IP Library Granted Patent US 9,368,185
Granted Patent B2
US 9,368,185 · App. 14/508,744 · Granted Jun 14, 2016

Semiconductor device

Inventors: Shunichi Saito (Kanagawa, JP); Toshio Sugano (Sagamihara, JP); Atsushi Hiraishi (Sagamihara, JP)
Assignee: Micron Technology, Inc.
G11C11/40603G11C16/26
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Quick Facts
Patent No.
US 9,368,185
App. No.
14/508,744
Granted
Jun 14, 2016
Kind
B2
Abstract

A semiconductor device includes a plurality of memory cells, an access circuit configured to perform a data read operation, a data write operation and a data refresh operation on the memory cells, the access circuit to operate in a selected one of a first mode that is ready to perform and a second mode that is not ready to perform, and a judgment circuit configured to respond to first command information, to cause, when the access circuit is in the first mode, the access circuit to perform the data refresh operation, and to cause, when the access circuit is in the second mode, the access circuit to exit from the second mode and then to perform the refresh operation.

Claims (36)

1. A semiconductor device comprising:

a plurality of memory cells;

an access circuit configured to perform a data read operation, a data write operation, and a data refresh operation on the memory cells, the access circuit to operate in a selected one of a first mode that is ready to perform and a second mode that is not ready to perform; and

a judgment circuit configured to respond to first command information, to cause, when the access circuit is in the first mode, the access circuit to perform the data refresh operation, and to cause, when the access circuit is in the second mode, the access circuit to exit from the second mode and then to perform the refresh operation,

wherein the first mode comprises an idle mode and the second mode comprises a deep power down mode.

2. The semiconductor device as claimed in claim 1 , wherein the access circuit is configured to further respond to second command information, to cause, when the access circuit is in the first mode, the access circuit to perform the data refresh operation, and to cause, when the access circuit is in the second mode, the access circuit to maintain the second mode.

3. The semiconductor device as claimed in claim 2 , further comprising a plurality of terminals, the first command information being different in combination of logic levels at the terminals from the second command information.

4. The semiconductor device as claimed in claim 3 , wherein the terminals comprises a chip select terminal and a clock enable terminal.

5. The semiconductor device as claimed in claim 1 ,

wherein the data refresh operation comprises a data self-refresh operation.

6. The semiconductor device as claimed in claim 1 ,

wherein the plurality of memory cells are coupled to one another in a same rank.

7. A system, comprising:

a memory controller configured to issue a plurality of commands that include a read command, a write command, and a refresh command, the refresh command including first command information or second command information; and

a plurality of memory devices configured to receive the plurality of commands in common from the memory controller, each of the plurality of memory devices comprising:

a plurality of memory cells,

an access circuit configured to perform a data read operation, a data write operation, and a data refresh operation on the memory cells in response to the plurality of commands from the memory controller, the access circuit to operate in a selected one of a first mode that is ready to perform and a second mode that is not ready to perform, and a judgment circuit configured to respond to the first command information, to cause, when the access circuit is in the first mode, the access circuit to perform the data refresh operation, and to cause, when the access circuit is in the second mode, the access circuit to exit from the second mode and then to perform the refresh operation,

wherein the first mode comprises an idle mode and the second mode comprises a deep power down mode.

8. The system as claimed in claim 7 , wherein the access circuit is configured to further respond to the second command information, to cause, when the access circuit is in the first mode, the access circuit to perform the data refresh operation, and to cause, when the access circuit is in the second mode, the access circuit to maintain the second mode.

9. The system as claimed in claim 8 , each memory device of the plurality of memory devices further comprising a plurality of terminals, the first command information being different in combination of logic levels at the terminals from the second command information.

10. The system as claimed in claim 9 , wherein each terminal of the plurality of terminals comprises a chip select terminal and a clock enable terminal.

11. The system as claimed in claim 7 ,

wherein the data refresh operation comprises a data self-refresh operation.

12. A method comprising:

bringing a first memory device into a first mode in which the first memory device is ready to operate, and bringing a second memory device into a second mode in which the second memory device is not ready to operate, the first memory device comprising at least one first memory cell, and the second memory device comprising at least one second memory cell; and

supplying first command information in common to the first and second memory devices to cause the first memory device to perform a data refresh operation on the at least one first memory cell, and to cause the second memory device to exit from the second mode and then to perform a data refresh operation on the at least one second memory cell.

13. The method as claimed in claim 12 , further comprising:

supplying second command information in common to the first and second memory devices to cause the first memory device to perform the data refresh operation on the at least one first memory cell, and to cause the second memory device to maintain the second mode.

14. The method as claimed in claim 13 , wherein the first command information is different in combination of logic levels from the second command information.

15. The method as claimed in claim 14 , wherein the first command information and the second command information are respectively represented by a chip select signal and a clock enable signal.

16. The method as claimed in claim 15 ,

wherein the first mode comprises an idle mode and the second mode comprises a deep power down mode.

17. The method as claimed in claim 16 ,

wherein the data refresh operation comprises a data self-refresh operation.

18. The method as claimed in claim 17 ,

wherein the first memory device and the second memory device are operated by a same chip select signal and a per DRAM addressability.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2014
From: SAITO, SHUNICHI; SUGANO, TOSHIO; HIRAISHI, ATSUSHI
To: MICRON TECHNOLOGY, INC.
Reel/Frame 034510/0430 →
Priority Claims (1)
JP 2013-210966 · Oct 8, 2013 · national
Continuity (1)
Related Publication 20150098289A1 · Apr 9, 2015