IP Library › Granted Patent US 9,590,055
Granted Patent B2
US 9,590,055 · App. 14/436,373 · Granted Mar 7, 2017

Thin film transistor, method for manufacturing the same, array substrate, and display device

Inventors: Chunwei Wu (Beijing, CN); Woobong Lee (Beijing, CN)
Assignees: BOE TECHNOLOGY GROUP CO., LTD.; HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
H01L29/41733H01L27/1225H01L29/66969H01L29/7869
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Quick Facts
Patent No.
US 9,590,055
App. No.
14/436,373
Granted
Mar 7, 2017
Kind
B2
Abstract

The present disclosure provides a thin film transistor and its manufacturing method, an array substrate, a display device. The thin film transistor includes a gate electrode, a gate insulating layer, an active layer, a source electrode and a drain electrode. The source electrode and the drain electrode are formed above the active layer and located at a first end and a second end of the active layer which are opposite to each other, respectively. The drain electrode completely covers the second end of the active layer.

Claims (24)

1. A thin film transistor, comprising a gate electrode, a gate insulating layer, an active layer, a source electrode and a drain electrode,

wherein the source electrode and the drain electrode are formed above the active layer, and located at a first end and a second end of the active layer which are opposite to each other, respectively; and

the drain electrode completely covers the second end of the active layer,

wherein the drain electrode comprises a covering electrode and a contacting electrode connected to each other, the covering electrode completely covers the second end of the active layer and is of a width in a longitudinal direction greater than or equal to that of the active layer, the contacting electrode is configured to contact a pixel electrode and is of a width in the longitudinal direction greater than that of the covering electrode, the longitudinal direction is perpendicular to a connecting line between the first end and the second end of the active layer.

2. The thin film transistor according to claim 1 , wherein the drain electrode is of a rectangular shape.

3. The thin film transistor according to claim 1 , wherein the drain electrode further comprises a connecting electrode located between the covering electrode and the contacting electrode and connected to the covering electrode and the contacting electrode respectively, wherein

the connecting electrode at least partially overlaps the gate electrode and is of a width in the longitudinal direction smaller than that of the covering electrode.

4. The thin film transistor according to claim 3 , wherein the covering electrode and the connecting electrode are connected in a T form or an L form.

5. The thin film transistor according to claim 1 , wherein the covering electrode is of a rectangular shape.

6. The thin film transistor according to claim 1 , wherein the covering electrode is of a shape of a Chinese character “ ” with an opening towards the source electrode.

7. The thin film transistor according to claim 3 , wherein the contacting electrode is of a width in the longitudinal direction greater than or equal to that of the connecting electrode.

8. The thin film transistor according to claim 1 , wherein the source electrode completely covers the first end of the active layer.

9. The thin film transistor according to claim 1 , wherein the source electrode comprises a first electrode, a second electrode and a third electrode; the second electrode is located between the first electrode and the third electrode, and connected to the first electrode and the third electrode respectively;

the first electrode completely covers the first end of the active layer;

the second electrode at least partially overlaps the gate electrode and is of a width in the longitudinal direction smaller than that of the first electrode and the second electrode respectively.

10. The thin film transistor according to claim 9 , wherein the first electrode and the second electrode are connected in a T form or an L form.

11. The thin film transistor according to claim 9 , wherein the first electrode is of a rectangular shape.

12. The thin film transistor according to claim 9 , wherein the first electrode is of a shape of a Chinese character “ ” with an opening towards the drain electrode.

13. An array substrate, comprising the thin film transistor according to claim 1 .

14. A display device, comprising the array substrate according to claim 13 .

15. A method for manufacturing a thin film transistor, comprising a step of forming a gate electrode, a gate insulating layer, an active layer, a source electrode and a drain electrode,

wherein the source electrode and the drain electrode are formed above the active layer, and located at a first end and a second end of the active layer which are opposite to each other, respectively,

the drain electrode completely covers the second end of the active layer,

wherein the drain electrode comprises a covering electrode and a contacting electrode connected to each other, the covering electrode completely covers the second end of the active layer, and is of a width in a longitudinal direction greater than or equal to that of the active layer; the contacting electrode is configured to contact a pixel electrode; and is of a width in the longitudinal direction greater than that of the covering direction is perpendicular to a connecting line between the first end and the second end of the active layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 16, 2015
From: WU, CHUNWEI; LEE, WOOBONG
To: BOE TECHNOLOGY GROUP CO., LTD.; HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
Reel/Frame 035428/0975 →
Priority Claims (1)
CN 2014 1 0113582 · Mar 25, 2014 · national
Continuity (1)
Related Publication 20160293716A1 · Oct 6, 2016