Probe support apparatus
Employed is a probe support apparatus having: a base stand; an arm connected to an upper end of the base stand so that the arm can be tilted and rotated in a horizontal direction; and a probe support section connected to a distal end of the arm at a side opposite that of a portion connected to the base stand. The probe support section is constituted by a deformable section and a non-deformable section, and the non-deformable section is connected to a distal end of the arm so that the non-deformable section can rotate about an axis parallel to a rotation axis about which the arm is tilted.
1. A probe support apparatus comprising:
a base stand;
a horizontal rotation member having a circumferential rotation axis extending vertically, configured to rotate circumferentially with respect to said base stand and connected to said base stand;
a tilting-rotation member having a tilt axis extending in a horizontal direction, configured to tilt with respect to said base stand and connected to said horizontal rotation member;
an arm connected to said base stand via said horizontal rotation member and said tilting-rotation member so as to rotate circumferentially in a horizontal direction and tilt in a vertical plane; and
a probe support member having a non-deformable section connected to said arm and a deformable section connected to said non-deformable section and configured to be connected to a probe,
wherein said arm has an alternative tilt axis extending in said horizontal direction at a far side far from said tilting-rotation member, and
wherein said non-deformable section is tiltably connected to the arm via said alternative tilt axis so that said non-deformable section can tilt around said alternative tilt axis parallel to said tilt axis.
2. The probe support apparatus according to claim 1 , further comprising a probe connected to a distal end of said deformable section on a side opposite that of a portion connected to said non-deformable section.
3. The probe support apparatus according to claim 1 , wherein said deformable section is in a state of hanging down in a vertical direction from a portion connected to said non-deformable section.
4. The probe support apparatus according to claim 2 , wherein when a user lifts said probe through a distance equal to or greater than a predetermined value, said arm is lifted due to rigidity of said probe support member.
5. The probe support apparatus according to claim 1 , wherein said probe support member transmits a force to said arm when a force equal to or greater than a predetermined value is applied thereto.
6. The probe support apparatus according to claim 1 , wherein said base stand extends or contracts according to the tilting of said arm.
7. The probe support apparatus according to claim 1 , wherein said deformable section has a structure such that bending at a predetermined angle or more is restricted.
8. The probe support apparatus according to claim 1 , wherein the deformable section has an internal tubular space such that an electrical cable connected to the probe is inserted through.
9. The probe support apparatus according to claim 1 , wherein the deformable section has an internal tubular space such that an optical fiber connected to the probe is inserted through.