IP Library › Granted Patent US 9,501,194
Granted Patent B2
US 9,501,194 · App. 14/644,464 · Granted Nov 22, 2016

Clustered scan method of capacitive touch device

Inventors: Yi-Shiang Lu (Tainan, TW); Tsz-Hsuan Chao (Guishan Township, Taoyuan County, TW)
Assignee: ELAN MICROELECTRONICS CORPORATION
G06F3/044G06F3/0416
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Quick Facts
Patent No.
US 9,501,194
App. No.
14/644,464
Granted
Nov 22, 2016
Kind
B2
Abstract

A clustered scan method of a capacitive touch device is disclosed. According to the method, n drive lines of the capacitive touch device are divided into multiple clusters. Each of the clusters has a same number of drive lines. The clusters are driven by a clustered scan procedure in sequence. In each clustered scan procedure, the drive lines of the present cluster are driven for b times, wherein b is equal to the number of the drive lines of each cluster. If at least one bordering drive line exists, a bordering clustered scan procedure is executed, and a bordering drive line and some of drive lines of the previous clusters are driven.

Claims (22)

1. A clustered scan method of a capacitive touch device having n drive lines X 1 to Xn and a sense line, wherein the n drive lines are divided into C clusters and k bordering drive lines, each cluster has b driving lines, and C, b, and k are positive integers, and the clustered scan method comprising:

(s1) sequentially driving each of the C clusters to obtain sensed values of sense points crossed by the drive lines of the cluster and the sense line; wherein when driving each of the C clusters, b drive lines of the cluster are driven simultaneously; and

(s2) executing a scanning process for driving the bordering drive lines, wherein the scanning process comprises:

(a) simultaneously driving b drive lines including the n th drive line k times by using k combinations of driving signals to obtain sensed values A n , A n−1 , . . . , A n−k+1 of the sense line; and

(b) determining the sensed values of sense points crossed by the drive lines from the n th drive line to the (n−k+1) th drive line and the sense line according to the sensed values A n , A n−1 , . . . , A n−k+1 of the sense line;

wherein in the step (b), the sensed values of the sense points crossed by the drive lines from the n th drive line to the (n−k+1) th drive line and the sense line are obtained based on the sensed values of the sense points crossed by the drive lines from the (n−k) th drive line to the (n−b+1) th drive line and the sense line.

2. The clustered scan method as claimed in claim 1 , wherein the sensed values, A n , A n−1 , . . . , A n−k+1 in step (a) are represented by sensing equations respectively, and the clustered scan method further comprises:

predetermining whether the sensing equations corresponding to the k combinations of driving signals have no solutions, when the sensing simultaneous equations have no solutions, modifying the k combinations of the driving signals and then executing the step (a).

3. The clustered scan method as claimed in claim 2 , wherein in the step (b), the sensed values of the sense points crossed by the drive lines from the n th drive line to the (n−k+1) th drive line and the sense line are obtained based on the sensed values of the sense points crossed by the drive lines from the (n−k) th drive line to the (n−b+1) th drive line and the sense line.

4. The clustered scan method as claimed in claim 1 , wherein each of the combinations of the driving signals comprises b driving signals, and each driving signal is a positive driving signal, zero, or a negative driving signal.

5. The clustered scan method as claimed in claim 3 , wherein each of the combinations of the driving signals comprises b driving signals, and each driving signal is a positive driving signal, zero, or a negative driving signal.

6. The clustered scan method as claimed in claim 4 , wherein b is a positive integer between 3 and (n−1).

7. The clustered scan method as claimed in claim 5 , wherein b is a positive integer between 3 and (n−1).

8. The clustered scan method as claimed in claim 6 , wherein the sensed values A n , A n−1 , . . . , A n−k+1 , are digital values converted from analog values obtained by sensing the sensing line.

9. The clustered scan method as claimed in claim 7 , wherein the sensed values A n , A n−1 , . . . , A n−k+1 , are digital values converted from analog values obtained by sensing the sensing line.

10. The clustered scan method as claimed in claim 8 , wherein the driving signals for driving different drive lines have a same frequency.

11. The clustered scan method as claimed in claim 9 , wherein the driving signals for driving different drive lines have a same frequency.

12. The clustered scan method as claimed in claim 10 , wherein the different clusters respectively correspond to different drive lines.

13. The clustered scan method as claimed in claim 11 , wherein the different clusters respectively correspond to different drive lines.

14. The clustered scan method as claimed in claim 12 , wherein the positive signal and the negative signal are generated by phase shifting.

15. The clustered scan method as claimed in claim 13 , wherein the positive signal and the negative signal are generated by phase shifting.

16. The clustered scan method as claimed in claim 1 , wherein the k bordering drive lines are determined by whether a reminder k exists, and the reminder k is obtained by dividing n by b.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2015
From: LU, YI-SHIANG; CHAO, TSZ-HSUAN
To: ELAN MICROELECTRONICS CORPORATION
Reel/Frame 035137/0385 →
Priority Claims (1)
TW 103108780 A · Mar 12, 2014 · national
Continuity (1)
Related Publication 20150261353A1 · Sep 17, 2015