IP Library Granted Patent US 9,677,964
Granted Patent B2
US 9,677,964 · App. 14/634,805 · Granted Jun 13, 2017

Apparatus and method for automatic detection of diaphragm coating or surface contamination for capacitance diaphragm gauges

Inventors: David J. Ferran (Del Mar, CA); Robert J. Ferran (San Diego, CA)
Assignee: FERRAN TECHNOLOGY, INC.
G01L27/005G01L27/002G01L27/007G01L9/0072G01L21/00
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Quick Facts
Patent No.
US 9,677,964
App. No.
14/634,805
Granted
Jun 13, 2017
Kind
B2
Abstract

A system and a method detect contamination of a diaphragm in a capacitance diaphragm gauge wherein a contaminated diaphragm deflects less in the presence of pressure than an uncontaminated diaphragm. The system and method measure a base pressure. A DC voltage is applied between the diaphragm and a fixed electrode to cause the diaphragm to deflect to simulate an effective pressure. The system and method measure a combined pressure caused by the base pressure and the effective pressure. The system and method subtract the base pressure to determine the effective pressure caused by the static diaphragm deflection. If the measured effective pressure is less than an acceptable effective pressure, the system and method determine that the diaphragm is contaminated.

Claims (8)

1. A method for detecting contamination of the diaphragm of a capacitance diaphragm gauge (CDG) that includes a diaphragm and at least one fixed electrode wherein the capacitance between the diaphragm and the fixed electrode is responsive to a pressure applied to the CDG, the method comprising:

applying a first pressure to the CDG;

determining a first pressure value while the first pressure is applied to the CDG;

applying a DC voltage between the diaphragm and the at least one fixed electrode of the CDG to cause deflection of the diaphragm, the DC voltage applied while the first pressure is applied to the CDG;

determining a second pressure value while the DC voltage is applied between the diaphragm and the at least one fixed electrode of the CDG;

comparing the second pressure value with the first pressure value to determine a difference in pressure values resulting from the deflection caused by the applied DC voltage; and

determining that the diaphragm of the CDG is contaminated when the difference in pressure values is less than an acceptable difference in pressure values.

2. The method as defined in claim 1 , wherein the DC voltage applied between the diaphragm and the at least one fixed electrode of the CDG causes the diaphragm to deflect toward the at least one fixed electrode to increase the capacitance between the diaphragm and the at least one fixed electrode.

Assignments (5)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2020
From: FERRAN TECHNOLOGY, INC
To: SUMITOMO (SHI) CRYOGENICS OF AMERICA, INC.
Reel/Frame 051795/0875 →
SECURITY INTEREST Recorded Feb 1, 2016
From: FERRAN TECHNOLOGY, INC.
To: SUMITOMO (SHI) CRYOGENICS OF AMERICA, INC.
Reel/Frame 037630/0577 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 28, 2015
From: RENO SUB-SYSTEMS CANADA INCORPORATED; RENO SUB-SYSTEMS, INC.; RENO TECHNOLOGIES, INC
To: FERRAN TECHNOLOGY, INC.
Reel/Frame 036903/0826 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2015
From: FERRAN, DAVID J.; FERRAN, ROBERT J.
To: RENO SUB-SYSTEMS CANADA INCORPORATED
Reel/Frame 035059/0843 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 28, 2015
From: RENO SUB-SYSTEMS CANADA INCORPORATED
To: RENO TECHNOLOGIES, INC.
Reel/Frame 035059/0897 →
Continuity (3)
Division 14061726 · Oct 23, 2013
Provisional Application 61757922 · Jan 29, 2013
Related Publication 20150185105A1 · Jul 2, 2015