Epitaxial growth method
A method for growing an epitaxial film on a surface of a semiconductor wafer by mounting the wafer within a susceptor pocket and supplying source gas and carrier gas to the upper surface side of the susceptor and supplying carrier gas to the lower surface side of the susceptor. The susceptor includes a substantially circular bottom wall and a sidewall encompassing the bottom wall to form a pocket for mounting the wafer, wherein a plurality of circular through-holes are formed in the bottom wall in an outer peripheral region a distance of up to about ½ the radius toward the center of the bottom wall. The total opening surface area of the through-holes is 0.05 to 55% of the surface area of the bottom wall, the opening surface area of each through-hole is 0.2 to 3.2 mm 2 and the density of the through-holes is 0.25 to 25 per cm 2 .
1. An epitaxial growth method for growing an epitaxial film on a surface of a semiconductor wafer by mounting the semiconductor wafer within a susceptor pocket of a susceptor, the susceptor comprising a substantially circular bottom wall having an upper surface and a lower surface that forms a back surface of the susceptor and a sidewall encompassing the bottom wall to form a pocket for mounting the semiconductor wafer, wherein a plurality of through-holes that pass through said bottom wall and form circular or polygonal openings in the upper surface and the lower surface of said bottom wall, each of the through-holes having a linear axis extending from the upper surface to the lower surface of said bottom wall, are provided in the bottom wall within a region of up to approximately half the radius of the bottom wall from the outer periphery to the center, in a radial direction, with the through-holes being included within at least the region of the bottom wall on which the semiconductor wafer is mounted; flowing source gas and a first carrier gas on an upper surface side of the susceptor; and flowing a second carrier gas on a lower surface side of the susceptor to create a negative pressure on the lower side of the susceptor and cause a part of the source gas flowing on the upper surface side of the susceptor to flow down to the lower side of the susceptor via the through-holes.
2. The epitaxial growth method of claim 1 , further provided with a support unit at the bottom wall or sidewall for supporting the semiconductor wafer through surface contact, line contact or point contact with only the outer periphery of the semiconductor wafer.
3. The epitaxial growth method of claim 1 , wherein a SiC film is adhered to a surface of the susceptor and to the inner wall surfaces of each of the through-holes.
4. The epitaxial growth method of claim 1 , wherein at least a portion of the bottom wall that includes the through-holes is made of a solid SiC material.
5. The epitaxial growth method of claim 1 , wherein the carrier gas flowing on the lower surface side of the susceptor is hydrogen-containing gas supplied to the lower surface side of the susceptor at between 3 to 100 liters per minute.
6. The epitaxial growth method of claim 1 , wherein the through-holes are inclined with respect to the thickness direction of the bottom wall.
7. An epitaxial growth method for growing an epitaxial film on a surface of a semiconductor wafer by mounting the semiconductor wafer within a pocket of a susceptor, the susceptor comprising a substantially circular bottom wall having an upper surface and a lower surface that forms a back surface of the susceptor and a sidewall encompassing the bottom wall to form a pocket for mounting the semiconductor wafer, wherein a plurality of through-holes that pass through said bottom wall and form circular or polygonal openings in the upper surface and the lower surface of said bottom wall, each of the through-holes having a linear axis extending from the upper surface to the lower surface of said bottom wall, are provided in the bottom wall within a region of up to approximately half the radius of the bottom wall from the outer periphery to the center, in a radial direction, with the through-holes being included within at least the region of the bottom wall on which the semiconductor wafer is mounted; and the opening surface area of each through-hole is taken to be between 0.2 to 3.2 mm 2 , and the density of the through-holes is taken to be between 0.25 to 25 per cm 2 ; flowing source gas and a first carrier gas on an upper surface side of the susceptor; and flowing a second carrier as on a lower surface side of the susceptor to create a negative pressure on the lower side of the susceptor and cause a part of the source gas flowing on the upper surface side of the susceptor to flow down to the lower side of the susceptor via the through-holes.
8. The epitaxial growth method of claim 7 , further provided with a support unit at the bottom wall or sidewall for supporting the semiconductor wafer through surface contact, line contact or point contact with only the outer periphery of the semiconductor wafer.
9. The epitaxial growth method of claim 7 , wherein a SiC film is adhered to a surface of the susceptor and to the inner wall surfaces of each of the through-holes.
10. The epitaxial growth method of claim 7 , wherein at least a portion of the bottom wall that includes the through-holes is made of a solid sic material.
11. The epitaxial growth method of claim 7 , wherein the carrier gas flowing on the lower surface side of the susceptor is hydrogen-containing gas supplied to the lower surface side of the susceptor at between 3 to 100 liters per minute.
12. The epitaxial growth method of claim 7 , wherein the through-holes are inclined with respect to the thickness direction of the bottom wall.