IP Library Granted Patent US 9,508,546
Granted Patent B2
US 9,508,546 · App. 14/566,989 · Granted Nov 29, 2016

Method of manufacturing semiconductor device

Inventors: Kazuyuki Toyoda (Toyama, JP); Tadashi Takasaki (Toyama, JP); Hiroshi Ashihara (Toyama, JP); Atsushi Sano (Toyama, JP); Naonori Akae (Toyama, JP); Hidehiro Yanai (Toyama, JP)
Assignee: HITACHI KOKUSAI ELECTRIC INC.
H01L21/02263C23C16/4405C23C16/4412C23C16/4557C23C16/45561H01J37/3244H01J37/32449H01J37/32577
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Quick Facts
Patent No.
US 9,508,546
App. No.
14/566,989
Granted
Nov 29, 2016
Kind
B2
Abstract

A method of manufacturing a semiconductor device is disclosed. The method includes (a) loading a substrate into a process chamber; (b) processing the substrate by supplying a process gas into the process chamber via a shower head disposed above the process chamber and including a buffer chamber; (c) unloading the substrate from the process chamber; and (d) cleaning the buffer chamber and the process chamber after performing the step (c), wherein the step (d) comprises: (d-1) cleaning the buffer chamber by a plasma generation from a cleaning gas in the buffer chamber by a plasma generation unit including a plasma generation region switching unit; and (d-2) cleaning the process chamber by switching the plasma generation from the cleaning gas in the buffer chamber to a plasma generation from the cleaning gas in the process chamber by the plasma generation region switching unit.

Claims (8)

1. A method of manufacturing a semiconductor device, comprising:

(a) loading a substrate into a process chamber;

(b) processing the substrate by supplying a process gas into the process chamber via a shower head disposed above the process chamber and including a buffer chamber;

(c) unloading the substrate from the process chamber; and

(d) cleaning the buffer chamber and the process chamber after performing the step (c),

wherein the step (d) comprises:

(d-1) cleaning the buffer chamber by a plasma generation from a cleaning gas in the buffer chamber by a plasma generation unit including a plasma generation region switching unit; and

(d-2) cleaning the process chamber by switching the plasma generation from the cleaning gas in the buffer chamber to a plasma generation from the cleaning gas in the process chamber by the plasma generation region switching unit.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2018
From: HITACHI KOKUSAI ELECTRIC INC.
To: KOKUSAI ELECTRIC CORPORATION
Reel/Frame 047995/0490 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2014
From: TOYODA, KAZUYUKI; TAKASAKI, TADASHI; ASHIHARA, HIROSHI; SANO, ATSUSHI; AKAE, NAONORI; YANAI, HIDEHIRO
To: HITACHI KOKUSAI ELECTRIC INC.
Reel/Frame 034555/0632 →
Priority Claims (1)
JP 2014-016860 · Jan 31, 2014 · national
Continuity (2)
Division 14229284 · Mar 28, 2014
Related Publication 20150221503A1 · Aug 6, 2015