Reflectivity and fracing
A system and method allows determining the movement of subsurface fluids, gases or solids in the subsurface structure of interest. This allows quantitatively determining the results of surface and subsurface equipment and materials changes. These simple observations may result in significant improvements in field efficiency.
1. A method of determining the movement of subsurface fluids, gasses, or solids in a subsurface structure of interest, comprising:
positioning a controlled source electromagnetic system above a subsurface area of interest;
transmitting a designed waveform by a transmitter of the controlled source electromagnetic system toward a subsurface area of interest;
receiving a secondary field of the designed waveform by a receiver of the controlled source electromagnetic system, wherein the secondary field is a reflection of the designed waveform;
analyzing the secondary field of the designed waveform; and
indicating changes in impedance of structures in the subsurface area of interest contemporaneously with the changes, responsive to analyzing the reflection of the designed waveform.
2. The method of claim 1 , further comprising:
pumping conductive material with proppant material in the subsurface area of interest; and
detecting a contrast boundary in a fluid plume in the secondary field of the designed waveform.
3. The method of claim 2 , wherein pumping conductive material with proppant material in the subsurface area of interest comprises:
doping the proppant material with an electrically conductive material; and
pumping the doped proppant material in the subsurface area of interest.
4. The method of claim 1 , further comprising:
adjusting conductivity of a hydraulic fracturing fluid during a hydraulic fracturing operation.
5. The method of claim 1 , further comprising:
pumping doped proppant in varying concentrations; and
identifying an efficient pumping rate and extent responsive to indicating changes in impedance of the structures in the subsurface area of interest.
6. The method of claim 1 , further comprising:
determining a half fracing length in the subsurface area of interest, responsive to the analysis of the secondary field of the designed waveform.
7. The method of claim 1 , further comprising:
determining a fracing height in the subsurface area of interest, responsive to the analysis of the secondary field of the designed waveform.
8. The method of claim 1 , further comprising:
determining a fracing volume in the subsurface area of interest, responsive to the analysis of the secondary field of the designed waveform.
9. The method of claim 1 , further comprising:
monitoring and imaging an impedance interface in the subsurface area of interest responsive to the analysis of the secondary field of the designed waveform.
10. The method of claim 1 , further comprising:
detecting by the receiver of the controlled source electromagnetic system electromechanical voltages generated from cracking in the subsurface area of interest, wherein the electromechanical voltages are not coherent with the transmitted designed waveform.
11. The method of claim 1 , further comprising:
detecting a timing shift in the secondary field of the designed waveform caused by a deformation of structures in the subsurface area of interest.
12. The method of claim 1 , further comprising:
matching resistivity of proppant material with resistivity of hydraulic fracturing fluid; and
resolving location of the hydraulic fracturing fluid independent of the location of the proppant material in the subsurface area of interest.
13. The method of claim 1 , further comprising:
modifying a subsurface operation responsive to the indicated changes in impedance of structures in the subsurface area of interest.