IP Library Granted Patent US 9,748,442
Granted Patent B2
US 9,748,442 · App. 14/510,914 · Granted Aug 29, 2017

Light emitting diodes and associated methods of manufacturing

Inventors: Scott D. Schellhammer (Meridian, ID); Scott E. Sills (Boise, ID); Lifang Xu (Boise, ID); Thomas Gehrke (Boise, ID); Zaiyuan Ren (Boise, ID); Anton J. De Villiers (Boise, ID)
Assignee: Micron Technology, Inc.
H01L33/24H01L33/007H01L33/16H01L33/22H01L33/32
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Quick Facts
Patent No.
US 9,748,442
App. No.
14/510,914
Granted
Aug 29, 2017
Kind
B2
Abstract

Light emitting diodes and associated methods of manufacturing are disclosed herein. In one embodiment, a light emitting diode (LED) includes a substrate, a semiconductor material carried by the substrate, and an active region proximate to the semiconductor material. The semiconductor material has a first surface proximate to the substrate and a second surface opposite the first surface. The second surface of the semiconductor material is generally non-planar, and the active region generally conforms to the non-planar second surface of the semiconductor material.

Claims (38)

1. A light emitting diode (LED), comprising:

a substrate;

a semiconductor material carried by the substrate, the semiconductor material having—

a first major surface facing toward the substrate,

a second major surface opposite to the first major surface and further from the substrate than the first major surface,

indentations in a non-uniform arrangement at different respective crystal dislocations within the semiconductor material, wherein the indentations taper inwardly toward the substrate, and

a planar region extending between the indentations at the second major surface; and

an active region directly contacting the semiconductor material at the second major surface, wherein the active region conforms to the indentations.

2. The LED of claim 1 wherein:

a given one of the indentations has a hexagonal portion; and

the given indentation tapers inwardly from the hexagonal portion toward the substrate.

3. The LED of claim 1 wherein:

a given one of the indentations has sidewalls extending toward the substrate; and

the sidewalls extend along different respective crystal planes of the semiconductor material.

4. The LED of claim 1 wherein:

the semiconductor material contains an N-type gallium nitride (GaN) material;

the active region includes an indium gallium nitride (InGaN) material epitaxially formed on the semiconductor material; and

the LED further comprises a P-type GaN material epitaxially formed on the active region.

5. The LED of claim 1 wherein a given one of the indentations has six sidewalls that converge at an apex.

6. The LED of claim 1 wherein the indentations have a root-mean-square depth within a range from 0.05 micron to 3 microns.

7. The LED of claim 1 , further comprising a buffer material between the substrate and the semiconductor material.

8. A light emitting diode (LED), comprising:

a substrate;

a semiconductor material carried by the substrate, the semiconductor material having—

a first major surface facing toward the substrate,

a second major surface opposite to the first major surface and further from the substrate than the first major surface,

indentations aligned with a pattern of crystal dislocations within the semiconductor material, and

a planar region extending between the indentations at the second major surface; and

an active region directly contacting the semiconductor material at the second major surface, wherein the active region conforms to the indentations.

9. The LED of claim 8 wherein:

a given one of the indentations has a hexagonal portion; and

the given indentation tapers inwardly from the hexagonal portion toward the substrate.

10. The LED of claim 8 wherein:

a given one of the indentations has sidewalls extending toward the substrate; and

the sidewalls extend along different respective crystal planes of the semiconductor material.

11. The LED of claim 8 wherein a given one of the indentations has six sidewalls that converge at an apex.

12. The LED of claim 8 wherein the indentations have a root-mean-square depth within a range from 0.05 micron to 3 microns.

13. The LED of claim 8 , further comprising a buffer material between the substrate and the semiconductor material.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
Continuity (2)
Division 12703660 · Feb 10, 2010
Related Publication 20150028347A1 · Jan 29, 2015