IP Library Granted Patent US 9,583,671
Granted Patent B2
US 9,583,671 · App. 14/629,487 · Granted Feb 28, 2017

Quantum efficiency of multiple quantum wells

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,583,671
App. No.
14/629,487
Granted
Feb 28, 2017
Kind
B2
Abstract

Improved quantum efficiency of multiple quantum wells. In accordance with an embodiment of the present invention, an article of manufacture includes a p side for supplying holes and an n side for supplying electrons. The article of manufacture also includes a plurality of quantum well periods between the p side and the n side, each of the quantum well periods includes a quantum well layer and a barrier layer, with each of the barrier layers having a barrier height. The plurality of quantum well periods include different barrier heights.

Claims (22)

1. A method comprising:

forming a stack of layers for a multiple quantum well semiconductor device on a substrate, said stack of layers comprising: a p type layer;

an electron blocking layer in contact with said p type layer;

a plurality of quantum well periods in contact with said electron blocking layer, each of said quantum well periods comprising a quantum well layer and a barrier layer that comprises a barrier layer p type doping concentration, and wherein said plurality of quantum well periods comprise barrier layers of varying p type doping concentration;

an n-type layer in contact with said plurality of quantum well periods; and

etching said stack of layers such that said plurality of quantum well periods comprise said quantum well layers of varying area.

2. The method of claim 1 wherein an area of each of said plurality of quantum well periods increases in a direction from said n type layer to said p type layer.

3. The method of claim 1 wherein an area of each of said plurality of barrier layers increases in a direction from said n type layer to said p type layer.

4. The method of claim 1 wherein an area of each of said plurality of quantum well layers increases in a direction from said n type layer to said p type layer.

5. The method of claim 1 wherein said barrier layer p type doping concentration decreases from said n type layer to said p type layer.

6. The method of claim 1 wherein each said quantum well layer has a quantum well layer thickness, and wherein said plurality of quantum well periods comprise quantum well layers of varying thickness.

7. The method of claim 6 wherein said quantum well layer thickness increases from said n type layer to said p type layer.

8. The method of claim 1 wherein each said barrier layer has a barrier layer thickness, and wherein said plurality of quantum well periods comprise barrier layers of varying thickness.

9. The method of claim 8 wherein said barrier layer thickness decreases from said n type layer to said p type layer.

10. The method of claim 1 wherein each said barrier layer has a barrier height, and wherein said plurality of quantum well periods comprise barrier layers of varying barrier height.

11. The method of claim 10 wherein said barrier height increases from said n type layer to said p type layer.

12. The method of claim 1 further comprising:

singulating said multiple quantum well semiconductor device to form a light emitting diode.

13. The method of claim 12 further comprising:

coupling said light emitting diode to electronics for converting alternating current to direct current suitable for use with said light emitting diode; and

coupling said electronics to a base configured for coupling to a source of said alternating current.

14. The method of claim 1 wherein said etching said stack of layers further comprises wet etching after nanoimprinting of said plurality of quantum well periods.

Assignments (6)
CHANGE OF NAME Recorded Nov 24, 2025
From: INVENSAS CORPORATION
To: INVENSAS LLC
Reel/Frame 073689/0754 →
CHANGE OF NAME Recorded Nov 24, 2025
From: INVENSAS LLC
To: ADEIA SEMICONDUCTOR TECHNOLOGIES LLC
Reel/Frame 073689/0786 →
RELEASE OF SECURITY INTEREST Recorded Jun 11, 2020
From: ROYAL BANK OF CANADA
To: TESSERA, INC.; INVENSAS BONDING TECHNOLOGIES, INC. (F/K/A ZIPTRONIX, INC.); FOTONATION CORPORATION (F/K/A DIGITALOPTICS CORPORATION AND F/K/A DIGITALOPTICS CORPORATION MEMS); INVENSAS CORPORATION; TESSERA ADVANCED TECHNOLOGIES, INC; DTS, INC.; DTS LLC; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
Reel/Frame 052920/0001 →
SECURITY INTEREST Recorded Jun 1, 2020
From: ROVI SOLUTIONS CORPORATION; ROVI TECHNOLOGIES CORPORATION; ROVI GUIDES, INC.; TIVO SOLUTIONS INC.; VEVEO, INC.; INVENSAS CORPORATION; INVENSAS BONDING TECHNOLOGIES, INC.; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: BANK OF AMERICA, N.A.
Reel/Frame 053468/0001 →
SECURITY INTEREST Recorded Dec 2, 2016
From: INVENSAS CORPORATION; TESSERA, INC.; TESSERA ADVANCED TECHNOLOGIES, INC.; ZIPTRONIX, INC.; DIGITALOPTICS CORPORATION; DIGITALOPTICS CORPORATION MEMS; DTS, LLC; DTS, INC.; PHORUS, INC.; IBIQUITY DIGITAL CORPORATION
To: ROYAL BANK OF CANADA, AS COLLATERAL AGENT
Reel/Frame 040797/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2015
From: WANG, LIANG; MOHAMMED, ILYAS; BEROZ, MASUD
To: INVENSAS CORPORATION
Reel/Frame 035280/0538 →