One quarter wavelength transmission line based electrostatic discharge (ESD) protection for integrated circuits
View Patent ↗Device and a method of forming an integrated circuit (IC) that offers protection against ESD in RE applications is disclosed. The device includes a transmission line (TL) coupled to a signal pad. The TL is a short circuited stub that is configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter. The TL is configured to pass through a signal in response to a frequency of the signal being within an allowable range of frequencies of the band pass filter. The TL functioning as an ESD protection device is configured to shunt the signal in response to the frequency being outside the allowable range. The IC may include an array of control switches that are operable to change an electrical length L of the TL. The center frequency is tunable by controlling the electrical length L.
1. A device comprising:
a signal pad; and
a transmission line (TL) coupled to the signal pad, wherein the TL is a short circuited stub having a variable electrical length L controlled by operation of an array of control switches, the TL being configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter.
2. The device of claim 1 , wherein the TL is configured to pass through a signal in response to a frequency of the signal being within an allowable range of frequencies of the band pass filter, wherein the ESD protection device is configured to shunt the signal in response to the frequency being outside the allowable range.
3. The device of claim 1 , wherein the TL is fabricated as coplanar waveguide on an integrated circuit chip.
4. The device of claim 2 , wherein the electrical length L is configured to be exactly equal to one quarter of a wavelength of the signal, the wavelength corresponding to an operating frequency of the TL.
5. The device of claim 2 ,
wherein the center frequency is tunable by controlling the electrical length L, the change in the electrical length L causing a corresponding change in the center frequency.
6. The device of claim 5 , wherein the array of control switches are disposed within a configurable distance of an end of the short circuited stub.
7. The device of claim 5 , wherein the array of control switches are operable to change the electrical length L to one of the electrical length L, L+ΔL, and L−ΔL.
8. The device of claim 2 , wherein a pair of control switches selected from the array of control switches are asserted to generate a new short circuited path for the signal, the new short circuit path changing the electrical length L.
9. The device of claim 1 , wherein the band pass filter is configured to operate in a RF band of frequencies.
10. A device comprising:
a coplanar waveguide configured as a short circuited stub tuned to resonate at a center frequency, wherein the coplanar waveguide includes
a top metal layer having a center signal trace equally separated from a pair of ground traces by a configurable gap, the pair of ground traces being disposed on either side of the center signal trace,
a base metal layer to provide a shield to the coplanar waveguide,
an end metal layer coupled to the center signal trace, the pair of ground traces and the base metal layer to provide the short circuited stub; and
an array of control switches operable to dynamically vary an electrical length L of the coplanar waveguide, wherein a change in the electrical length L causes a corresponding change in the center frequency.
11. The device of claim 10 , wherein the coplanar waveguide is configured to have a rectangular cross section.
12. The device of claim 10 , wherein the coplanar waveguide is configured as an ESD protection device and as a band pass filter in dependence of the center frequency.
13. The device of claim 10 , wherein the array of control switches are operable to change the electrical length to one of the electrical length L, L+ΔL, and L−ΔL.
14. The device of claim 10 , wherein the configurable gap is approximately equal to 3 times a width of the center signal trace.
15. The device of claim 10 , wherein the coplanar waveguide and the array of control switches are fabricated on an integrated circuit chip.
16. A device comprising:
a signal pad;
a transmission line (TL) coupled to the signal pad, wherein the TL is configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter; and
an array of control switches configured to vary an electrical length of the TL, wherein a change in the electrical length causes a corresponding change in the center frequency.
17. The device of claim 16 , wherein the TL is configured as a short circuited stub having the electrical length exactly equal to one quarter of a wavelength corresponding to the center frequency.
18. A method comprising:
configuring a TL as a short circuited stub, the TL being configured as an ESD protection device and as a band pass filter in dependence of a center frequency of the band pass filter; and
tuning the center frequency by changing an electrical length L of the TL, wherein the electrical length L is changed by controlling an array of control switches.
19. The method of claim 18 , wherein the controlling comprises asserting the array of control switches to generate a new short circuited path having a length different than the electrical length L.
20. The method of claim 18 , wherein TL is fabricated as coplanar waveguide on an integrated circuit chip.