Evaluating image values
Images of items are evaluated. A first image of the item, having a view of two or more of its surfaces, is captured at a first time. A measurement of at least one dimension of one or more of the surfaces is computed and stored. A second image of the item, having a view of at least one of the two or more surfaces, is captured at a second time, subsequent to the first time. A measurement of the dimension is then computed and compared to the stored first measurement. The computed measurement is evaluated based on the comparison.
1. A method for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the method comprising the steps of:
capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface feature;
computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image;
capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features;
computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image;
comparing the computed second measurement to the computed first measurement;
evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements;
capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces;
computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image;
comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement;
approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and
computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.
2. The method as described in claim 1 , wherein the evaluating step comprises, selectively, accepting or rejecting the computed first measurement and/or the computed second measurement.
3. The method as described in claim 1 , wherein the evaluating step comprises, selectively, accepting or rejecting the computed first measurement and/or the computed second measurement.
4. The method as described in claim 1 , wherein the at least one dimension corresponds to at least one boundary about a periphery of at least one of the surface features item.
5. The method as described in claim 1 , wherein the one or more surface features relate to a corresponding chromatic characteristic.
6. The method as described in claim 1 , wherein the one or more surface features comprise at least one of a logo or a bar code pattern.
7. The method as described in claim 1 , wherein the one or more surface features relate to at least one of a text based, alphanumeric, ideographic, or pictographic symbol.
8. The method as described in claim 7 , wherein the symbol comprises at least one of handwritten or preprinted writing.
9. The method as described in claim 1 , wherein the comparing step comprises computing a duration of an interval between the second time and the first time.
10. The method as described in claim 9 , wherein the evaluating step comprises establishing an identity between a representation of the item in the second image with a representation of the item in the first image.
11. The method as described in claim 1 , further comprising the steps of:
delineating a boundary about a periphery of the one or more surface features in the first captured image;
mapping the delineated boundary to corresponding locations in a coordinate system;
storing data corresponding to the mapped boundary;
recognizing the surface feature in the captured second image;
surveying data corresponding to the boundary in relation to the recognized surface feature;
comparing the surveyed boundary data to the stored boundary data; and
basing the evaluating step, at least in part, on the step of comparing the surveyed boundary data to the stored boundary data.
12. The method as described in claim 1 , further comprising the step of:
correcting the computed first measurement and/or the computed second measurement based on the computed mean value.
13. The method as described in claim 1 , wherein the two or more surfaces of the item comprise at least three surfaces.
14. The method as described in claim 1 , wherein the capturing the first image step comprises recording the view of the two or more surfaces of the item from a perspective associated with a first position of the item.
15. The method as described in claim 14 , wherein the capturing the second image step comprises recording the view of the at least one of the two or more surfaces from a perspective associated with a second position of the item, which is displaced relative to the first position.
16. The method as described in claim 1 , further comprising certifying, based on the evaluating step, a charge for a commercial transaction relating to one or more of storing or transporting the item.
17. The method as described in claim 1 , further comprising certifying, based on the evaluating step, a dimensioner for a commercial use.
18. A non-transitory computer readable storage medium comprising instructions, which when read and executed by a computer processor are operable for performing, controlling, or causing a process for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the process comprising:
capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface feature;
computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image;
capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features;
computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image;
comparing the computed second measurement to the computed first measurement; evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements;
capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces;
computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image;
comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement;
approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and
computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.
19. A computer system, comprising: a bus component;
a processor component coupled to the bus component and operable for processing data; a non-transitory storage component coupled to the bus component and comprising instructions, which when read and executed by the processor component are operable for performing, controlling or causing a process for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the process comprising:
capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface features;
computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image;
capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features;
computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image;
comparing the computed second measurement to the computed first measurement;
evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements;
capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces;
computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image;
comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement;
approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and
computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.