Systems and methods for calibrating a tunable component

1. A method for calibrating a tunable component, the method comprising:

measuring a capacitance of one or more tunable capacitors of a tunable component in response to a reference electrical tuning input;

storing a calibration code in a non-volatile memory, wherein the non-volatile memory is provided on the tunable component, and wherein the calibration code characterizes a deviation of the capacitance of the tunable component relative to a desired response of the tunable component to the reference electrical tuning input;

during operation of the tunable component, receiving an electrical tuning input as a tuning word corresponding to a desired total capacitance;

generating a modified tuning word that is selected or computed based on the electrical tuning input and the calibration code to produce a tuned capacitance of the tunable component that most closely matches the desired total capacitance, wherein the modified tuning word is selected or computed by a logic block in communication with the non-volatile memory and the tunable component; and

applying the modified tuning word to the tunable component to change the capacitance of the tunable component based on the calibration code to achieve the tuned capacitance of the tunable component.

2. The method of claim 1 , wherein storing a calibration code comprises storing one of a plurality of bin identifiers that are each associated with a discrete device response range of the tunable component.

3. The method of claim 2 , wherein the desired response is selected to be within the discrete device response range of the one of the plurality of bin identifiers having the smallest discrete device response range.

4. The method of claim 2 , wherein the one of the plurality of bin identifiers is selected to characterize a device response of a single tunable capacitor of the tunable component.

5. The method of claim 2 , wherein the one of the plurality of bin identifiers is selected to characterize an aggregate device response of an array of tunable capacitors of the tunable component.

6. The method of claim 2 , wherein adjusting a tuning setting comprises:

retrieving the one of the plurality of bin identifiers from the non-volatile memory;

selecting one or more of a plurality of tuning words corresponding to the stored one of the plurality of bin identifiers; and

applying the selected one or more of the plurality of tuning words to the tunable component.

7. The method of claim 6 , wherein the number of tuning words is equal to an integer multiple of the number of bin identifiers.

8. The method of claim 1 , wherein storing a calibration code comprises storing one or more coefficients of a calibration tuning function.

9. The method of claim 1 , wherein the desired total capacitance has a first numerical resolution; and

wherein the tuned capacitance of the tunable component has a second numerical resolution that is finer than the first numerical resolution.

10. The method of claim 1 , wherein generating a modified tuning word is performed by a software driver that is distinct from the tunable component.

11. A tunable component comprising:

one or more tunable capacitors, wherein a total capacitance of the one or more tunable capacitors is tunable in response to an electrical tuning input;

a non-volatile memory configured to store a calibration code, wherein the calibration code characterizes a deviation of a capacitance of the one or more tunable capacitors relative to a desired response of the one or more tunable capacitors to a reference electrical tuning input; and

a logic block in communication with the non-volatile memory and the one or more tunable capacitors, wherein the logic block is configured to receive during operation of the tunable component an electrical tuning input as a tuning word corresponding to a desired total capacitance, to generate a modified tuning word that is selected based on the electrical tuning input and the calibration code, and to apply the modified tuning word to change the capacitance of the one or more tunable capacitors to produce a tuned capacitance of the one or more tunable capacitors that most closely matches the desired total capacitance.

12. The tunable component of claim 11 , wherein the non-volatile memory is configured to store one of a plurality of bin identifiers that are each associated with a discrete device response range of the one or more tunable capacitors.

13. The tunable component of claim 11 , wherein the non-volatile memory is configured to store one or more coefficients of a calibration tuning function.

14. The tunable component of claim 11 , wherein the non-volatile memory is configured to store one of a plurality of bin identifiers that are each associated with a discrete device response range of the one or more tunable capacitors; and

wherein the logic block is configured to select one or more of a plurality of tuning words corresponding to the stored one of the plurality of bin identifiers.

15. The tunable component of claim 11 , wherein the desired total capacitance has a first numerical resolution; and

wherein the one or more tunable elements are configured to generate a tuned capacitance having a second numerical resolution that is finer than the first numerical resolution.