Inferring threshold voltage distributions associated with memory cells via interpolation
View Patent ↗Apparatuses and methods for inferring threshold voltage distributions associated with memory cells via interpolation are described herein. An example includes determining soft data for a group of memory cells each programmed to one of a number of data states, wherein the soft data comprises a number of different soft data values, determining a quantity of memory cells associated with each of the different soft data values, and inferring at least a portion of a threshold voltage distribution associated with the group of memory cells via an interpolation process using the determined quantities of memory cells associated with each of the different soft data values.
1. A method for operating memory, comprising:
determining a quantity of memory cells associated with each of a number of different soft data values; and
inferring at least a portion of a threshold voltage distribution associated with the memory cells via an interpolation process using the determined quantities of memory cells associated with each of the different soft data values.
2. The method of claim 1 , wherein the method includes determining soft data for the memory cells, wherein the soft data includes the number of different soft data values.
3. The method of claim 1 , wherein the memory cells are each programmed to one of a plurality of data states.
4. The method of claim 1 , wherein the method includes:
using a controller to determine the quantity of memory cells associated with each of the different soft data values; and
using a controller to infer the at least a portion of the threshold voltage distribution.
5. The method of claim 1 , wherein the at least a portion of the threshold voltage distribution includes at least a portion of a threshold voltage distribution curve.
6. A method for operating memory, comprising:
determining a quantity of memory cells associated with each of a number of different soft data values;
normalizing the determined quantities of memory cells associated with each of the different soft data values; and
inferring at least a portion of a threshold voltage distribution associated with the memory cells via an interpolation process using the normalized quantities of memory cells associated with each of the different soft data values.
7. The method of claim 6 , wherein the method includes determining, using a number of sensing voltages spaced apart by a voltage amount, soft data for the memory cells, wherein the soft data includes the number of different soft data values.
8. The method of claim 7 , wherein the method includes:
assigning a threshold voltage value to represent each of the spacings between the sensing voltages; and
inferring the at least a portion of the threshold voltage distribution associated with the memory cells via the interpolation process using the threshold voltage values assigned to represent each of the spacings between the sensing voltages.
9. The method of claim 6 , wherein determining the quantity of memory cells associated with each of the different soft data values includes creating a histogram for each of the different soft data values, wherein a height of each respective histogram corresponds to the quantity of memory cells associated with the soft data value for that histogram.
10. The method of claim 9 , wherein normalizing the determined quantities of memory cells associated with each of the different soft data values includes adjusting the heights of a number of the histograms such that a weight of the quantities of memory cells associated with each of the different soft data values is equal, wherein the height of each respective histogram after the adjustment corresponds to the normalized quantities of memory cells associated with each of the different soft data values.
11. An apparatus, comprising:
an array of memory cells; and
a controller coupled to the array and configured to:
determine a quantity of memory cells associated with each of a number of different soft data values; and
perform an interpolation process using the determined quantities of memory cells associated with each of the different soft data values to infer at least a portion of a threshold voltage distribution curve associated with the memory cells.
12. The apparatus of claim 11 , wherein the controller includes an interpolation engine configured to perform the interpolation process.
13. The apparatus of claim 11 , wherein the controller includes a histogram builder configured to create a histogram for each of the different soft data values to determine the quantity of memory cells associated with each of the different soft data values.
14. The apparatus of claim 11 , wherein the controller is configured to determine a sensing voltage for the memory cells based on the inferred portion of the threshold voltage distribution curve.
15. The apparatus of claim 11 , wherein a type of the interpolation process depends on a number of the determined quantities of memory cells associated with each of the different soft data values.
16. An apparatus, comprising:
an array of memory cells; and
a controller coupled to the array and configured to:
assign a threshold voltage value to represent each spacing between a number of sensing voltages for the memory cells spaced apart by a voltage amount; and
perform an interpolation process using the threshold voltage values assigned to represent the spacings between the sensing voltages to infer at least a portion of a threshold voltage distribution curve associated with the memory cells.
17. The apparatus of claim 16 , wherein the controller is configured to:
determine a quantity of the memory cells associated with each of a number of different soft data values;
normalize the determined quantities of memory cells associated with each of the different soft data values; and
perform the interpolation process using the normalized quantities of memory cells associated with each of the different soft data values to infer the at least a portion of the threshold voltage distribution curve associated with the memory cells.
18. The apparatus of claim 16 , wherein each of the number of sensing voltages are spaced apart by a same voltage amount.
19. The apparatus of claim 16 , wherein each of the number of sensing voltages are spaced apart by different voltage amounts.
20. The apparatus of claim 16 , wherein the controller is configured to assign the threshold voltage values based on a previously determined threshold voltage distribution associated with the memory cells.