SPECTROMETER REFERENCE CALIBRATION
Aspects of spectrometer reference calibration are described. In one embodiment, a diagnostic measurement for evaluation of an aspect of calibration in spectroscopy is performed. A result of the diagnostic measurement is analyzed to determine a deviation from an expected result. Based on the analysis, a correction algorithm may be applied to the aspect of calibration, in view of the deviation. In some embodiments, a product model diagnostic measurement is also performed for further evaluation of the aspect of calibration. A result of the product model diagnostic measurement is analyzed to determine a product model deviation from an expected result of the product model diagnostic measurement, and a product model correction algorithm is applied, if necessary. According to aspects of the embodiments described herein, using reference standards permits reconstruction of calibration parameters without any need for a master instrument or other forms of calibrated reference instrumentation.
1 . A method for calibration, comprising:
performing a diagnostic measurement for evaluation of an aspect of calibration in near-infrared spectroscopy;
analyzing a result of the diagnostic measurement to determine a deviation from an expected result of the diagnostic measurement;
applying a correction algorithm to the aspect of calibration based at least in part on the deviation from the expected result;
after applying the correction algorithm, performing a product model diagnostic measurement for further evaluation of the aspect of calibration; and
verifying the aspect of calibration.
2 . The method of claim 1 , further comprising:
analyzing a result of the product model diagnostic measurement to determine a product model deviation from an expected result of the product model diagnostic measurement; and
applying a product model correction algorithm to the aspect of calibration based at least in part on the product model deviation, wherein
verifying the aspect of calibration comprises performing a verification measurement on a product sample.
3 . The method of claim 1 , wherein performing a diagnostic measurement and performing a product model diagnostic measurement each comprises performing diagnostic measurements for evaluating a plurality of aspects of calibration in near-infrared spectroscopy using a first principles standard.
4 . The method of claim 3 , wherein the plurality of aspects of calibration comprise wavelength accuracy, wavelength linearity, photometric accuracy, photometric linearity, instrument line shape, detector response, and source color temperature aspects.
5 . The method of claim 3 , wherein the first principles standard comprises.
6 . The method of claim 1 , wherein analyzing the result of the diagnostic measurement comprises determining whether correction in the aspect of calibration is required based at least in part on benchmark performance criteria.
7 . The method of claim 1 , wherein:
performing the diagnostic measurement comprises performing the diagnostic measurement for each of a plurality of aspects of calibration in near-infrared spectroscopy using a first principles standard;
analyzing the result of the diagnostic measurement comprises analyzing the result of the diagnostic measurement for each of the plurality of aspects of calibration; and
applying the correction algorithm further comprises applying the correction algorithm for each of the plurality of aspects of calibration.
8 . The method of claim 1 , wherein applying the correction algorithm comprises at least one of applying a filter for noise compensation, applying a photometric correction for baseline and linear response signatures, or applying a response shape correction.
9 . The method of claim 2 , wherein:
performing the product model diagnostic measurement comprises evaluating linearity and integrity of the result of the product model diagnostic measurement; and
applying the product model correction algorithm comprises applying a linear or non-linear correction algorithm based at least in part on the product model deviation.
10 . A spectrographic instrument, comprising:
spectrographic instrumentation for performing spectrographic measurements; and
a measurement processing engine that:
performs a diagnostic measurement for evaluation of an aspect of calibration of the spectrographic instrument using a first principles standard;
analyzes a result of the diagnostic measurement to determine a deviation from an expected result of the diagnostic measurement;
applies a correction algorithm to the aspect of calibration based at least in part on the deviation from the expected result; and
verifies the aspect of calibration.
11 . The spectrographic instrument of claim 10 , wherein the measurement processing engine further:
performs a product model diagnostic measurement further evaluation of the aspect of calibration using the first principles standard;
analyzes a result of the product model diagnostic measurement to determine a product model deviation from an expected result of the product model diagnostic measurement; and
applies a product model correction algorithm to the aspect of calibration based at least in part on the product model deviation.
12 . The spectrographic instrument of claim 10 , wherein the measurement processing engine further performs diagnostic measurements for evaluating a plurality of aspects of calibration in near-infrared spectroscopy using the first principles standard.
13 . The spectrographic instrument of claim 10 , wherein the first principles standard comprises a.
14 . The spectrographic instrument of claim 10 , wherein the measurement processing engine further determines whether correction in the aspect of calibration is required based at least in part on benchmark performance criteria.
15 . The spectrographic instrument of claim 10 , wherein the measurement processing engine:
performs a diagnostic measurement for each of a plurality of aspects of calibration in near-infrared spectroscopy;
analyzes a result of the diagnostic measurement for each of the plurality of aspects of calibration; and
applies a correction algorithm for each of the plurality of aspects of calibration.
16 . A method for calibration, comprising:
performing a diagnostic measurement for evaluation of an aspect of calibration in spectroscopy using a first principles standard;
analyzing a result of the diagnostic measurement to determine a deviation from an expected result of the diagnostic measurement;
applying a correction algorithm to the aspect of calibration based at least in part on the deviation from the expected result;
after applying the correction algorithm, performing a product model diagnostic measurement for further evaluation of the aspect of calibration; and
analyzing a result of the product model diagnostic measurement to verify the aspect of calibration.
17 . The method of claim 16 , further comprising applying a product model correction algorithm to the aspect of calibration.
18 . The method of claim 16 , wherein the first principles standard comprises a.
19 . The method of claim 16 , wherein analyzing the result of the diagnostic measurement comprises determining whether correction in the aspect of calibration is required based at least in part on benchmark performance criteria.
20 . The method of claim 16 , wherein:
performing the diagnostic measurement comprises performing the diagnostic measurement for each of a plurality of aspects of calibration;
analyzing the result of the diagnostic measurement comprises analyzing the result of the diagnostic measurement for each of the plurality of aspects of calibration; and
applying the correction algorithm further comprises applying the correction algorithm for each of the plurality of aspects of calibration.