Systems and methods for CMOS-integrated junction field effect transistors for dense and low-noise bioelectronic platforms

1. An integrated junction field effect transistor formed as a complementary metal oxide semiconductor, comprising:

a substrate layer of a first dopant type;

an isolation well of a second dopant type disposed above the substrate;

a first gate layer of the first dopant type disposed above the isolation well;

a depletion channel of the second dopant type disposed above the first gate layer;

a second gate layer of the first dopant type disposed on the depletion channel and proximate a surface of the transistor, the second gate layer separating the depletion channel from the surface, and the depletion channel separating the first gate layer from the second gate layer; and

a drain contact and a source contact, each disposed proximate the surface and in electrical communication with the depletion channel, wherein each of the source and drain contacts are disposed proximate and abut a layer formed between the second gate layer and each of the source and drain contacts and configured to reduce flicker noise.

2. The transistor as claimed in claim 1 , wherein the isolation well of the second dopant type is disposed between and separating the substrate layer and the first gate layer.

3. The transistor as claimed in claim 1 , further including shallow trench isolation between the second gate layer and each of the source and drain contacts.

4. The transistor as claimed in claim 1 , wherein the first dopant type is P-type and the second dopant type is N-type.

5. The transistor as claimed in claim 1 , wherein the first dopant type is N-type and the second open type is P-type.

6. A plurality of transistors as claimed in claim 1 , configured as an array.

7. A method of making a junction field effect transistor using a complementary metal oxide semiconductor (CMOS) process, comprising:

providing a substrate layer of a first dopant type;

forming an isolation well of the second dopant type above the substrate;

forming a first gate layer of the first dopant type above the isolation well;

forming a depletion channel of the second dopant type above the first gate layer;

forming a second gate layer of the first dopant type above the depletion channel and proximate a surface of the transistor, the second gate layer separating the depletion channel from the surface, and the depletion channel separating the first gate layer from the second gate layer;

forming a drain contact and a source contact, each disposed proximate the surface and in electrical communication with the depletion channel; and

forming a low doping layer between the second gate layer and each of the source and drain contacts, wherein the low doping layer is disposed proximate and abuts each of the source and drain contacts and is configured to reduce flicker noise.

8. A method of making the transistor as claimed in claim 7 , wherein an isolation well of the second dopant type is disposed between and separating the substrate layer and the first gate layer.

9. A method of making the transistor as claimed in claim 7 , wherein the transistor is formed using a 180 nm process.

10. A method of making the transistor as claimed in claim 7 , wherein the first dopant type is P-type and the second dopant type is N-type.

11. A method of making the transistor as claimed in claim 7 , wherein the first dopant type is N-type and the second open type is P-type.

12. A method of making the plurality of transistors as claimed in claim 7 , configured as an array.

13. The transistor of claim 1 , wherein the low doping layer comprises polysilicon.

14. The transistor of claim 1 , wherein the low doping layer comprises an ohmic contact pattern (OP) mask.