IP Library Granted Patent US 9,558,064
Granted Patent B2
US 9,558,064 · App. 14/607,206 · Granted Jan 31, 2017

Estimating an error rate associated with memory

Inventors: Sivagnanam Parthasarathy (Carlsbad, CA); Mustafa N. Kaynak (San Diego, CA); Patrick R. Khayat (San Diego, CA); Nicholas J. Richardson (San Diego, CA)
Assignee: Micron Technology, Inc.
G06F11/1048G06F11/07G06F11/073G06F11/076G06F11/0793G06F11/08G11C11/5628G11C11/5642G11C29/00G11C29/52G11C29/56008H03M13/1102H03M13/3715H03M13/3738H03M13/612G11C2029/0411
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Quick Facts
Patent No.
US 9,558,064
App. No.
14/607,206
Granted
Jan 31, 2017
Kind
B2
Abstract

The present disclosure includes apparatuses and methods for estimating an error rate associated with memory. A number of embodiments include sensing data stored in a memory, performing an error detection operation on the sensed data, determining a quantity of parity violations associated with the error detection operation, and estimating an error rate associated with the memory based on the determined quantity of parity violations.

Claims (38)

1. A method for operating memory, comprising:

sensing data stored in a memory;

performing an error detection operation on the sensed data, wherein performing the error detection operation on the sensed data includes:

interleaving the sensed data into a number of data segments; and

performing an XOR operation on each of the data segments;

determining a quantity of parity violations associated with the error detection operation; and

estimating an error rate associated with the memory based on the determined quantity of parity violations.

2. The method of claim 1 , wherein the method includes:

performing the error detection operation using circuitry in the memory;

determining the quantity of parity violations using the circuitry in the memory; and

estimating the error rate associated with the memory using the circuitry in the memory.

3. The method of claim 1 , wherein the method includes:

determining whether the estimated error rate associated with the memory meets or exceeds a threshold; and

correcting the sensed data upon determining the estimated error rate meets or exceeds the threshold.

4. The method of claim 3 , wherein the method includes not correcting the sensed data upon determining the estimated error rate does not meet or exceed the threshold.

5. The method of claim 1 , wherein the method includes:

determining whether the estimated error rate associated with the memory meets or exceeds a threshold; and

including an option to generate soft data associated with the sensed data upon determining the estimated error rate meets or exceeds the threshold.

6. The method of claim 1 , wherein the error detection operation is a low-density parity check operation using low-density parity check code parities.

7. The method of claim 1 , wherein determining the quantity of parity violations associated with the error detection operation includes summing the quantity of parity violations that occur during the XOR operations.

8. An apparatus, comprising:

a memory; and

circuitry configured to:

sense data stored in the memory;

perform an error detection operation on the sensed data, wherein performing the error detection operation on the sensed data includes:

interleaving the sensed data into a number of data segments; and

performing an XOR operation on each of the data segments;

determine a quantity of parity violations associated with the error detection operation performed on the sensed data; and

estimate an error rate associated with the memory based on the determined quantity of parity violations.

9. The apparatus of claim 8 , wherein the memory and the circuitry are included on a same die.

10. The apparatus of claim 8 , wherein:

the apparatus includes a controller coupled to the memory; and

the controller includes the circuitry.

11. The apparatus of claim 8 , wherein the circuitry is configured to estimate the error rate associated with the memory by:

dividing the determined quantity of parity violations by the amount of data on which the error detection operation is performed; and

multiplying the division result by a scalar.

12. The apparatus of claim 11 , wherein the scalar is based on the determined quantity of parity violations.

13. The apparatus of claim 11 , wherein the scalar is a fixed value.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 28, 2015
From: PARTHASARATHY, SIVAGNANAM; KAYNAK, MUSTAFA N.; KHAYAT, PATRICK R.; RICHARDSON, NICHOLAS J.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 034828/0446 →
Continuity (1)
Related Publication 20160218740A1 · Jul 28, 2016