IP Library Granted Patent US 9,300,283
Granted Patent B1
US 9,300,283 · App. 14/624,587 · Granted Mar 29, 2016

Single capacitor, low leakage charge pump

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Quick Facts
Patent No.
US 9,300,283
App. No.
14/624,587
Granted
Mar 29, 2016
Kind
B1
Abstract

A charge pump circuit includes a delay circuit, a transistor, and a capacitor. The charge pump receives an input signal and outputs an output signal. The delay circuit receives a first signal based on the input signal and outputs a first delayed signal. The transistor includes a gate, a first channel node, and a second channel node. The first channel node receives the first signal. The second channel node is connected to the output and to a first plate of the capacitor. A second plate of the capacitor receives a second signal based on the first delayed signal. The charge pump circuit is adapted to operate such that the voltage range of the output signal is greater than the voltage range of the input signal.

Claims (42)

1. An integrated circuit (IC) comprising a charge pump circuit that receives an input signal at an input node and provides an output signal at an output node, the charge pump circuit comprising:

a delay circuit that receives a first signal based on the input signal and outputs a delayed signal;

a transistor comprising a gate, a first channel node, and a second channel node; and

a capacitor, wherein:

the first channel node receives the first signal;

the second channel node is connected to the output node and to a first plate of the capacitor; and

a second plate of the capacitor receives a second signal based on the delayed signal, wherein:

the first signal is substantially an inverse of the input signal;

the second signal is substantially identical to the delayed signal;

the input signal is non-negative; and

the lowest voltage value of the output signal is negative.

2. The IC of claim 1 , wherein the charge pump circuit comprises exactly one capacitor.

3. The IC of claim 1 , wherein:

and

the output signal has a peak voltage value that is higher than the peak voltage value of the input signal.

4. The IC of claim 3 , wherein the transistor is an N-channel metal-oxide semiconductor (NMOS) field-effect transistor (FET).

5. The IC of claim 4 , wherein:

the transistor further comprises a body; and

the body is held at a ground voltage.

6. The IC of claim 4 , wherein the gate is held at a supply voltage of the charge pump circuit.

7. The IC of claim 4 , wherein the charge pump circuit further comprises:

a first inverter that receives the delayed signal and outputs an inverted delayed signal; and

a second inverter that receives the inverted delayed signal and outputs the second signal, and

wherein the gate receives the inverted delayed signal.

8. The IC of claim 1 , wherein the transistor is a P-channel metal-oxide semiconductor (PMOS) FET.

9. The IC of claim 8 , wherein:

the transistor further comprises a body;

the body is held at a supply voltage of the charge pump circuit.

10. The IC of claim 8 , wherein the gate is held at a ground voltage.

11. The IC of claim 8 , wherein the charge pump circuit further comprises:

a first inverter that receives the delayed signal and outputs an inverted delayed signal;

a second inverter that receives the inverted delayed signal and outputs the second signal, and

wherein the gate receives the inverted delayed signal.

12. The IC of claim 1 , wherein the input signal is a periodic square wave having upticks and downticks.

13. The IC of claim 12 , wherein the delay circuit is an asymmetric delay circuit that introduces a first delay period for upticks and a second delay period, different from the first delay period, for downticks.

14. The IC of claim 13 , wherein the shorter of the first and second delay periods is not longer than half of the longer of the first and second delay periods.

15. The IC of claim 13 , wherein the shorter of the first and second delay periods is not longer than a quarter of the longer of the first and second delay periods.

16. The IC of claim 1 , further comprising a set of one or more additional charge pump circuits connected in series, the set having a set input node that is connected to the output node.

17. A charge pump circuit that receives an input signal at an input node and provides an output signal at an output node, the charge pump circuit comprising:

a delay circuit that receives a first signal based on the input signal and outputs a delayed signal;

a transistor comprising a gate, a first channel node that receives the first signal, and a second channel node connected to the output node; and

a single capacitor having a first plate connected to the second channel node and the output node, and a second plate that receives a second signal based on the delayed signal, wherein the charge pump circuit comprises exactly one capacitor.

Assignments (6)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →