IP Library › Granted Patent US 9,541,602
Granted Patent B2
US 9,541,602 · App. 14/466,500 · Granted Jan 10, 2017

Electronic component inspection apparatus and method

Inventors: Hiroshi Kurosawa (Kawasaki, JP); Masayuki Itoh (Kawasaki, JP); Kiyokazu Moriizumi (Kawasaki, JP)
Assignee: FUJITSU LIMITED
G01R31/311G01N21/956G01N21/95684G01R31/026H05K1/0269G01N2021/95638H01L2224/16225H05K3/3436H05K2201/10106H05K2201/10734
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Quick Facts
Patent No.
US 9,541,602
App. No.
14/466,500
Granted
Jan 10, 2017
Kind
B2
Abstract

An electronic component inspection apparatus includes a light source arranged in a mounting area where at least one electronic component is mounted to a board and a light-receiving sensor arranged outside the mounting area to detect an intensity of a light received from the light source. A computer executes a program to perform a process of determining a state of joining parts in the mounting area based on a result of comparison of the intensity of the light received by the light-receiving sensor with an intensity of distribution previously acquired.

Claims (24)

1. An electronic component inspection apparatus comprising:

a light source disposed in a mounting area where at least one electronic component is mounted on a board;

a light-receiving sensor disposed outside the mounting area and configured to receive a spectrally dispersed light having a wavelength in a predetermined wavelength range after a light emitted by the light source passes through spaces between joining parts in the mounting area, and detect an intensity of the spectrally dispersed light; and

a computer configured to

acquire an intensity distribution of the spectrally dispersed light by performing spectral analysis on the intensity of the spectrally dispersed light detected by the light-receiving sensor,

compare the acquired intensity distribution with a previously acquired intensity distribution, and

determine a state of the joining parts based on a result of the comparison.

2. The electronic component inspection apparatus as claimed in claim 1 , further comprising:

a placement table on which the board with the electronic component mounted on the board is placed; and

a rotating mechanism to rotate the placement table.

3. The electronic component inspection apparatus as claimed in claim 1 , wherein the light-receiving sensor includes a line image sensor having a length corresponding to one side of the electronic component.

4. The electronic component inspection apparatus as claimed in claim 1 , wherein the light-receiving sensor includes a line image sensor having a frame form to surround an entire periphery of the electronic component.

5. The electronic component inspection apparatus as claimed in claim 1 , wherein the light source is provided to an end of a support member inserted into a through hole penetrating the board.

6. The electronic component inspection apparatus as claimed in claim 1 , wherein the light source includes a white light emitting diode, and the light-receiving sensor includes a color filter that selectively transmits a light of a predetermined color.

7. The electronic component inspection apparatus as claimed in claim 1 , wherein the light source is a monochromatic light emitting diode.

8. An electronic component inspection method, comprising:

emitting a light from a light source disposed in a mounting area between a board and at least one electronic component mounted on the board toward a periphery of the mounting area;

receiving, by a light-receiving sensor disposed outside the mounting area, a spectrally dispersed light having a wavelength in a predetermined wavelength range after the light emitted by the light source passes through spaces between joining parts in the mounting area, to detect an intensity of the spectrally dispersed light;

acquiring, by a computer, an intensity distribution of the spectrally dispersed light by performing spectral analysis on the intensity of the spectrally dispersed light detected by the light-receiving sensor;

comparing the acquired intensity distribution with a previously acquired intensity distribution; and

determining a state of the joining parts based on a result of the comparison.

9. The electronic component inspection method as claimed in claim 8 , further comprising:

providing a placement table on which the board with the electronic component mounted on the board is placed, and a rotating mechanism to rotate the placement table; and

rotating, by the rotating mechanism, the electronic component together with the placement table before the spectrally dispersed light is received by the light-receiving sensor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2014
From: KUROSAWA, HIROSHI; ITOH, MASAYUKI; MORIIZUMI, KIYOKAZU
To: FUJITSU LIMITED
Reel/Frame 033721/0538 →
Continuity (2)
Continuation PCTJP2012056028 · Mar 8, 2012
Related Publication 20140361782A1 · Dec 11, 2014