Reduction of negative bias temperature instability
A complementary metal-oxide semiconductor (CMOS) circuit and a method of fabricating the device are described. The circuit includes an n-channel field effect transistor (nFET), the nFET including a high-k dielectric layer on an interlayer. The CMOS circuit also includes a p-channel field effect transistor (pFET), the pFET including the high-k dielectric layer on the interlayer and additionally including an aluminum-based cap layer between the high-k dielectric layer and a pFET work function setting metal. Metal atoms from the cap layer do not intermix with the interlayer.
1. A method of fabricating a semiconductor device including a p-channel field effect transistor (pFET), the method comprising:
forming an interlayer and a high-k dielectric layer directly on the interlayer, wherein the interlayer is silicon dioxide (SiO 2 );
depositing an aluminum-based cap layer directly over the high-k dielectric layer;
maintaining a temperature after the depositing the cap layer such that no metal atoms from the cap layer diffuse to the interlayer;
depositing a pFET work function setting metal that is a nitride over the cap layer deposited over the high-k dielectric that is directly on the interlayer;
depositing an nFET work function setting metal on the high-k dielectric layer of the pFET and the nFET prior to depositing the cap layer and the pFET work function setting metal; and
removing the nFET work function setting metal from the pFET prior to depositing the cap layer and the pFET work function setting metal on the pFET and on the nFET work function setting metal of the nFET.
2. The method according to claim 1 , wherein the device is a complementary metal-oxide semiconductor (CMOS) circuit, and the forming the interlayer and the high-k dielectric layer is additionally on an n-channel field effect transistor (nFET) of the circuit.
3. The method according to claim 2 , wherein the depositing the cap layer and the pFET work function setting metal is additionally on the high-k dielectric layer of the nFET.
4. The method according to claim 1 , wherein the depositing the cap layer includes depositing aluminum oxide (Al 2 O 3 ) or a composite of aluminum and nitrogen.
5. The method according to claim 4 , wherein the depositing the cap layer includes reducing nitrogen diffusion from the pFET work function setting metal to a gate oxide.
6. The method according to claim 1 , wherein the maintaining the temperature minimizes a change in threshold voltage of the device over a period of use.