Crystal material, radiation detector, imaging apparatus, nondestructive inspection apparatus, and lighting apparatus
A crystal material represented by a general formula (1): (Gd 1-x-y-z La x ME y RE z ) 2 MM 2 O 7 (1), where ME is at least one selected from Y, Yb, Sc, and Lu; RE is Ce or Pr; MM is at least one selected from Si and Ge; and ranges of x, y, and z are represented by the following (i): (i) 0.0≦x+y+z<1.0, 0.05≦x+z<1.0, 0.0≦y<1.0, and 0.0001≦z<0.05 (where, when RE is Ce, y=0 is an exception).
1. A crystal material represented by a general formula (1):
(Gd 1-x-y-z La x ME y RE z ) 2 MM 2 O 7 (1)
where ME is at least one selected from Y, Sc, and Lu; RE is at least one selected from Ce or Pr; MM includes at least Si and Ge; and ranges of x, y, and z are represented by the following (i):
(i) 0.0≦x+y+z<1.0, 0.05≦x+z<1.0, 0.0≦y<1.0, and 0.0001≦z<0.05 (where, when RE is Ce, y=0 is an exception).
2. The crystal material according to claim 1 , wherein the ranges of x, y, and z are further represented by, in (i), 0.0≦x+y+z≦0.5, 0.07≦x+z≦0.6, 0.0≦y≦0.7, and 0.002≦z≦0.02 (where, when RE is Ce, y=0 is an exception).
3. The crystal material according to claim 1 , wherein the ranges of x, y, and z are further represented by, in (i), 0.10≦x+z≦0.47, 0.00≦y≦0.53, and 0.003≦z≦0.015 (where, when RE is Ce, y=0 is an exception).
4. The crystal material according to claim 1 , wherein the crystal material emits fluorescence through irradiation with high-energy photons or particles of 2 eV or more, with a certain fluorescent component contained in the fluorescence having a fluorescence lifetime of 1,000 nanoseconds or less and a peak fluorescence wavelength of 250 nm or more and 900 nm or less.
5. The crystal material according to claim 4 , wherein, with a light emission amount of the fluorescent component when an environmental temperature is 0° C. as a reference, a reduction rate of the light emission amount of the fluorescent component in an environmental temperature range of from room temperature to 150° C. from the reference is less than 20%.
6. The crystal material according to claim 1 , wherein the crystal material emits fluorescence through irradiation with high-energy photons or particles of 2 eV or more, with a certain fluorescent component contained in the fluorescence having a fluorescence lifetime of 80 nanoseconds or less and a peak fluorescence wavelength of 300 nm or more and 700 nm or less.
7. The crystal material according to claim 1 , wherein the crystal material emits fluorescence through irradiation with high-energy photons or particles of 2 eV or more, with a certain fluorescent component contained in the fluorescence having a fluorescence lifetime of 60 nanoseconds or less and a peak fluorescence wavelength of 320 nm or more and 700 nm or less.
8. A radiation detector comprising:
a scintillator that comprises the crystal material according to claim 1 ; and
a photodetector that receives fluorescence from the scintillator.
9. An imaging apparatus comprising the radiation detector according to claim 8 .
10. A nondestructive inspection apparatus comprising the radiation detector according to claim 8 .
11. A radiation detector comprising:
a scintillator that comprises the crystal material according to claim 1 ;
a wavelength conversion element that receives fluorescence from the scintillator and converts wavelengths of light with wavelengths of from 260 nm to 350 nm contained in the fluorescence into any wavelength within a range of from 320 nm to 700 nm; and
a photodetector that receives light wavelength-converted by the wavelength conversion element.
12. A radiation detector comprising:
a scintillator that comprises the crystal material according to claim 1 ; and
a photodetector that operates at an environmental temperature of room temperature or more and 200° C. or less and receives fluorescence from the scintillator.
13. A lighting apparatus comprising a light-emitting body that comprises the crystal material according to claim 1 .