Positioner of probe card and probe head of probe card

1. A positioner of a probe card, the positioner having a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion, the first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and communicated to the main opening, the first elastic portion is between the first sub-opening and the second sub-opening, the first positioning portion is between the second sub-opening and the third sub-opening, the second elastic portion is between the third sub-opening and the fourth sub-opening, the second positioning portion is between the first sub-opening and the fourth sub-opening, and a stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

2. The positioner of the probe card as recited in claim 1 , wherein the first positioning portion and the second positioning portion appear to be oppositely disposed, and the first elastic portion and the second elastic portion appear to be oppositely disposed.

3. The positioner of the probe card as recited in claim 1 , wherein the first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are respectively straight strip-shaped, curved line-shaped or folded line-shaped.

4. The positioner of the probe card as recited in claim 3 , wherein an end of the first sub-opening, an end of the second sub-opening, an end of the third sub-opening, and an end of the fourth sub-opening that are away from the main opening respectively have an arc-shaped edge.

5. The positioner of the probe card as recited in claim 1 , wherein the first sub-opening and the fourth sub-opening have a deviation distance therebetween, or the first sub-opening and the second sub-opening have a deviation distance therebetween.

6. The positioner of the probe card as recited in claim 1 , wherein the first positioning portion has a first positioning side at the periphery of the main opening, the second positioning portion has a second positioning side at the periphery of the main opening, the first elastic portion has a first elastic side at the periphery of the main opening, the second elastic portion has a second elastic side at the periphery of the main opening, and the first positioning side, the second positioning side, the first elastic side, and the second elastic side are configured to support a probe.

7. The positioner of the probe card as recited in claim 6 , wherein a sum of side lengths of the first elastic side and the second elastic side is greater than or equal to a sum of side lengths of the first positioning side and the second positioning side.

8. The positioner of the probe card as recited in claim 1 , wherein the first sub-opening and the second sub-opening are parallel to each other, or the first sub-opening and the third sub-opening are parallel to each other.

9. The positioner of the probe card as recited in claim 1 , wherein the first sub-opening and the second sub-opening are line symmetric to each other with respect to a symmetry line passing through a geometric center of the main opening, or the first sub-opening and the third sub-opening are point symmetric to each other with respect to the geometric center of the main opening.

10. The positioner of the probe card as recited in claim 9 , wherein the first sub-opening is point symmetric to the third sub-opening, and the second sub-opening is point symmetric to the fourth sub-opening.

11. The positioner of the probe card as recited in claim 9 , wherein the first sub-opening and the third sub-opening are point symmetric, the second sub-opening and the fourth sub-opening are point symmetric, and a length of the first sub-opening is longer than or equal to a length of the second sub-opening.

12. The positioner of the probe card as recited in claim 9 , wherein the first sub-opening and the second sub-opening are line symmetric, the third sub-opening and the fourth sub-opening are line symmetric, and a length of the first sub-opening is shorter than or equal to a length of the third sub-opening.

13. The positioner of the probe card as recited in claim 1 , having plurality of the main openings, plurality of the first sub-openings, plurality of the second sub-openings, plurality of the third sub-openings, plurality of the fourth sub-openings, plurality of the first positioning portions, plurality of the second positioning portions, plurality of the first elastic portions, and plurality of the second elastic portions, wherein each main opening is communicated to one corresponding first sub-opening, one corresponding second sub-opening, one corresponding third sub-opening, and one corresponding fourth sub-opening, the main openings are arranged into an array, and any four adjacent main openings are arranged into a rectangle.

14. The positioner of the probe card as recited in claim 1 , having plurality of the main openings, plurality of the first sub-openings, plurality of the second sub-openings, plurality of the third sub-openings, plurality of the fourth sub-openings, plurality of the first positioning portions, plurality of the second positioning portions, plurality of the first elastic portions, and plurality of the second elastic portions, wherein each main opening is communicated to one corresponding first sub-opening, one corresponding second sub-opening, one corresponding third sub-opening, and one corresponding fourth sub-opening, the main openings are arranged into an array, and any three adjacent main openings are arranged into a triangle.

15. A probe head of a probe card, the probe head comprising:

an upper guide plate having a plurality of upper through holes;

a lower guide plate located at a side of the upper guide plate and having a plurality of lower through holes;

a positioner of the probe card as recited in claim 1 , the positioner being between the upper guide plate and the lower guide plate and having plurality of the main openings; and

a plurality of probes being positioned between the upper through holes of the upper guide plate and the lower through holes of the lower guide plate, and passing through the main openings of the positioner.