Verification of photonic integrated circuits
Techniques and mechanisms for the use of layout-versus-schematic (LVS) design tools to validate photonic integrated circuit designs. Various implementations employ alternate analysis techniques with LVS analysis tools to perform one or more LVS analysis processes on photonic integrated circuits. These analysis processes may include curvilinear design validation and the associated flow implementations.
1. A method comprising:
by a computing device:
receiving layout data for a layout design of a photonic integrated circuit comprising one or more optical components;
extracting at least one extracted curvilinear parameter of a curved shape of a first one of the optical components, using a coordinate-based method comprising performing an interpolation, a parameterization, or both an interpolation and a parameterization of the curved shape;
comparing the at least one extracted curvilinear parameter to a rule-based curvilinear parameter generated by performing rule-based curvilinear parameter extraction; and
responsive to the comparing, validating the layout design of the photonic integrated circuit.
2. The method of claim 1 , wherein the validating comprises performing a layout-versus-schematic (LVS) comparison.
3. The method of claim 1 , wherein the coordinate-based method comprises performing spline interpolation.
4. The method of claim 1 , wherein the coordinate-based method comprises performing parameterization by evaluating respective osculating circles for successive groups of three points along the curved shape and determining a local curvature from each evaluated osculating circle.
5. The method of claim 1 , wherein the curved shape has a non-uniform width or a non-circular curvature.
6. The method of claim 1 , wherein the curved shape forms a portion of a ring resonator, a directional coupler, a grating coupler, a Y-splitter, or a Mach-Zehnder interferometer.
7. The method of claim 1 , wherein the at least one extracted parameter comprises a radius of curvature.
8. The method of claim 1 , further comprising:
receiving device data for the photonic integrated circuit layout design;
wherein receiving device data comprises reading text labels from the layout data to identify photonic structures.
9. The method of claim 1 , wherein the extracting or the comparing are based in part on device data or connectivity data for the photonic integrated circuit layout design.
10. The method of claim 1 , further comprising:
generating the rule-based parameter by performing rule-based extraction of at least one curvilinear property of the curved shape in the layout data.
11. The method of claim 10 , wherein the at least one curvilinear property comprises a central path length, and the rule-based extraction comprises dividing an area of the curved shape by a width of the curved shape.
12. The method of claim 10 , wherein the at least one curvilinear property comprises a radius of curvature, and the rule-based extraction comprises evaluating an arc length and a chord length of the curved shape.
13. At least one computer-readable storage device storing computer-readable instructions that when executed by a computer, cause the computer to perform a method, the instructions comprising:
instructions that cause the computer to receive layout data for a layout design of a photonic integrated circuit comprising one or more optical components;
instructions that cause the computer to extract at least one extracted curvilinear parameter of a curved shape of a first one of the optical components using a coordinate-based method comprising performing a parameterization of the curved shape by evaluating respective osculating circles for successive groups of three points along the curved shape and determining a local curvature from each evaluated osculating circle;
instructions that cause the computer to determine a minimum radius of curvature from the determined local curvatures;
instructions that cause the computer to compare the at least one extracted curvilinear parameter to a rule-based curvilinear parameter generated by performing rule-based curvilinear parameter extraction for the first one of the optical components and comparing the determined minimum radius of curvature with one or more specified reference values; and
instructions that cause the computer to, responsive to the compare, validate the layout design of the photonic integrated circuit.
14. The at least one computer-readable storage device of claim 13 , wherein the instructions that cause the computer to validate the layout design comprise instructions to perform a layout-versus-schematic (LVS) comparison.
15. The at least one computer-readable storage device of claim 13 , wherein the curved shape has a non-uniform width or a non-circular curvature.
16. The at least one computer-readable storage device of claim 13 , wherein the curved shape forms a portion of a ring resonator, a directional coupler, a grating coupler, a Y-splitter, or a Mach-Zehnder interferometer.
17. The at least one computer-readable storage device of claim 13 , wherein the instructions that cause the computer to receive the layout data further comprise instructions that cause the computer to receive device data for layout design of the photonic integrated circuit, including instructions that cause the computer to read text labels from the layout data to identify photonic structures.
18. The at least one computer-readable storage device of claim 13 , further comprising instructions that cause the computer to generate the rule-based parameter by performing rule-based extraction of at least one curvilinear property of the curved shape in the layout data.
19. One or more computer-readable storage devices storing computer-readable instructions which, when executed by a processor, cause the processor to perform a method, the instructions comprising:
instructions that cause the processor to receive layout data for a layout design of a photonic integrated circuit comprising one or more optical components;
instructions that cause the processor to extract at least one extracted curvilinear parameter of a curved shape of a first one of the optical components, using a coordinate-based method comprising performing an interpolation, a parameterization, or both an interpolation and a parameterization of the curved shape;
instructions that cause the processor to compare the at least one extracted curvilinear parameter to a rule-based curvilinear parameter generated by performing rule-based curvilinear parameter extraction; and
instructions that cause the processor to, responsive to the comparing, validate the layout design of the photonic integrated circuit.
20. The one or more computer-readable storage devices of claim 19 , wherein the instructions that cause the processor to validate the layout design comprise instructions that cause the processor to perform a layout-versus-schematic (LVS) comparison.
21. The one or more computer-readable storage devices of claim 19 , wherein the coordinate-based method comprises performing spline interpolation.
22. The one or more computer-readable storage devices of claim 19 , wherein the coordinate-based method comprises performing parameterization by evaluating respective osculating circles for successive groups of three points along the curved shape and determining a local curvature from each evaluated osculating circle.
23. The one or more computer-readable storage devices of claim 19 , wherein the curved shape has a non-uniform width or a non-circular curvature.
24. The one or more computer-readable storage devices of claim 19 , wherein the curved shape forms a portion of a ring resonator, a directional coupler, a grating coupler, a Y-splitter, or a Mach-Zehnder interferometer.
25. The one or more computer-readable storage devices of claim 19 , wherein the computer-readable instructions further comprise:
instructions that cause the processor to receive device data for the photonic integrated circuit layout design;
wherein receiving device data comprises reading text labels from the layout data to identify photonic structures.
26. The one or more computer-readable storage devices of claim 19 , wherein the extracting or the comparing are based in part on device data or connectivity data for the photonic integrated circuit layout design.
27. The one or more computer-readable storage devices of claim 19 , wherein the computer-readable instructions further comprise:
instructions that cause the processor to generate the rule-based parameter by performing rule-based extraction of at least one curvilinear property of the curved shape in the layout data.