IP Library › Granted Patent US 9,541,936
Granted Patent B2
US 9,541,936 · App. 14/548,386 · Granted Jan 10, 2017

System for balancing the voltage of series-connected semiconductor elements

Inventors: Bertrand Rivet (Vouvray, FR); David Jouve (Tours, FR)
Assignee: STMICROELECTRONICS (TOURS) SAS
G05F1/613G05F1/468H03K17/102
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Quick Facts
Patent No.
US 9,541,936
App. No.
14/548,386
Granted
Jan 10, 2017
Kind
B2
Abstract

A circuit for balancing a voltage across a semiconductor element series-connected with other semiconductor elements of the same type may include a comparator configured to compare data representative of a voltage across the semiconductor element with a reference voltage, and a resistive element of adjustable value and configured to be controlled by the comparator.

Claims (51)

1. A circuit for balancing a voltage across a semiconductor element series-connected with other semiconductor elements of a same type, the semiconductor elements having terminals, the circuit comprising:

a comparator configured to compare data representative of a voltage between the terminals with respect to a reference voltage representative of a voltage applied to the series-connected semiconductor element and other semiconductor elements divided by a number of semiconductor elements;

a resistive element having an adjustable value coupled to said comparator and configured to be controlled by said comparator; and

a first resistive dividing bridge having a midpoint and configured to be coupled between the terminals of the semiconductor element so that the data representative of the voltage between the terminals of the semiconductor element is available at the midpoint.

2. The circuit of claim 1 , wherein said resistive element comprises a metal oxide semiconductor (MOS) transistor.

3. The circuit of claim 1 , wherein said comparator comprises a first operational amplifier having a first input receiving the data representative of the voltage across the semiconductor element and having a second input receiving the reference voltage.

4. The circuit of claim 3 , further comprising a second operational amplifier coupled to the first operational amplifier and configured as a subtractor and to generate the reference voltage.

5. The circuit of claim 4 further comprising:

first terminals configured to be connected between the terminals of said semiconductor element;

second terminals configured to be respectively connected to a previous circuit and to a next circuit in the series-connected semiconductor element and other semiconductor elements

a second resistive element;

a third resistive element; and

a second resistive bridge coupled to said second terminals and having a midpoint, wherein said second operational amplifier has first and second inputs, and wherein the midpoint of the second resistive bridge is coupled to the first input of said second operational amplifier, wherein said second input of said second operational amplifier is coupled, by said second resistive element, to one of said second terminals, and, by said third resistive element, to one of said first terminals.

6. The circuit of claim 1 , further comprising:

first terminals configured to be connected between the terminals of said semiconductor element; and

second terminals configured to be respectively connected to a previous circuit and to a next circuit in the series-connected semiconductor element and other semiconductor elements.

7. A system comprising:

a plurality of series-connected semiconductor elements, each of said plurality of series-connected semiconductor elements having terminals;

a circuit coupled in parallel on each of said plurality of series-connected semiconductor elements, said circuit comprising

a comparator configured to compare data representative of a voltage between the terminals with respect to a reference voltage representative of a voltage applied to the plurality of series-connected semiconductor elements divided by a number of the plurality of series-connected semiconductor elements,

a resistive element having an adjustable value coupled to said comparator and configured to be controlled by said comparator, and

a first resistive dividing bridge having a midpoint and coupled between the terminals of a given one of said plurality of series-connected semiconductor elements so that the data representative of the voltage between the terminals of the given series-connected semiconductor element is available from the midpoint.

8. The system of claim 7 , wherein said plurality of series-coupled semiconductor elements comprises diodes.

9. A method of balancing a voltage across a semiconductor element series-connected with other semiconductor elements of a same type, the semiconductor elements having terminals, the method comprising:

using a comparator to compare data representative of a voltage between the terminals with respect to a reference voltage representative of a voltage applied to the series-connected semiconductor element and other semiconductor elements divided by a number of semiconductor elements;

controlling a value of a resistive element having an adjustable value based upon the comparator; and

using a first resistive dividing bridge having a midpoint and to be coupled between the terminals of the semiconductor element to make available at the midpoint the data representative of the voltage between the terminals of the semiconductor element.

10. The method of claim 9 , wherein said resistive element comprises a metal oxide semiconductor (MOS) transistor.

11. The method of claim 9 , wherein using the comparator comprises using a first operational amplifier having a first input receiving the data representative of the voltage across the semiconductor element and having a second input receiving the reference voltage.

12. The method of claim 11 , further comprising using a second operational amplifier coupled to the first operational amplifier as a subtractor to generate the reference voltage.

13. A circuit for balancing a voltage across a semiconductor element series-connected with other semiconductor elements of a same type, the semiconductor elements having terminals, the circuit comprising:

a comparator configured to compare data representative of a voltage between the terminals with respect to a reference voltage, said comparator comprising a first operational amplifier having a first input receiving the data representative of the voltage across the semiconductor element and having a second input receiving the reference voltage;

a second operational amplifier coupled to the first operational amplifier and configured as a subtractor and to generate the reference voltage;

a resistive element having an adjustable value coupled to said comparator and configured to be controlled by said comparator; and

a first resistive dividing bridge having a midpoint and configured to be coupled between the terminals of the semiconductor element so that the data representative of the voltage between the terminals of the semiconductor element is available at the midpoint.

14. The circuit of claim 13 , wherein said resistive element comprises a metal oxide semiconductor (MOS) transistor.

15. The circuit of claim 13 , further comprising:

first terminals configured to be connected between the terminals of said semiconductor element; and

second terminals configured to be respectively connected to a previous circuit and to a next circuit in the series-connected semiconductor element and other semiconductor elements.

16. The circuit of claim 13 further comprising:

first terminals configured to be connected between the terminals of said semiconductor element;

second terminals configured to be respectively connected to a previous circuit and to a next circuit in the series-connected semiconductor element and other semiconductor elements

a second resistive element;

a third resistive element; and

a second resistive bridge coupled to said second terminals and having a midpoint, wherein said second operational amplifier has first and second inputs, and wherein the midpoint of the second resistive bridge is coupled to the first input of said second operational amplifier, wherein said second input of said second operational amplifier is coupled, by said second resistive element, to one of said second terminals, and, by said third resistive element, to one of said first terminals.

17. A method of balancing a voltage across a semiconductor element series-connected with other semiconductor elements of a same type, the semiconductor elements having terminals, the method comprising:

using a comparator to compare data representative of a voltage between the terminals with respect to a reference voltage, the comparator comprising a first operational amplifier having a first input receiving the data representative of the voltage across the semiconductor element and having a second input receiving the reference voltage;

using a second operational amplifier coupled to the first operational amplifier as a subtractor to generate the reference voltage;

controlling a value of a resistive element having an adjustable value based upon the comparator; and

using a first resistive dividing bridge having a midpoint and to be coupled between the terminals of the semiconductor element to make available at the midpoint the data representative of the voltage between the terminals of the semiconductor element.

18. The method of claim 17 , wherein the resistive element comprises a metal oxide semiconductor (MOS) transistor.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 12, 2022
From: STMICROELECTRONICS (TOURS) SAS
To: STMICROELECTRONICS INTERNATIONAL N.V.
Reel/Frame 060480/0941 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 21, 2014
From: RIVET, BERTRAND; JOUVE, DAVID
To: STMICROELECTRONICS (TOURS) SAS
Reel/Frame 034226/0650 →
Priority Claims (1)
FR 13 61454 · Nov 21, 2013 · national
Continuity (1)
Related Publication 20150137880A1 · May 21, 2015