Dual-channel field effect transistor device having increased amplifier linearity
A dual-channel field effect transistor (FET) device having increased amplifier linearity and a method of manufacturing same are disclosed. In an embodiment, the device includes a channel layer having a top surface and provided within a channel between a source electrode and a drain electrode. A barrier layer is formed on the channel layer in alternating first and second barrier thicknesses along the channel. The first barrier thicknesses form thinner regions and the second barrier thicknesses form thicker regions. A gate electrode is deposited on the barrier layer. The thinner regions have a first pinch-off voltage and the thicker regions have a larger second pinch-off voltage, such that the thinner and thicker regions are configured to turn on at different points on a drain current-gate voltage transfer curve. Transfer curve linearity is increased as a function of the gate voltage.
1. A method for making a dual-channel field effect transistor (FET) device having increased amplifier linearity comprising:
providing a channel layer within a channel, wherein the channel layer has a top surface which is entirely planar;
depositing a barrier layer on the top surface of the channel layer, wherein:
the channel layer and the barrier layer are positioned between a source electrode and a drain electrode; and
the barrier layer comprises alternating first regions having a first thickness and second regions having a second thickness that is greater than the first thickness;
depositing a gate electrode on the barrier layer along the channel;
wherein the first regions have a first pinch-off voltage and the second regions have a second pinch-off voltage which is larger than the first pinch-off voltage, such that the first and second regions are configured to turn on at different points on a drain current—gate voltage transfer curve when a gate voltage applied to the gate electrode is swept from negative to positive, whereby linearity of the transfer curve is increased as a function of the gate voltage,
wherein a periodicity of the alternating first and second regions is smaller than a length of the channel.
2. The method of claim 1 wherein depositing the barrier layer comprises:
depositing a main portion forming the first thickness residing in the first and second regions while being entirely planar; and
forming supplemental portions on the main portion in only the second regions, such that each of the combinations of the main portions and the supplemental portions in the second regions have a combined thickness forming the second barrier thickness.
3. The method of claim 2 wherein the supplemental portions comprise dielectric material.
4. The method of claim 2 wherein the main portion of the barrier layer comprises aluminum gallium nitride (AlGaN) and the supplemental portions of the barrier layer comprise silicon nitride (SiN).
5. The method of claim 1 wherein the ratio of the first thicknesses to the second thicknesses is in the range of approximately 20-99.9%.
6. The method of claim 1 wherein the FET is an aluminum gallium nitride/gallium nitride (AlGaN/GaN) heterostructure field effect transistor (HFET), and wherein the channel layer comprises GaN and the barrier layer comprises AlGaN.
7. The method of claim 1 wherein the FET is a silicon (Si) metal-oxide semiconductor field effect transistor (MOSFET).
8. The method of claim 1 wherein the FET is a gallium arsenide (GaAs) metal-semiconductor field effect transistor (MESFET).
9. A dual-channel FET device having increased amplifier linearity made by the method of claim 1 .
10. A dual-channel field effect transistor (FET) device having increased amplifier linearity comprising:
a channel layer provided within a channel between a source electrode and a drain electrode, wherein the channel layer has a top surface which is entirely planar;
a barrier layer:
provided on the top surface of the channel layer and comprising alternating first regions having a first thickness and second regions having a second thickness that is greater than the first thickness;
a gate electrode deposited on the barrier layer along the channel;
wherein the first regions have a first pinch-off voltage and the second regions have a second pinch-off voltage which is larger than the first pinch-off voltage, such that the first and second regions are configured to turn on at different points on a drain current—gate voltage transfer curve when a gate voltage applied to the gate electrode is swept from negative to positive, whereby linearity of the transfer curve is increased as a function of the gate voltage,
wherein a periodicity of the alternating first and second regions is smaller than a length of the channel.
11. The dual-channel FET device of claim 10 wherein the barrier layer comprises:
a main portion forming the first thickness residing in the first and second regions while being entirely planar; and
supplemental portions formed on the main portion in only the second regions, such that each of the combinations of the main portions and the supplemental portions in the second regions have a combined thickness forming the second thickness.
12. The dual-channel FET device of claim 11 wherein the supplemental portions comprise dielectric material.
13. The dual-channel FET device of claim 11 wherein the main portion of the barrier layer comprises aluminum gallium nitride (AlGaN) and the supplemental portions of the barrier layer comprise silicon nitride (SiN).
14. The dual-channel FET device of claim 10 wherein the ratio of the first thicknesses to the second thicknesses is in the range of approximately 20-99.9%.
15. The dual-channel FET device of claim 10 wherein the FET is an aluminum gallium nitride/gallium nitride (AlGaN/GaN) heterostructure field effect transistor (HFET), and wherein the channel layer comprises GaN and the barrier layer comprises AlGaN.
16. The dual-channel FET device of claim 10 wherein the FET is a silicon (Si) metal-oxide semiconductor field effect transistor (MOSFET).
17. The dual-channel FET device of claim 10 wherein the FET is a gallium arsenide (GaAs) metal-semiconductor field effect transistor (MESFET).