Aperture scanning fourier ptychographic imaging
Certain aspects pertain to aperture-scanning Fourier ptychographic imaging devices comprising an aperture scanner that can generate an aperture at different locations at an intermediate plane of an optical arrangement, and a detector that can acquire lower resolution intensity images for different aperture locations, and wherein a higher resolution complex image may be constructed by iteratively updating regions in Fourier space with the acquired lower resolution images.
1. An aperture-scanning Fourier ptychographic imaging device, comprising:
a first optical element configured to receive light from a sample;
a second optical element;
an aperture scanner configured to generate an aperture at a plurality of aperture locations in an intermediate plane, the aperture configured to pass incident light at the aperture from the first optical element to the second optical element;
a light detector configured to receive light from the second optical element and to acquire a plurality of intensity images associated with different aperture locations; and
a processor configured to construct a complex image of the sample by iteratively updating regions in Fourier space with the acquired intensity images.
2. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein the intermediate plane is a Fourier plane associated with a sample plane.
3. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein each of the plurality of intensity images acquired by the light detector uniquely corresponds to a different aperture location of the plurality of aperture locations.
4. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein the aperture scanner is further configured to generate additional apertures at the intermediate plane to form a plurality of apertures during each acquisition time.
5. The aperture-scanning Fourier ptychographic imaging device of claim 1 , further comprising an aperture overlap between adjacent aperture locations in the plurality of aperture locations.
6. The aperture-scanning Fourier ptychographic imaging device of claim 5 , wherein the overlap is at least about 70% of an area of the aperture.
7. The aperture-scanning Fourier ptychographic imaging device of claim 5 , wherein the overlap is at least about 75% of an area of the aperture.
8. The aperture-scanning Fourier ptychographic imaging device of claim 5 , wherein the overlap is between 20% and 90% of an area of the aperture.
9. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein the first optical element and/or the second second optical element is a lens.
10. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein the first optical element and second optical element are in a 4f configuration.
11. The aperture-scanning Fourier ptychographic imaging device of claim 1 ,
wherein the first optical element has a first focal length, and is located the first focal length from the sample plane,
wherein the second optical element has a second focal length, and is located the second focal length from the intermediate plane, and
wherein the intermediate plane is a located a first focal length away from the first optical element an is located the first focal length away from the first optical element.
12. The aperture-scanning Fourier ptychographic imaging device of claim 11 , wherein the light detector is located at the second focal length from the second optical element.
13. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein the aperture scanner is a spatial light modulator configured to display the aperture as a reflective element.
14. The aperture-scanning Fourier ptychographic imaging device of claim 13 , wherein the spatial light modulator comprises a liquid crystal on silicon display for displaying the reflective element.
15. The aperture-scanning Fourier ptychographic imaging device of claim 1 , wherein the aperture scanner comprises a digital micromirror device.
16. The aperture-scanning Fourier ptychographic imaging device of claim 15 , wherein the aperture comprises one or more micromirrors oriented at a first angle to reflect incident light to the second optical element, wherein an area surrounding the aperture comprises one or more micromirrors oriented at a second angle to reflect incident light away from the second optical element.
17. An aperture-scanning Fourier ptychographic imaging method, comprising:
illuminating a sample;
receiving incident light at a first optical element from the sample;
generating an aperture at a plurality of locations at an intermediate plane;
passing incident light at the aperture from the first optical element to a second optical element;
acquiring a plurality of intensity images using a detector receiving light from the second optical element; and
constructing a complex image of the sample by iteratively updating regions in Fourier space with the plurality of intensity images.
18. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein the intermediate plane is a Fourier plane corresponding to a sample plane.
19. The aperture-scanning Fourier ptychographic imaging method of claim 17 , further comprising generating additional apertures at the intermediate plane to form a plurality of apertures at the intermediate during each acquisition time.
20. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein generating the aperture comprises displaying one or more reflective elements on a display of a spatial light modulator.
21. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein generating the aperture comprises orienting one or more micromirrors to reflect incident light to the second optical element.
22. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein the plurality of intensity images captured by the detector uniquely correspond to different aperture locations of the plurality of aperture locations.
23. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein there is an aperture overlap at adjacent aperture locations of the plurality of aperture locations.
24. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein the aperture overlap is at least about 70% of an area of the aperture.
25. The aperture-scanning Fourier ptychographic imaging method of claim 17 , further comprising propagating the complex image to one or more planes.
26. The aperture-scanning Fourier ptychographic imaging method of claim 17 , wherein constructing a complex image of the sample by iteratively updating regions in Fourier space with the plurality of intensity images, comprises:
(a) initializing a current higher-resolution image in Fourier space;
(b) filtering an overlapping region of the current higher-resolution image in Fourier space to generate an intensity image for an aperture location of the plurality of aperture locations;
(c) replacing intensity of the intensity image with an intensity measurement; and
(d) updating the overlapping region in Fourier space with the intensity image with measured intensity.