Semiconductor device having electrode made of high work function material, method and apparatus for manufacturing the same
Provided is a semiconductor device including a metal film which can be formed with lower costs but still mange to have a necessary work function and oxidation resistance. The semiconductor device includes an insulating film disposed on a substrate; and a metal film disposed on the insulating film. The metal film includes a stacked structure of: a first metal film disposed on the insulating film to directly contact the insulating film; a second metal film disposed on the first metal film to directly contact the first metal film; and the first metal film disposed on the second metal film to directly contact the second metal film, the second metal film having a work function greater than 4.8 eV and being different from the first metal film in material, wherein an oxidation resistance of the first metal film is greater than that of the second metal film.
1. A semiconductor device comprising:
an insulating film disposed on a substrate; and
a metal film comprising a stacked structure of: a laminated film where a first metal film and a second metal film are laminated repeatedly; and a capping metal film disposed on the laminated film, the first metal film at a bottom of the metal film being disposed on the insulating film to directly contact the insulating film, the capping metal film being disposed on the second metal film at a top of the metal film to directly contact the second metal film, the second metal film having a work function greater than 4.8 eV and being different from the first metal film in material, and the capping metal film being constituted by a same material as the first metal film, wherein oxidation resistances of the first metal film and the capping metal film are greater than that of the second metal film.
2. The semiconductor device of claim 1 , wherein a thickness of the first metal film ranges from 0.2 nm to 4 nm.
3. The semiconductor device of claim 1 , wherein a thickness of the second metal film ranges from 0.5 nm to 10 nm.
4. The semiconductor device of claim 1 , wherein a thickness of the second metal film ranges from 4 nm to 5 nm.
5. The semiconductor device of claim 1 , wherein the second metal film is thicker than the first metal film.
6. The semiconductor device of claim 1 , wherein the first metal film comprises one of a titanium nitride film, a tantalum nitride film, a titanium aluminum nitride film and a tantalum aluminum nitride film.
7. The semiconductor device of claim 1 , wherein the second metal m comprises a non-noble metal.
8. The semiconductor device of claim 1 , wherein the second metal film comprises at least one of a nickel film, a cobalt film, a beryllium film, a carbon film, a selenium film, a tellurium film and a rhenium film.
9. The semiconductor device of claim 1 , wherein the insulating film comprises a high permittivity film.
10. The semiconductor device of claim 1 , wherein the insulating film comprises at least one of a hafnium oxide film, a zirconium oxide film, a hafnium oxide film doped with an aluminum, a zirconium oxide film doped with the aluminum, a titanium oxide film, a niobium oxide film, a tantalum oxide film, a strontium titanate film, a barium strontium titanate film and a lead zirconate titanate film.
11. A semiconductor device comprising:
an insulating film disposed on a substrate; and
a metal film comprising a stacked structure of a laminated film where a first metal film and a second metal film are laminated repeatedly; and a third metal film disposed on the laminated film, the first metal film at a bottom of the metal film being disposed on the insulating film to directly contact the insulating film, the third metal film being disposed on the second metal film at a top of the metal film to directly contact the second metal film, the second metal film having a work function greater than 4.8 eV and being different from the first metal film in material, and the third metal being constituted by a same material as the first metal film, wherein oxidation resistances of the first metal film and the third metal film are greater than that of the second metal film.