constant.
17. The Hall probe simulator circuit of claim 16 , further comprising a temperature regulator coupled at least partially with the current sense resistor and configured to regulate the temperature of the current sense resistor.
18. The Hall probe simulator circuit of claim 14 , wherein the constant comprises a Hall effect constant.
19. The Hall probe simulator of claim 14 , wherein the controller is further configured to regulate the coil current in response to the simulated Hall effect voltage.