Semiconductor radiation detector with large active area, and method for its manufacture
A semiconductor radiation detector comprises a detector chip having a front side and a back side, and a support plate on the back side of the detector chip, having electric connections with said detector chip. A base plate has a thermoelectric cooler attached to it and contact pins protruding from the base plate towards said detector chip. A bonding plate is on an opposite side of said thermoelectric cooler than said base plate, and first wire bonded connections go between said contact pins and said bonding plate. A joint plate is between said bonding plate and said support plate, and electric connections between said support plate and said bonding plate go through said joint plate.
1. A semiconductor radiation detector, comprising:
a detector chip having a front side and a back side,
a support plate on the back side of the detector chip, having electric connections with said detector chip,
a base plate having a thermoelectric cooler attached to it and contact pins protruding from the base plate towards said detector chip,
a bonding plate on an opposite side of said thermoelectric cooler than said base plate,
first wire bonded connections between said contact pins and said bonding plate,
a joint plate between said bonding plate and said support plate, said joint plate comprising an intermediate layer in the stack of plates such that the support plate is attached to the joint plate which in turn is attached to the bonding plate, and
electric connections between said support plate and said bonding plate through said joint plate.
2. The semiconductor radiation detector according to claim 1 , wherein:
the electric connections between said detector chip and said support plate comprise second wire bonded connections on the back side of said detector chip, wherein at least one of said second wire bonded connections goes through an opening in said support plate.
3. The semiconductor radiation detector according to claim 1 , comprising:
an electronic component attached to the opposite side of said support plate than said detector chip, and
a cavity for said electronic component in a stack comprising said support plate, said joint plate, and said bonding plate;
wherein said cavity is at least partly defined by the appearance of the joint plate.
4. The semiconductor radiation detector according to claim 3 , wherein said cavity is at least partly defined by a hole through said joint plate.
5. The semiconductor radiation detector according to claim 3 , wherein said cavity is at least partly defined by the outline of said joint plate.
6. The semiconductor radiation detector according to claim 1 , wherein at least one of the electric connections between said support plate and said bonding plate through said joint plate goes through a conductive via in said joint plate.
7. The semiconductor radiation detector according to claim 1 , wherein at least one of the electric connections between said support plate and said bonding plate through said joint plate goes through a conductive track on a surface of said joint plate.
8. The semiconductor radiation detector according to claim 1 , wherein said bonding plate is a separate, electrically insulating plate attached to an opposite side of the thermoelectric cooler than said base plate.
9. The semiconductor radiation detector according to claim 1 , wherein said bonding plate is a plate in the structure of the thermoelectric cooler at an opposite extremity of the thermoelectric cooler than said base plate.
10. The semiconductor radiation detector according to claim 1 , wherein:
said contact pins define a rim, and
an active area on the front side of said detector chip is larger than the area encircled by said rim.