Persistent command parameter table for pre-silicon device testing
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.
1. A computer implemented method for pre-silicon device testing using a persistent command table, the method comprising:
receiving a persistent command parameter from a user;
determining whether the value of the persistent command parameter is greater than zero;
based on determining whether the persistent command parameter is greater than zero, selecting a number of commands equal to the persistent command parameter from a regular command table of a driver of a device under test;
adding the selected commands to the persistent command table of the driver;
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver;
receiving from the user a time delay to wait between commands during the testing; and
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received time delay.
2. The method of claim 1 , wherein the driver is one of a plurality of drivers of a single type of driver of the device under test, and wherein the method further comprises performing testing of the device under test via the plurality of drivers using only commands from the persistent command table.
3. The method of claim 1 , further comprising receiving a repetitive sequence parameter from the user, the repetitive sequence parameter indicating one of random order testing and given order testing.
4. The method of claim 3 , further comprising:
based on the repetitive sequence parameter indicating the random order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in a random order.
5. The method of claim 3 , further comprising:
based on the repetitive sequence parameter indicating the given order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in an order in which the commands are given in the persistent command table.
6. The method of claim 1 , further comprising, after completion of the testing of the device under test via the driver using the persistent command table:
selecting a different set of commands from the regular command table;
adding the different set of commands to a new persistent command table of the driver; and
performing subsequent testing of the device under test via the driver using only commands from the new persistent command table.
7. The method of claim 1 , further comprising
receiving from the user an address or attribute of the address to associate with commands during the testing; and
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received address or attribute of the address.
8. A computer program product for implementing pre-silicon device testing using a persistent command table, the computer program product comprising:
a non-transitory computer readable storage medium having program instructions embodied therewith, the program instructions readable by a processing circuit to cause the processing circuit to perform a method comprising:
receiving a persistent command parameter from a user;
determining whether the persistent command parameter is greater than zero;
based on determining whether the persistent command parameter is greater than zero, selecting a number of commands equal to the persistent command parameter from a regular command table of a driver of a device under test;
adding the selected commands to the persistent command table of the driver;
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver;
receiving from the user a time delay to wait between commands during the testing; and
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received time delay.
9. The computer program product of claim 8 , wherein the driver is one of a plurality of drivers of a single type of driver of the device under test, and wherein the method further comprises performing testing of the device under test via the plurality of drivers using only commands from the persistent command table.
10. The computer program product of claim 8 , further comprising receiving a repetitive sequence parameter from the user, the repetitive sequence parameter indicating one of random order testing and given order testing.
11. The computer program product of claim 10 , further comprising:
based on the repetitive sequence parameter indicating the random order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in a random order.
12. The computer program product of claim 10 , further comprising:
based on the repetitive sequence parameter indicating the given order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in an order in which the commands are given in the persistent command table.
13. The computer program product of claim 8 , further comprising, after completion of the testing of the device under test via the driver using the persistent command table:
selecting a different set of commands from the regular command table;
adding the different set of commands to a new persistent command table of the driver; and
performing subsequent testing of the device under test via the driver using only commands from the new persistent command table.
14. A computer system for pre-silicon device testing using a persistent command table, the system comprising:
a memory; and
a processor, communicatively coupled to said memory, the computer system configured to perform a method comprising:
receiving a persistent command parameter from a user;
determining whether the persistent command parameter is greater than zero;
based on determining whether the persistent command parameter is greater than zero, selecting a number of commands equal to the persistent command parameter from a regular command table of a driver of a device under test;
adding the selected commands to the persistent command table of the driver;
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver;
receiving from the user a time delay to wait between commands during the testing; and
performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver based on persistently applying the received time delay.
15. The system of claim 14 , wherein the driver is one of a plurality of drivers of a single type of driver of the device under test, and wherein the method further comprises performing testing of the device under test via the plurality of drivers using only commands from the persistent command table.
16. The system of claim 14 , further comprising receiving a repetitive sequence parameter from the user, the repetitive sequence parameter indicating one of random order testing and given order testing.
17. The system of claim 16 , further comprising:
based on the repetitive sequence parameter indicating the random order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in a random order.
18. The system of claim 16 , further comprising:
based on the repetitive sequence parameter indicating the given order testing, performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver by driving the commands from the persistent command table to the driver in an order in which the commands are given in the persistent command table.
19. The system of claim 14 , further comprising, after completion of the testing of the device under test via the driver using the persistent command table:
selecting a different set of commands from the regular command table;
adding the different set of commands to a new persistent command table of the driver; and
performing subsequent testing of the device under test via the driver using only commands from the new persistent command table.