Multiplexer circuit
View Patent ↗A two-input multiplexer includes first, second, and third CMOS inverters, a transmission gate, and a tri-state inverter. The first CMOS inverter receives a select signal and outputs an inverted select signal. The second CMOS inverter receives a first input signal and outputs an inverted first input signal. The transmission gate receives the select signal, the inverted first input signal, and the inverted select signal, and outputs the inverted first input signal. The tri-state inverter receives the second input signal, the inverted select signal, and the select signal, and generates an inverted second input signal. The third CMOS inverter receives one of the inverted first and second input signals, and outputs one of the first and second input signals, respectively.
1. A two-input multiplexer circuit, comprising:
a first CMOS inverter having an input terminal for receiving a select signal and an output terminal for generating an inverted select signal;
a second CMOS inverter having an input terminal for receiving a first input signal and an output terminal for generating an inverted first input signal;
a transmission gate having a first input terminal for receiving the select signal, a second input terminal connected to the output terminal of the second CMOS inverter for receiving the inverted first input signal, a third input terminal connected to the output terminal of the first CMOS inverter for receiving the inverted select signal, and an output terminal for outputting the inverted first input signal;
a tri-state inverter having a first input terminal for receiving a second input signal, a second input terminal connected to the output terminal of the first CMOS inverter for receiving the inverted select signal, a third input terminal for receiving the select signal, and an output terminal for generating an inverted second input signal; and
a third CMOS inverter, having an input terminal connected to the output terminals of the transmission gate and the tri-state inverter for receiving at least one of the inverted first and second input signals, respectively, and an output terminal for outputting at least one of the first and second input signals.
2. The two-input multiplexer circuit of claim 1 , wherein the first CMOS inverter comprises:
a first transistor having a source terminal for receiving a supply voltage and a gate terminal for receiving the select signal; and
a second transistor having a gate terminal for receiving the select signal, a source terminal connected to ground, and a drain terminal connected to a drain terminal of the first transistor for generating the inverted select signal.
3. The two-input multiplexer circuit of claim 2 , wherein the second CMOS inverter comprises:
a third transistor having a source terminal for receiving the supply voltage and a gate terminal for receiving the first input signal; and
a fourth transistor having a gate terminal for receiving the first input signal, a source terminal connected to ground, and a drain terminal connected to a drain terminal of the third transistor for generating the inverted first input signal.
4. The two-input multiplexer circuit of claim 3 , wherein the transmission gate comprises:
a fifth transistor having a source terminal connected to the drain terminal of the third transistor for receiving the inverted first input signal and a gate terminal for receiving the select signal; and
a sixth transistor having a gate terminal connected to the drain terminal of the first transistor for receiving the inverted select signal, a source terminal connected to the drain terminal of the third transistor for receiving the inverted first input signal, and a drain terminal connected to a drain terminal of the fifth transistor for outputting the inverted first input signal.
5. The two-input multiplexer circuit of claim 4 , wherein the tri-state inverter comprises:
a seventh transistor having a source terminal for receiving the supply voltage and a gate terminal for receiving the second input signal;
an eighth transistor having a source terminal connected to a drain terminal of the seventh transistor and a gate terminal connected to the drain terminal of the first transistor for receiving the inverted select signal;
a ninth transistor having a gate terminal for receiving the select signal and a drain terminal connected to a drain terminal of the eighth transistor for generating the inverted second input signal; and
a tenth transistor having a drain terminal connected to a source terminal of the ninth transistor, a source terminal connected to ground, and a gate terminal for receiving the second input signal.
6. The two-input multiplexer circuit of claim 5 , wherein the third CMOS inverter comprises:
an eleventh transistor having a source terminal for receiving the supply voltage and a gate terminal connected to the drain terminals of the fifth and eighth transistors for receiving at least one of the inverted first and second input signals, respectively; and
a twelfth transistor having a gate terminal connected to the drain terminals of the fifth and eighth transistors for receiving at least one of the inverted first and second input signals, respectively, a source terminal connected to ground, and a drain terminal connected to a drain terminal of the eleventh transistor for outputting at least one of the first and second input signals.
7. The two-input multiplexer circuit of claim 6 , wherein the first, third, fifth, seventh, eighth, and eleventh are p-channel, metal-oxide semiconductor (PMOS) transistors.
8. The two-input multiplexer circuit of claim 7 , wherein the second, fourth, sixth, ninth, tenth, and twelfth are n-channel, metal-oxide semiconductor (NMOS) transistors.
9. The two-input multiplexer circuit of claim 6 , wherein the two-input multiplexer circuit is integrated into a testable integrated circuit (IC).
