IP Library Granted Patent US 9,373,661
Granted Patent B2
US 9,373,661 · App. 14/460,297 · Granted Jun 21, 2016

Solid state transducer devices, including devices having integrated electrostatic discharge protection, and associated systems and methods

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Quick Facts
Patent No.
US 9,373,661
App. No.
14/460,297
Granted
Jun 21, 2016
Kind
B2
Abstract

Solid state transducer devices having integrated electrostatic discharge protection and associated systems and methods are disclosed herein. In one embodiment, a solid state transducer device includes a solid state emitter, and an electrostatic discharge device carried by the solid state emitter. In some embodiments, the electrostatic discharge device and the solid state emitter share a common first contact and a common second contact. In further embodiments, the solid state lighting device and the electrostatic discharge device share a common epitaxial substrate. In still further embodiments, the electrostatic discharge device is positioned between the solid state lighting device and a support substrate.

Claims (41)

1. A method of forming a solid state transducer device, comprising:

forming a solid state emitter from an epitaxial substrate, the solid state emitter having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

selectively removing a portion of the epitaxial substrate; and

forming an electrostatic discharge device from a remaining portion of the epitaxial substrate.

2. The method of claim 1 , further comprising carrying the solid state emitter with a first substrate, the first substrate having a conductive structure contacting the solid state emitter.

3. The method of claim 1 wherein forming the electrostatic discharge device includes forming multiple series-connected electrostatic discharge junctions.

4. The method of claim 1 wherein:

forming the solid state emitter includes forming the solid state emitter on a buffer material formed from the epitaxial substrate; and

forming the electrostatic discharge device includes forming the electrostatic discharge device from the buffer material.

5. The method of claim 4 wherein the buffer material and the remaining portion of the epitaxial substrate form a p-n junction.

6. The method of claim 5 wherein the remaining portion of the epitaxial substrate comprises a portion of an engineered substrate.

7. The method of claim 5 wherein the remaining portion of the epitaxial substrate comprises polyaluminum nitride, and wherein the portion of the buffer material comprises silicon.

8. A method of forming a solid state transducer device, comprising:

forming a solid state emitter from an epitaxial substrate, the solid state emitter having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

selectively etching away a portion of the epitaxial substrate from the solid state emitter, and

forming an electrostatic discharge device from a remaining portion of the epitaxial substrate.

9. A method of forming a solid state transducer device, comprising:

forming a solid state emitter from an epitaxial substrate, the solid state emitter having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

carrying the solid state emitter with a first substrate, the first substrate having a conductive structure contacting the solid state emitter; and

forming an electrostatic discharge device from the epitaxial substrate, wherein forming the electrostatic discharge device comprises:

forming a via through the electrostatic discharge device and at least a portion of the solid state emitter,

depositing a first conductive material in the via, wherein the first conductive material contacts the conductive structure; and

depositing a second conductive material on the solid state emitter and the electrostatic discharge device.

10. The method of claim 9 , further comprising depositing an insulative material in the via prior to depositing the first conductive material in the via.

11. The method of claim 9 wherein depositing the first and second conductive materials includes connecting the electrostatic discharge device in parallel with the solid state emitter.

12. A method of forming a solid state transducer device, comprising:

forming a solid state emitter having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials;

forming an electrostatic discharge device on the solid state emitter, wherein the electrostatic discharge device having a first electrical contact and a second electrical contact; and

electrically coupling the first semiconductor material to the first electrical contact and electrically coupling the second semiconductor material to the second electrical contact.

13. The method of claim 12 further comprising:

forming the solid state emitter on an epitaxial substrate;

removing a portion of the epitaxial substrate; and

forming the electrostatic discharge device from a remaining portion of the epitaxial substrate.

14. A method of forming a solid state transducer device, comprising:

forming a solid state emitter having a first semiconductor material, a second semiconductor material, and an active region between the first and second semiconductor materials; and

forming an electrostatic discharge device on the solid state emitter, wherein forming the electrostatic discharge device comprises forming an electrostatic junction having a first conductive material, a second conductive material, and a third semiconductor material between the first conductive material and the second conductive material.

15. The method of claim 14 , further comprising electrically connecting the second conductive material to the second semiconductor material.

16. The method of claim 14 wherein forming the electrostatic discharge device comprises forming a plurality of series-connected electrostatic junctions, with individual electrostatic junctions comprising a portion of the first conductive material, a portion of the second conductive material, and a portion of the third semiconductor material, and wherein the method further comprises connecting the first conductive material of one electrostatic junction with the second conductive material of an adjacent electrostatic junction.

17. The method of claim 14 wherein forming the electrostatic discharge device further comprises:

forming a via through at least a portion of the solid state emitter; and

electrically connecting the first conductive material to the first semiconductor material with a third conductive material in the via.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →