Material identification system

1. An object identification system comprising:

a single X-ray source, the single X-ray source configured to produce mono-energetic X-rays;

a detector configured to detect X-rays from the single X-ray source that pass through an object;

an object analyzer in communication with the detector and the single X-ray source, the object analyzer:

obtains an image of an object generated from the mono-energetic X-rays passing through the object;

estimates attenuations for pixels in a sensor system from the image of the object to form estimated attenuations, wherein the attenuations represent a loss of energy that occurs from the mono-energetic X-rays passing through the object; and

identifies a material in the object using the estimated attenuations and known attenuation information for identifying the material in the object.

2. The object identification system of claim 1 , wherein in estimating the attenuations for the pixels in the sensor system from the image of the object to form the estimated attenuations, the object analyzer:

identifies values of the mono-energetic X-rays detected by the pixels in the sensor system; and

solves a system of equations to identify the estimated attenuations based on the values of the mono-energetic X-rays detected by the pixels.

3. The object identification system of claim 1 , wherein in identifying the material in the object using the estimated attenuations and the known attenuation information for identifying the material in the object, the object analyzer:

generates an average estimated attenuation for the object in the image from the estimated attenuations;

compares the average estimated attenuation to a group of attenuation curves for known materials to form a comparison; and

generates an identification of the material from the comparison.

4. The object identification system of claim 1 , wherein the mono-energetic X-rays have a profile and wherein in estimating the attenuations for the pixels in the sensor system from the image of the object to form the estimated attenuations, the object analyzer identifies energy loss that occurs from amounts of X-ray energy passing through the object.

5. The object identification system of claim 1 , wherein in estimating the attenuations for the pixels in the sensor system from the image of the object to form the estimated attenuations, the object analyzer:

identifies lengths of paths of the mono-energetic X-rays passing through the object to the pixels in the sensor system;

identifies values of the mono-energetic X-rays detected by the pixels in the sensor system; and

solves a system of equations to identify the estimated attenuations based on the values of the mono-energetic X-rays detected by the pixels and the lengths of the paths of the mono-energetic X-rays passing through the object.

6. The object identification system of claim 1 , wherein in estimating the attenuations for the pixels in the sensor system from the image of the object to form the estimated attenuations, the object analyzer uses a direct search method, wherein the direct search method comprises an iterative optimization technique for identifying a solution to a system of equations.

7. The object identification system of claim 2 , wherein the object analyzer generates the system of equations based on the pixels in the sensor system and information about the single X-ray source.

8. The object identification system of claim 7 , wherein the system of equations is selected from one of a system of linear equations, a system of non-linear equations, a pseudo-inverse, and a matrix inversion.

9. The object identification system of claim 7 , wherein the system of equations is solved by the object analyzer using at least one of a least squares method or an iterative method.

10. An object identification system comprising:

an object analyzer that:

obtains an image of an object generated from energy passing through the object;

estimates attenuations for pixels in a sensor system from the image of the object to form estimated attenuations, wherein the attenuations represent a loss of energy that occurs from the energy passing through the object; and

identifies a material in the object using the estimated attenuations and known attenuation information for identifying the material in the object;

wherein in estimating the attenuations for the pixels in the sensor system from the image of the object to form the estimated attenuations, the object analyzer:

estimates the attenuations for the pixels from the image and an additional group of attenuations for the pixels in the sensor system from an additional group of images of the object to form the estimated attenuations and additional estimated attenuations and wherein in identifying the material in the object using the estimated attenuations and the known attenuation information for identifying the material in the object, the object analyzer:

generates average estimated attenuations for the object from the image and a group of additional estimated attenuations from an additional group of additional images for the object;

forms a curve from the average estimated attenuations;

compares the curve to a group of attenuation curves in the known attenuation information for identifying the material in the object to form a comparison; and

generates an identification of the material from the comparison.

11. The object identification system of claim 10 , wherein in comparing the curve to the group of attenuation curves in the known attenuation information for identifying the material in the object to form the comparison, the object analyzer searches the group of attenuation curves for types of materials for a closest match to the estimated attenuations using a discrete search method to form the comparison.