10. The two-input multiplexer circuit of claim 9 , wherein the input terminal of the first CMOS inverter receives the select signal from a logic, built-in, self-test (LBIST) controller of the testable IC, the input terminal of the second CMOS inverter receives the first input signal from a functional circuit of the testable IC, the first input terminal of the tri-state inverter receives the second input signal from a flip-flop of the testable IC, and the output terminal of the third CMOS inverter is connected to an on-chip module of the testable IC.
11. An integrated circuit, comprising:
a functional circuit for generating a functional signal;
a flip-flop for generating a scan signal;
a logic built-in self-test (LBIST) controller for generating a control signal;
a two-input multiplexer circuit, comprising:
a first CMOS inverter having an input terminal connected to the LBIST controller for receiving the control signal and an output terminal for generating an inverted control signal;
a second CMOS inverter having an input terminal connected to the functional circuit for receiving the functional signal and an output terminal for generating an inverted functional signal;
a transmission gate having a first input terminal connected to the LBIST controller for receiving the control signal, a second input terminal connected to the output terminal of the second CMOS inverter for receiving the inverted functional signal, a third input terminal connected to the output terminal of the first CMOS inverter for receiving the inverted control signal, and an output terminal for outputting the inverted functional signal;
a tri-state inverter having a first input terminal connected to the flip-flop for receiving the scan signal, a second input terminal connected to the output terminal of the first CMOS inverter for receiving the inverted control signal, a third input terminal connected to the LBIST controller for receiving the control signal, and an output terminal for generating an inverted scan signal; and
a third CMOS inverter, having an input terminal connected to the output terminals of the transmission gate and the tri-state inverter for receiving at least one of the inverted functional and scan signals, respectively, and an output terminal for outputting at least one of the functional and scan signals; and
an on-chip logic module, connected to the output terminal of the third CMOS inverter, for receiving at least one of the functional and scan signals, respectively.
12. The integrated circuit of claim 11 , wherein the first CMOS inverter comprises:
a first transistor having a source terminal for receiving a supply voltage and a gate terminal connected to the LBIST controller for receiving the control signal; and
a second transistor having a gate terminal connected to the LBIST controller for receiving the control signal, a source terminal connected to ground, and a drain terminal connected to a drain terminal of the first transistor for generating the inverted control signal.
13. The integrated circuit of claim 12 , wherein the second CMOS inverter comprises:
a third transistor having a source terminal for receiving the supply voltage and a gate terminal connected to the functional circuit for receiving the functional signal; and
a fourth transistor having a gate terminal connected to the functional circuit for receiving the functional signal, a source terminal connected to ground, and a drain terminal connected to a drain terminal of the third transistor for generating the inverted functional signal.
14. The integrated circuit of claim 13 , wherein the transmission gate comprises:
a fifth transistor having a source terminal connected to the drain terminal of the third transistor for receiving the inverted functional signal and a gate terminal connected to the LBIST controller for receiving the control signal; and
a sixth transistor having a gate terminal connected to the drain terminal of the first transistor for receiving the inverted control signal, a source terminal connected to the drain terminal of the third transistor for receiving the inverted functional signal, and a drain terminal connected to a drain terminal of the fifth transistor for outputting the inverted functional signal.
15. The integrated circuit of claim 14 , wherein the tri-state inverter comprises:
a seventh transistor having a source terminal for receiving the supply voltage and a gate terminal connected to the flip-flop for receiving the scan signal;
an eighth transistor having a source terminal connected to a drain terminal of the seventh transistor and a gate terminal connected to the drain terminal of the first transistor for receiving the inverted control signal;
a ninth transistor having a gate terminal connected to the LBIST controller for receiving the control signal and a drain terminal connected to a drain terminal of the eighth transistor for generating the inverted scan signal; and
a tenth transistor having a drain terminal connected to a source terminal of the ninth transistor, a source terminal connected to ground, and a gate terminal connected to the flip-flop for receiving the scan signal.
16. The integrated circuit of claim 15 , wherein the third CMOS inverter comprises:
an eleventh transistor having a source terminal for receiving the supply voltage and a gate terminal connected to the drain terminals of the fifth and eighth transistors for receiving at least one of the inverted functional and scan signals, respectively; and
a twelfth transistor having a gate terminal connected to the drain terminals of the fifth and eighth transistors for receiving at least one of the functional and scan signals, respectively, a source terminal connected to ground, and a drain terminal connected to a drain terminal of the eleventh transistor for outputting at least one of the functional and scan signals.
17. The integrated circuit of claim 16 , wherein the first, third, fifth, seventh, eighth, and eleventh are p-channel, metal-oxide semiconductor (PMOS) transistors.
18. The integrated circuit of claim 17 , wherein the second, fourth, sixth, ninth, tenth, and twelfth are n-channel, metal-oxide semiconductor (NMOS) transistors.