IP Library Granted Patent US 9,449,683
Granted Patent B2
US 9,449,683 · App. 14/596,293 · Granted Sep 20, 2016

Memory cells having a plurality of resistance variable materials

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Quick Facts
Patent No.
US 9,449,683
App. No.
14/596,293
Granted
Sep 20, 2016
Kind
B2
Abstract

Resistance variable memory cells having a plurality of resistance variable materials and methods of operating and forming the same are described herein. As an example, a resistance variable memory cell can include a plurality of resistance variable materials located between a plug material and an electrode material. The resistance variable memory cell also includes a first conductive material that contacts the plug material and each of the plurality of resistance variable materials and a second conductive material that contacts the electrode material and each of the plurality of resistance variable materials.

Claims (32)

1. A method of operating an array of resistance variable cells, comprising:

applying a first voltage to a resistance variable cell that includes a plurality of resistance variable materials to transition an active region of a first of the plurality of resistance variable materials from a crystalline phase to an amorphous phase,

wherein at least two of the plurality of resistance variable materials have a different respective thickness and each of the plurality of resistance variable materials are formed between a plug material and an electrode material,

wherein the cell includes a conductive material that contacts the electrode material and each of the plurality of resistance variable materials, and

wherein the cell includes a heater material that contacts the plug material and each of the plurality of resistance variable materials such that a current can flow through the heater material to heat the active region.

2. The method of claim 1 , including applying a second voltage to the resistance variable cell to transition an active region of a second of the plurality of resistance variable materials from a crystalline phase to an amorphous phase, wherein the first voltage has a different value than the second voltage.

3. The method of claim 2 , including applying a third voltage to the resistance variable cell to transition an active region of a third of the plurality of resistance variable materials from a crystalline phase to an amorphous phase, wherein the third voltage has a different value than the first voltage and the second voltage.

4. The method of claim 3 , wherein the first of the plurality of resistance variable materials has a respective thickness greater than the second of the plurality of resistance variable materials.

5. The method of claim 4 , wherein the second of the plurality of resistance variable materials has a respective thickness greater than the third of the plurality of resistance variable materials.

6. The method of claim 5 , wherein the first of the plurality of resistance variable materials has a different stoichiometry than the second of the plurality of resistance variable materials.

7. The method of claim 6 , wherein the second of the plurality of resistance variable materials has a different stoichiometry than the third of the plurality of resistance variable materials.

8. The method of claim 7 , wherein the first of the plurality of resistance variable materials has a different stoichiometry than the third of the plurality of resistance variable materials.

9. A method of operating an array of resistance variable cells, comprising:

applying a first voltage to a resistance variable cell that includes a plurality of resistance variable materials to program the cell from a first data state to a second data state,

wherein each of the plurality of resistance variable materials are formed between a plug material and an electrode material,

wherein the cell includes a conductive material that contacts the electrode material and each of the plurality of resistance variable materials, and

wherein the cell includes a heater material that contacts the plug material and each of the plurality of resistance variable materials.

10. The method of claim 9 , including applying a second voltage to the resistance variable cell to program the cell from the second data state to a third data state.

11. The method of claim 10 , wherein the second voltage is greater than the first voltage.

12. The method of claim 11 , including applying a third voltage to the resistance variable cell to program the cell from the third data state to a fourth data state.

13. The method of claim 12 , wherein the third voltage is greater than the second voltage.

14. A method of operating an array of resistance variable cells, comprising:

applying a first voltage to a resistance variable cell that includes a plurality of resistance variable materials to program the cell from a first binary data state to a second binary data state, wherein the first binary data state and the second binary data state are selected from a group comprising 00, 01, 10, and 11,

wherein a first of the plurality of resistance variable materials has a lesser respective thickness than a second of the plurality of resistance variable materials and each of the plurality of resistance variable materials is formed between a plug material and an electrode material,

wherein the cell includes a conductive material that contacts the electrode material and each of the plurality of resistance variable materials, and

wherein the cell includes a heater material that contacts the plug material and each of the plurality of resistance variable materials.

15. The method of claim 14 including applying a second voltage to the resistance variable cell to program the cell from the second binary data state to a third binary data state, wherein the third binary data state is selected from the group comprising 00, 01, 10, and 11.

16. The method of claim 15 including applying a third voltage to the resistance variable cell to program the cell from the third binary data state to a fourth binary data state, wherein the fourth binary data state is selected from the group comprising 00, 01, 10, and 11.

17. The method of claim 16 , wherein the plurality of resistance variable materials comprise at least one phase change material.

18. The method of claim 17 , wherein at least two of the plurality of resistance variable materials have different stoichiometries.

19. The method of claim 16 , wherein each of the plurality of resistance variable materials is in a crystalline phase when the first voltage is applied.

20. The method of claim 19 , wherein application of the third voltage results in each of the plurality of resistance variable materials being in an amorphous phase.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 1, 2016
From: MICRON TECHNOLOGY, INC
To: OVONYX MEMORY TECHNOLOGY, LLC
Reel/Frame 039974/0496 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 14, 2015
From: RUSSO, UGO; REDAELLI, ANDREA; PELLIZZER, FABIO
To: MICRON TECHNOLOGY, INC.
Reel/Frame 034704/0034 →