IP Library › Granted Patent US 9,376,748
Granted Patent B2
US 9,376,748 · App. 14/625,048 · Granted Jun 28, 2016

Method for etching organic film

Inventors: Michiharu Yamamoto (Aichi, JP); Shunichi Tatematsu (Aichi, JP); Ryusuke Yamashita (Aichi, JP); Norihiko Hamada (Aichi, JP); Koei Gemba (Aichi, JP)
Assignee: AICHI STEEL CORPORATION
C23C16/045C23C16/401C23C16/44H01F41/04
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Quick Facts
Patent No.
US 9,376,748
App. No.
14/625,048
Granted
Jun 28, 2016
Kind
B2
Abstract

A method for etching an organic film 1 having a surface selectively protected by a hard mask layer 2 , includes a partial etching process of etching the organic film 1 partly in a thickness direction of the organic film 1 by using a mixed gas containing a gas that anisotropically etches a silicon oxide film and a gas that isotropically etches the organic film without etching the silicon oxide film; and a deposition process of depositing a protective film 3 made of the silicon oxide film on side surfaces 12 and a bottom surface 11 of a recess 10 formed in the organic film in the partial etching process. The partial etching process and the deposition process is alternately performed multiple times.

Claims (17)

1. A method for etching an organic film having a surface selectively protected by a hard mask layer, the method comprising:

a) partially etching the organic film in a thickness direction thereof with a mixed gas comprising a gas that anisotropically etches a silicon oxide film and a gas that isotropically etches the organic film without etching the silicon oxide film to form a partially etched organic film; and

b) depositing a protective film made of the silicon oxide film on side surfaces and a bottom surface of a recess formed in a) in the partially etched organic film,

wherein a) and b) are each performed multiple times.

2. The method according to claim 1 ,

wherein the mixed gas comprises O 2 gas and Ar gas, and Ar + and oxygen radicals are generated from the mixed gas in the partial etching, and

wherein the Ar + anisotropically etches the silicon oxide film, and the oxygen radicals isotropically etch the organic film.

3. The method according to claim 1 ,

wherein the organic film is a plating resist for forming a wiring layer having a height difference in the thickness direction of the organic film.

4. The method according to claim 3 ,

wherein the wiring layer forms a coil that winds around a magneto-sensitive body provided on a substrate in an MI sensor, and

wherein the organic film is a plating resist for forming the coil.

5. The method according to claim 2 ,

wherein the organic film is a plating resist for forming a wiring layer having a height difference in the thickness direction of the organic film.

6. The method according to claim 5 ,

wherein the wiring layer forms a coil that winds around a magneto-sensitive body provided on a substrate in an MI sensor, and

wherein the organic film is a plating resist for forming the coil.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 18, 2015
From: YAMAMOTO, MICHIHARU; TATEMATSU, SHUNICHI; YAMASHITA, RYUSUKE; HAMADA, NORIHIKO; GEMBA, KOEI
To: AICHI STEEL CORPORATION
Reel/Frame 035034/0407 →
Priority Claims (1)
JP 2014-029708 · Feb 19, 2014 · national
Continuity (1)
Related Publication 20150232984A1 · Aug 20, 2015