IP Library Granted Patent US 9,673,192
Granted Patent B1
US 9,673,192 · App. 14/671,959 · Granted Jun 6, 2017

Semiconductor device including a resistor metallic layer and method of forming the same

Inventors: Douglas Dean Lopata (Boyertown, NJ); Jeffrey Demski (Orefield, PA); Jay Norton (Wind Gap, PA); Miguel Rojas-Gonzales (Bedminster, NJ)
Assignee: Altera Corporation
H01L27/0629H01L23/481H01L28/20H02M3/158
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Quick Facts
Patent No.
US 9,673,192
App. No.
14/671,959
Granted
Jun 6, 2017
Kind
B1
Abstract

A semiconductor device including a resistor metallic layer and method forming the same. In one embodiment, the semiconductor device includes a source region and a drain region of a power switch on a substrate. The semiconductor device also includes the resistor metallic layer over the source region and the drain region of the power switch. The resistor metallic layer includes a current sense resistor including a first current sense resistor metallic strip coupled between a first cross member and a second cross member, and a first gain resistor including a first gain resistor metallic strip coupled to the first cross member. The semiconductor device also includes an amplifier over the substrate and coupled to the first gain resistor metallic strip.

Claims (34)

1. A semiconductor device, comprising:

a source region and a drain region of a power switch on a substrate;

a resistor metallic layer over said source region and said drain region of said power switch, comprising:

a current sense resistor including a first current sense resistor metallic strip coupled between a first cross member and a second cross member, and

a first gain resistor including a first gain resistor metallic strip coupled to said first cross member; and

an amplifier over said substrate and coupled to said first gain resistor metallic strip.

2. The semiconductor device as recited in claim 1 wherein said first gain resistor metallic strip comprises a first serpentine metallic pattern.

3. The semiconductor device as recited in claim 1 further comprising a second gain resistor including a second gain resistor metallic strip coupled to said second cross member.

4. The semiconductor device as recited in claim 3 wherein said amplifier is coupled to said second gain resistor metallic strip.

5. The semiconductor device as recited in claim 3 wherein said first gain resistor metallic strip comprises a first serpentine metallic pattern and said second gain resistor metallic strip comprises a second serpentine metallic pattern.

6. The semiconductor device as recited in claim 1 wherein said amplifier is located at a periphery of said semiconductor device.

7. The semiconductor device as recited in claim 1 further comprising a source metallic strip between said source region and said resistor metallic layer, said first current sense resistor metallic strip being coupled to said source region through said source metallic strip.

8. The semiconductor device as recited in claim 7 further comprising an insulating layer between said source metallic strip and said resistor metallic layer, said first current sense resistor metallic strip being coupled to said source metallic strip by a via through said insulating layer.

9. The semiconductor device as recited in claim 1 wherein said resistor metallic layer includes a second current sense resistor metallic strip coupled between said first cross member and said second cross member.

10. The semiconductor device as recited in claim 9 wherein said second current sense resistor metallic strip contributes to a resistance value of said current sense resistor.

11. A semiconductor device, comprising:

a first source region and a first drain region of a first power switch on a substrate;

a second source region and a second drain region of a second power switch on said substrate;

a resistor metallic layer over said first source region and said first drain region of said first power switch and over said second source region and said second drain region of said second power switch, said resistor metallic layer comprising:

a first current sense resistor including a first current sense resistor metallic strip coupled between a first cross member and a second cross member,

a first gain resistor including a first gain resistor metallic strip coupled to said first cross member,

a second current sense resistor including a second current resistor metallic strip coupled between a third cross member and a fourth cross member, and

a second gain resistor including a second gain resistor metallic strip coupled to said third cross member;

a first amplifier over said substrate and coupled to said first gain resistor metallic strip; and

a second amplifier over said substrate and coupled to said second gain resistor metallic strip.

12. The semiconductor device as recited in claim 11 wherein said first gain resistor metallic strip comprises a first serpentine metallic pattern.

13. The semiconductor device as recited in claim 11 wherein said resistor metallic layer further comprises a third gain resistor including a third gain resistor metallic strip coupled to said second cross member.

14. The semiconductor device as recited in claim 13 wherein said first amplifier is coupled to said third gain resistor metallic strip.

15. The semiconductor device as recited in claim 13 wherein said first gain resistor metallic strip comprises a first serpentine metallic pattern and said third gain resistor metallic strip comprises a second serpentine metallic pattern.

16. The semiconductor device as recited in claim 11 wherein said first and second amplifiers are located at a periphery of said semiconductor device.

17. The semiconductor device as recited in claim 11 further comprising a first source metallic strip between said first source region and said resistor metallic layer and a second source metallic strip between said second source region and said resistor metallic layer, said first current sense resistor metallic strip being coupled to said first source region through said first source metallic strip and said second current sense resistor metallic strip being coupled to said second source region through said second source metallic strip.

18. The semiconductor device as recited in claim 17 further comprising an insulating layer between said first and second source metallic strips and said resistor metallic layer, said first current sense resistor metallic strip being coupled to said first source metallic strip by a via through said insulating layer and said second current sense resistor metallic strip being coupled to said second source metallic strip by another via through said insulating layer.

19. The semiconductor device as recited in claim 11 wherein said resistor metallic layer includes a third current sense resistor metallic strip coupled between said first cross member and said second cross member.

20. The semiconductor device as recited in claim 19 wherein said third current sense resistor metallic strip contributes to a resistance value of said first current sense resistor.

Assignments (2)
SECURITY INTEREST Recorded Sep 12, 2025
From: ALTERA CORPORATION
To: BARCLAYS BANK PLC, AS COLLATERAL AGENT
Reel/Frame 073431/0309 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 13, 2015
From: LOPATA, DOUGLAS DEAN; DEMSKI, JEFFREY; NORTON, JAY; ROJAS-GONZALEZ, MIGUEL
To: ALTERA CORPORATION
Reel/Frame 035395/0848 →
Continuity (3)
Continuation In Part 14227666 · Mar 27, 2014
Continuation In Part 14091739 · Nov 27, 2013
Provisional Application 61971719 · Mar 28, 2014