Systems and methods for improving energy resolution by sub-pixel energy calibration

1. A radiation detector assembly comprising:

a semiconductor detector having a surface;

plural pixelated anodes disposed on the surface, each pixelated anode configured to generate a primary signal responsive to reception of a photon by the pixelated anode and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode; and

at least one processor operably coupled to the pixelated anodes, the at least one processor configured to:

define sub-pixels for each pixelated anode;

acquire primary signals and secondary signals corresponding to acquisition events from the pixelated anodes;

determine sub-pixel locations for the acquisition events using the primary signals and the secondary signals;

generate a sub-pixel energy spectrum for each sub-pixel, using the primary signals, to produce sub-pixel energy spectra;

apply at least one energy calibration parameter to adjust the sub-pixel energy spectra for each pixelated anode to produce calibrated sub-pixel energy spectra; and

for each pixelated anode, combine the calibrated sub-pixel energy spectra to provide a pixelated anode spectrum.

2. The detector assembly of claim 1 , wherein the at least one processor is configured to align respective peaks of the sub-pixel energy spectra for each pixelated anode using the at least one energy calibration parameter.

3. The detector assembly of claim 1 , wherein the at least one energy calibration parameter is selected from a group of parameters comprising a gain and an offset, wherein applying the gain adjusts a position and a breadth of a peak of an energy spectrum being adjusted and applying the offset shifts a peak location of the spectrum being adjusted.

4. The detector assembly of claim 1 , wherein at least a portion of the at least one processor is integrated with the semiconductor detector.

5. The detector assembly of claim 4 , wherein the at least a portion of the at least one processor comprises at least one of an application specific integrated circuit (ASIC) or field programmable gate array (FPGA).

6. The detector assembly of claim 1 , wherein the at least one processor is housed externally from the semiconductor detector.

7. The detector assembly of claim 1 , wherein the at least one processor is configured to bin primary signals for each sub-pixel based on energy level to provide a histogram of counts of primary signals counted against energy level to generate the sub-pixel energy spectrum for each sub-pixel.

8. The detector assembly of claim 1 , wherein the at least one processor is configured to assign a corresponding electrical channel to each pixelated anode, wherein each channel has associated therewith a threshold discriminator having a threshold level configured to allow collection of events corresponding to an induced electrical charge in an adjacent anode caused by reception of a photon by the adjacent anode.

9. A method of imaging using a semiconductor detector having a surface with plural pixelated anodes disposed thereon, each pixelated anode configured to generate a primary signal responsive to reception of a photon by the pixelated anode and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode, the method comprising:

defining, with at least one processor operably coupled to the pixelated anodes, sub-pixels for each pixelated anode;

acquiring, with the at least one processor, primary signals and secondary signals corresponding to acquisition events from the pixelated anodes;

determining, with the at least one processor, sub-pixel locations for the acquisition events using the primary signals and the secondary signals;

generating, with the at least one processor, a sub-pixel energy spectrum for each sub-pixel using the primary signals, to produce sub-pixel energy spectra;

applying, with the at least one processor, at least one energy calibration parameter to adjust the sub-pixel energy spectra for each pixelated anode to produce calibrated sub-pixel energy spectra ; and

for each pixelated anode, combining the calibrated sub-pixel energy spectra to provide a pixelated anode spectrum.

10. The method of claim 9 , further comprising reconstructing the image using the pixelated anode spectrum from each pixelated anode.

11. The method of claim 9 , further comprising aligning, with the at least one processor, respective peaks of the sub-pixel energy spectra for each pixelated anode using the at least one energy calibration parameter.

12. The method of claim 9 , wherein the at least one energy calibration parameter is selected from a group of parameters comprising a gain and an offset, wherein applying the gain adjusts a position and a breadth of a peak of an energy spectrum being adjusted and applying the offset shifts the peak location of the spectrum.

13. The method of claim 9 , further comprising binning primary signals for each sub-pixel based on energy level to provide a histogram of counts of primary signals plotted against energy level to generate the sub-pixel energy spectrum for each sub-pixel.

14. A method of providing a radiation detector assembly comprising:

providing a semiconductor detector having a surface with plural pixelated anodes disposed thereon, each pixelated anode configured to generate a primary signal responsive to reception of a photon by the pixelated anode and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode;

operably coupling the pixelated anodes to at least one processor;

defining, with the at least one processor, sub-pixels for each pixelated anode;

providing a calibrated radiation supply to the semiconductor detector, wherein the pixelated anodes generate primary signals and secondary signals responsive to the calibrated radiation supply;

acquiring, with the at least one processor, the primary signals and the secondary signals from the pixelated anodes;

determining sub-pixel locations for calibrated acquisition events using the primary and the secondary signals generated responsive to the calibrated radiation supply;

generating a non-calibrated sub-pixel energy spectrum for each sub-pixel, using the primary signals, to produce non-calibrated sub-pixel energy spectra;

determining at least one calibration parameter to align the non-calibrated energy spectra with an expected spectrum; and

applying the at least one determined calibration parameter to the non-calibrated sub-pixel energy spectra to generate calibrated sub-pixel energy spectra.

15. The method of claim 14 , further comprising, for each pixelated anode, combining the calibrated sub-pixel energy spectra to provide a pixelated anode spectrum.

16. The method of claim 14 , wherein determining the at least one calibration parameter comprises determining an offset, wherein applying the offset shifts the peak location of a spectrum being adjusted.

17. The method of claim 16 , where determining the at least one calibration parameter further comprises determining a gain, wherein applying the gain adjusts an amplitude of the spectrum being adjusted.

18. The method of claim 14 , wherein the calibrated radiation supply includes radiation from a first isotope and a second isotope, the second isotope having a different radiation energy than the first isotope.

19. The method of claim 14 , wherein the calibration parameters are configured to align respective peaks of the non-calibrated sub-pixel energy spectra with a peak of the expected spectrum.

20. The method of claim 14 , further comprising binning primary signals for each sub-pixel based on energy level to provide a histogram of counts of primary signals counted against energy level to generate the non-calibrated sub-pixel energy spectrum for each sub-pixel.