IP Library Granted Patent US 9,293,411
Granted Patent B2
US 9,293,411 · App. 14/494,134 · Granted Mar 22, 2016

Semiconductor device and manufacturing method of the same

Inventor: Masanaga Fukasawa (Tokyo, JP)
Assignee: SONY CORPORATION
H01L23/5226H01L21/76898H01L23/481H01L23/528H01L25/0657H01L25/50H01L2225/06541H01L2924/0002
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Quick Facts
Patent No.
US 9,293,411
App. No.
14/494,134
Granted
Mar 22, 2016
Kind
B2
Abstract

Disclosed herein is a semiconductor device including: a substrate having a first conductive layer and a second conductive layer arranged deeper than the first conductive layer; a large-diameter concave portion having, on a main side of a substrate, an opening sized to overlap the first and second conductive layers, with the first conductive layer exposed in part of the bottom of the large-diameter concave portion; a small-diameter concave portion extended from the large-diameter concave portion and formed by digging into the bottom of the large-diameter concave portion, with the second conductive layer exposed at the bottom of the small-diameter concave portion; and a conductive member provided in a connection hole made up of the large- and small-diameter concave portions to connect the first and second conductive layers.

Claims (19)

1. A semiconductor device, comprising:

a substrate having a first conductive layer and a second conductive layer arranged deeper than the first conductive layer, wherein the substrate is a bonded substrate having a substrate including the first conductive layer and a substrate including the second conductive layer bonded together;

a large-diameter concave portion having, on a main side of a substrate, an opening sized to overlap the first and second conductive layers, with the first conductive layer exposed in at least part of the bottom of the large-diameter concave portion, wherein the bottom of the large-diameter concave portion is co-planar with the top of the first conductive layer;

a small-diameter concave portion extended from the large-diameter concave portion with the second conductive layer exposed at the bottom of the small-diameter concave portion;

a conductive member provided in a connection hole made up of the large and small-diameter concave portions to connect the first and second conductive layers; and

an interlayer insulating film exposed to the conductive member, the bottom of the large-diameter concave portion, and the top of the small-diameter concave portion.

2. The semiconductor device of claim 1 , wherein only a top surface of the first conductive layer is exposed at the bottom of the large-diameter concave portion, and wherein only a top surface of the second conductive layer is exposed at the bottom of the small-diameter concave portion.

3. A semiconductor device, comprising:

a substrate having a first conductive layer and a second conductive layer arranged deeper than the first conductive layer, wherein the first conductive layer includes a top surface and a bottom surface;

a large-diameter concave portion having, on a main side of a substrate, an opening sized to overlap the first and second conductive layers, with the first conductive layer exposed in at least part of the bottom of the large-diameter concave portion, wherein the bottom of the large-diameter concave portion is co-planar with the top of the first conductive layer;

a small-diameter concave portion extended from the large-diameter concave portion with the second conductive layer exposed at the bottom of the small-diameter concave portion;

a conductive member provided in a connection hole made up of the large and small-diameter concave portions to connect the first and second conductive layers; and

an interlayer insulating film exposed to the conductive member, the bottom of the large-diameter concave portion, and the top of the small-diameter concave portion, wherein the interlayer insulating film includes a top surface and a bottom surface, and wherein the top surface of the interlayer insulating film is co-planar with the top surface of the first conductive layer.

4. A semiconductor device, comprising:

a substrate having a first conductive layer and a second conductive layer arranged deeper than the first conductive layer, wherein the first conductive layer includes a top surface and a bottom surface;

a large-diameter concave portion having, on a main side of a substrate, an opening sized to overlap the first and second conductive layers, with the first conductive layer exposed in at least part of the bottom of the large-diameter concave portion, wherein the bottom of the large-diameter concave portion is co-planar with the top of the first conductive layer;

a small-diameter concave portion extended from the large-diameter concave portion with the second conductive layer exposed at the bottom of the small-diameter concave portion;

a conductive member provided in a connection hole made up of the large and small-diameter concave portions to connect the first and second conductive layers; and

an interlayer insulating film exposed to the conductive member, the bottom of the large-diameter concave portion, and the top of the small-diameter concave portion, wherein the interlayer insulating film includes a top surface and a bottom surface, and wherein the bottom surface of the interlayer insulating film is co-planar with the bottom surface of the first conductive layer.

Priority Claims (1)
JP 2011-219843 · Oct 4, 2011 · national
Continuity (2)
Continuation 13617806 · Sep 14, 2012
Related Publication 20150008591A1 · Jan 8, 2015