Semiconductor light trap device

1. A device comprising:

a semiconductor structure having an exposed surface to be exposed to light rays;

a photoelectrically active portion located beneath the exposed surface within the semiconductor structure; and

an internal structure located beneath the active photoelectrically portion, the internal structure having an interface surface generally parallel to the exposed surface at which total internal reflection of light rays occurs such that at least some the light rays are redirected toward the photoelectrically active portion.

2. The device of claim 1 , wherein the exposed surface further comprises refractive facets that are angled relative to the interface surface so as to be non-parallel relative to the interface surface.

3. The device of claim 1 , wherein the internal structure comprises a cavity.

4. The device of claim 3 , wherein the cavity is defined, at least in part, by the interface surface and a second surface that is separated from and substantially parallel to the interface surface.

5. The device of claim 1 , further comprising a perimeter trench proximate a perimeter of the semiconductor structure having an internal interface surface that is oriented substantially perpendicular to the interface surface.

6. The device of claim 1 , further comprising scattering facets located within the semiconductor structure above or within the photoelectrically active portion, wherein the scattering facets redirect light rays by total internal reflection.

7. The device of claim 6 , wherein the scattering facets are formed at the interfaces of cavities within the semiconductor structure and the cavities are adjacent one another and spaced from one another.

8. The device of claim 7 , wherein the cavities are substantially diamond shaped in cross section.