IP Library Granted Patent US 9,383,286
Granted Patent B2
US 9,383,286 · App. 14/582,750 · Granted Jul 5, 2016

Ionization gauge with emission current and bias potential control

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Quick Facts
Patent No.
US 9,383,286
App. No.
14/582,750
Granted
Jul 5, 2016
Kind
B2
Abstract

An ionization gauge that measures pressure has an electron source that emits electrons, and an anode that defines an ionization space. The gauge also includes a collector electrode to collect ions formed by an impact between the electrons and a gas and to measure pressure based on the collected ions. The electron source is dynamically varied in emission current between a plurality of emission levels dependent on pressure and a second parameter other than pressure. The ionization gauge may also vary various operating parameters of the gauge components according to parameters stored in a non-volatile memory and selected by a user.

Claims (23)

1. An ionization gauge to measure pressure comprising:

an electron source cathode that emits electrons;

an anode that defines an ionization space;

a collector electrode to collect ions formed by an impact between the electrons and gas in the ionization space; and

a controller that actively controls emission current from the electron source cathode to an optimal emission current level by heating the electron source cathode, the optimal emission current level being determined from a stored profile of emission current relative to pressure, the controller responding to sensed temperature of the electron source cathode to limit the cathode temperature by reducing the emission current level to less than the optimal emission current level with reduced sensitivity of the gauge.

2. The ionization gauge of claim 1 , wherein the electron source cathode temperature is sensed by electrical resistance of the electron source cathode.

3. The ionization gauge of claim 1 , wherein the electron source cathode temperature is sensed by an infrared sensor.

4. The ionization gauge of claim 1 , wherein the electron source cathode temperature is sensed by an optical parameter of the electron source cathode.

5. The ionization gauge of claim 1 , wherein the controller further controls emission current from the electron source as a function of collector current through the collector electrode.

6. The ionization gauge of claim 1 , further comprising plural emission current profiles stored in memory and selected by a user.

7. The ionization gauge of claim 1 , wherein a pressure signal is formed from the collected ions.

8. A method of measuring a gas pressure comprising the steps of:

producing electrons from an electron source cathode at an optimal emission current level by heating the electron source cathode, the optimal emission current level being determined from a stored profile of emission current relative to pressure;

sensing temperature of the electron source cathode;

dynamically adjusting the emission current from the electron source cathode to a reduced emission current level less than the optimal emission current level with reduced sensitivity of the gauge based on the sensed temperature of the electron source cathode to limit temperature of the electron source cathode;

transmitting the electrons through an anode defining an ionization space to form ions; and

collecting the ions.

9. The method of claim 8 , wherein the electron source cathode temperature is sensed by electrical resistance of the cathode.

10. The method of claim 8 , wherein the electron source cathode temperature is sensed by an infrared sensor.

11. The method of claim 8 , wherein the electron source cathode temperature is sensed by an optical parameter of the electron source cathode.

12. The method of claim 8 , further comprising controlling emission current from the electron source cathode as a function of collector current through the collector electrode.

13. The method of claim 8 , wherein the emission current is adjusted based on one of plural emission current profiles stored in memory and selected by a user.

14. The method of claim 8 , further comprising forming a pressure signal from the collected ions.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 063009/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 24, 2022
From: BARCLAYS BANK PLC
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
Reel/Frame 062739/0001 →
SECURITY INTEREST Recorded Aug 19, 2022
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION; ELECTRO SCIENTIFIC INDUSTRIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 061572/0069 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE U.S. PATENT NO.7,919,646 PREVIOUSLY RECORDED ON REEL 048211 FRAME 0312. ASSIGNOR(S) HEREBY CONFIRMS THE PATENT SECURITY AGREEMENT (ABL). Recorded Jan 14, 2021
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 055668/0687 →
PATENT SECURITY AGREEMENT (ABL) Recorded Feb 1, 2019
From: ELECTRO SCIENTIFIC INDUSTRIES, INC.; MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 048211/0312 →
RELEASE OF SECURITY INTEREST Recorded Feb 1, 2019
From: DEUTSCHE BANK AG NEW YORK BRANCH
To: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
Reel/Frame 048226/0095 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038663/0265 →
SECURITY AGREEMENT Recorded May 4, 2016
From: MKS INSTRUMENTS, INC.; NEWPORT CORPORATION
To: BARCLAYS BANK PLC; BARCLAYS BANK PLC
Reel/Frame 038663/0139 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2015
From: BROOKS AUTOMATION, INC.
To: MKS INSTRUMENTS, INC.
Reel/Frame 034635/0381 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 5, 2015
From: CARMICHAEL, LARRY K.; WEBER, JESSE A.; HENRY, JOHN H.; SCHOTT, MICHAEL N.; BRUCKER, GERARDO A.
To: BROOKS AUTOMATION, INC.
Reel/Frame 034633/0219 →