IP Library Granted Patent US 9,312,018
Granted Patent B1
US 9,312,018 · App. 14/494,678 · Granted Apr 12, 2016

Sensing with boost

Inventor: Shigekazu Yamada (Tokyo, JP)
Assignee: Intel Corporation
G11C16/26G11C16/30
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Quick Facts
Patent No.
US 9,312,018
App. No.
14/494,678
Granted
Apr 12, 2016
Kind
B1
Abstract

The present disclosure relates to sensing with boost. An apparatus includes boost logic. Boost logic includes a boost source and a plurality of boost interfaces coupled to the boost source. The boost source is configured to provide a boost clamp voltage to each of the plurality of boost interfaces. Each of the plurality of boost interfaces includes a respective buffer configured to buffer the boost source from a respective load. Each boost interface is configured to provide a boost voltage to the respective load. The boost voltage configured to increase a sense window. The boost voltage related to the boost clamp voltage.

Claims (42)

1. An apparatus comprising:

boost logic comprising:

a boost source; and

a plurality of boost interfaces coupled to the boost source,

the boost source configured to provide a boost clamp voltage to each of the plurality of boost interfaces, each of the plurality of boost interfaces comprising a respective buffer configured to buffer the boost source from a respective load, each boost interface configured to provide a boost voltage to the respective load, the boost voltage configured to increase a sense window, the boost voltage related to the boost clamp voltage.

2. The apparatus of claim 1 , wherein the boost logic comprises boost reset logic configured to controllably reset the boost voltage.

3. The apparatus of claim 1 , wherein the boost logic further comprises boost discharge logic configured to reduce the boost voltage from a first boost voltage to a second boost voltage less than the first boost voltage.

4. The apparatus of claim 2 , wherein the boost interface comprises at least a portion of the boost reset logic, the portion comprising a transistor configured to controllably couple a boost local node to a ground.

5. The apparatus of claim 3 , wherein the boost source and the boost interface each comprise a respective portion of the boost discharge logic, the boost source portion comprising a current generator and the boost interface comprising a transistor configured to mirror current generator current in the boost interface, a discharge rate related to the mirrored current.

6. The apparatus of claim 3 , wherein the boost interface comprises at least a portion of the boost discharge logic, the portion comprising a boost discharge transistor coupled to an output of the buffer.

7. The apparatus of claim 3 , wherein the boost source comprises at least a portion of the boost discharge logic, the boost source portion comprising a regulator configured to control the second boost voltage.

8. The apparatus of claim 1 , wherein a number of boost interfaces is greater than ten thousand.

9. A method comprising:

providing, by a boost source, a boost clamp voltage to each of a plurality of boost interfaces;

buffering, by each boost interface, the boost source from a respective load;

providing, by each boost interface, a boost voltage to the respective load, the boost voltage configured to increase a sense window, the boost voltage related to the boost clamp voltage.

10. The method of claim 9 , further comprising:

controllably resetting, by boost reset logic, the boost voltage.

11. The method of claim 9 , further comprising:

reducing, by boost discharge logic, the boost voltage from a first boost voltage to a second boost voltage less than the first boost voltage.

12. The method of claim 10 , wherein the boost interface comprises at least a portion of the boost reset logic and further comprising controllably coupling, by a transistor included in the at least a portion of the boost reset logic, a boost local node to a ground.

13. The method of claim 11 , wherein the boost source and the boost interface each comprise a respective portion of the boost discharge logic, the boost source portion comprising a current generator and the boost interface comprising a transistor and further comprising, generating, by the current generator, a current, and mirroring, by the transistor, the generated current in the boost interface, a discharge rate related to the mirrored current.

14. The method of claim 11 , wherein the boost interface comprises at least a portion of the boost discharge logic, the portion comprising a boost discharge transistor coupled to an output of the buffer.

15. The method of claim 11 , wherein the boost source comprises at least a portion of the boost discharge logic, and further comprising, controlling, by a regulator included in the boost source portion, the second boost voltage.

16. A system comprising:

a processor;

a chipset configured to couple the processor to a peripheral device;

a memory array comprising a plurality of memory cells; and

a memory controller comprising:

boost logic comprising:

a boost source; and

a plurality of boost interfaces coupled to the boost source,

the boost source configured to provide a boost clamp voltage to each of the plurality of boost interfaces, each of the plurality of boost interfaces comprising a respective buffer configured to buffer the boost source from a respective load, each boost interface configured to provide a boost voltage to the respective load, the boost voltage configured to increase a sense window, the boost voltage related to the boost clamp voltage.

17. The system of claim 16 , wherein the boost logic comprises boost reset logic configured to controllably reset the boost voltage.

18. The system of claim 16 , wherein the boost logic further comprises boost discharge logic configured to reduce the boost voltage from a first boost voltage to a second boost voltage less than the first boost voltage.

19. The system of claim 17 , wherein the boost interface comprises at least a portion of the boost reset logic, the portion comprising a transistor configured to controllably couple a boost local node to a ground.

20. The system of claim 18 , wherein the boost source and the boost interface each comprise a respective portion of the boost discharge logic, the boost source portion comprising a current generator and the boost interface comprising a transistor configured to mirror current generator current in the boost interface, a discharge rate related to the mirrored current.

21. The system of claim 18 , wherein the boost interface comprises at least a portion of the boost discharge logic, the portion comprising a boost discharge transistor coupled to an output of the buffer.

22. The system of claim 18 , wherein the boost source comprises at least a portion of the boost discharge logic, the boost source portion comprising a regulator configured to control the second boost voltage.

23. The system of claim 16 , wherein the memory comprises NAND flash memory.

24. The system of claim 16 , wherein each of the plurality of boost interfaces is included in a respective sense amplifier.

25. The system of claim 16 , wherein each load comprises a respective sense capacitor controllably coupled to a respective string of memory cells.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 17, 2023
From: INTEL CORPORATION
To: INTEL NDTM US LLC
Reel/Frame 064928/0832 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2014
From: YAMADA, SHIGEKAZU
To: INTEL CORPORATION
Reel/Frame 034041/0084 →