IP Library Granted Patent US 9,190,572
Granted Patent B2
US 9,190,572 · App. 14/718,026 · Granted Nov 17, 2015

Light emitting diode and fabrication method thereof

Inventors: Lingfeng Yin (Xiamen, CN); Suhui Lin (Xiamen, CN); Jiansen Zheng (Xiamen, CN); Lingyuan Hong (Xiamen, CN); Chuangui Liu (Xiamen, CN); Yide Ou (Xiamen, CN); Gong Chen (Xiamen, CN)
Assignee: Xiamen Sanan Optoelectronics Technology Co., Ltd.
H01L33/42C23C14/024C23C14/35C23C14/58H01L33/005H01L33/38H01L2933/0016H01L2933/0025H01L2933/0066
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Quick Facts
Patent No.
US 9,190,572
App. No.
14/718,026
Granted
Nov 17, 2015
Kind
B2
Abstract

A light emitting diode includes: a substrate; a light-emitting epitaxial layer, from bottom to up, laminated by semiconductor material layers of a first confinement layer, a light-emitting layer and a second confinement layer over the substrate; a current blocking layer over partial region of the light-emitting epitaxial layer; a transparent conducting structure over the current blocking layer that extends to the light-emitting epitaxial layer surface and is divided into a light-emitting region and a non-light-emitting region, in which, the non-light-emitting region corresponds to the current blocking layer with thickness larger than that of the light-emitting region, thus forming a good ohmic contact between this structure and the light-emitting epitaxial layer and reducing light absorption; and a P electrode over the non-light-emitting region of the transparent conducting structure, which guarantees current spreading performance and reduces working voltage and light absorption.

Claims (23)

1. A light emitting diode comprising: a substrate; a light-emitting epitaxial layer from bottom to up including semiconductor material layers of a first confinement layer, a light-emitting layer, and a second confinement layer over the substrate; a current blocking layer over a portion of the light-emitting epitaxial layer; a transparent conducting structure over the current blocking layer that extends to the light-emitting epitaxial layer surface and includes a light-emitting region and a non-light-emitting region, in which, the non-light-emitting region corresponds to the current blocking layer with a thickness larger than that of the light-emitting region, thereby ensuring current spreading performance and reducing working voltage and light absorption; and a P electrode over the non-light-emitting region of the transparent conducting structure,

wherein the transparent conducting structure comprises: a first transparent conducting layer, with a pattern corresponding to that of the current blocking layer, formed over the current blocking layer; and a second transparent conducting layer that clads over the first transparent conducting layer and the current blocking layer and extends to the light-emitting epitaxial layer surface, in which, a lower surface area of the second transparent conducting layer is larger than an upper surface area of the current blocking layer.

2. The light emitting diode of claim 1 , wherein a contact surface between the second transparent conducting layer and the P electrode is a rough surface.

3. The light emitting diode of claim 1 , wherein the first transparent conducting layer is about 300-5000 Å thick.

4. The light emitting diode of claim 1 , wherein the second transparent conducting layer is about 300-5000 Å thick.

5. A method of fabricating a light emitting diode, comprising:

1) providing a substrate, over which, forming a light-emitting epitaxial layer through epitaxial growth, deposited with a first confinement layer, a light-emitting layer, and a second confinement layer from bottom to up;

2) forming a current blocking layer over a portion of the light-emitting epitaxial layer;

3) fabricating a transparent conducting structure over the current blocking layer and extending to the light-emitting epitaxial layer surface, in which, a non-light-emitting region corresponds to the current blocking layer and a light-emitting region is in direct contact with the light-emitting epitaxial layer, and a thickness of the non-light-emitting region is larger than that of the light-emitting region, thereby ensuring current spreading performance and reducing working voltage and light absorption; and

4) fabricating a P electrode over the non-light-emitting region of the transparent conducting structure,

wherein Step 3) comprises:

forming a first transparent conducting layer over the current blocking layer;

forming a second transparent conducting layer over the first transparent conducting layer and extending to the light-emitting epitaxial layer surface,

thereby forming a transparent conducting structure, in which, the non-light-emitting region comprises a first and a second transparent conducting layer and the light-emitting region does not comprise the first transparent conducting layer.

6. The method of claim 5 , wherein the first transparent conducting layer is formed with evaporating deposition, and the second transparent conducting layer is formed with magnetron sputtering, thereby forming a rough structure at the contact surface between the second transparent conducting layer and the P electrode.

7. The method of claim 5 , wherein the first transparent conducting layer is formed with magnetron sputtering, and the second transparent conducting layer is formed with evaporating deposition, thereby forming a rough structure at the contact surface between the second transparent conducting layer and the P electrode.

8. The method of claim 5 , wherein the first transparent conducting layer is about 300-5000 Å thick.

9. The method of claim 5 , wherein the second transparent conducting layer is about 300-5000 Å thick.

10. A light-emitting system comprising a plurality of light-emitting diode, each light-emitting diode including: a substrate; a light-emitting epitaxial layer from bottom to up including semiconductor material layers of a first confinement layer, a light-emitting layer, and a second confinement layer over the substrate; a current blocking layer over a portion of the light-emitting epitaxial layer; a transparent conducting structure over the current blocking layer that extends to the light-emitting epitaxial layer surface and includes a light-emitting region and a non-light-emitting region, in which, the non-light-emitting region corresponds to the current blocking layer with a thickness larger than that of the light-emitting region, thereby ensuring current spreading performance and reducing working voltage and light absorption; and a P electrode over the non-light-emitting region of the transparent conducting structure,

wherein the transparent conducting structure comprises: a first transparent conducting layer, with a pattern corresponding to that of the current blocking layer, formed over the current blocking layer; and a second transparent conducting layer that clads over the first transparent conducting layer and the current blocking layer and extends to the light-emitting epitaxial layer surface, in which, a lower surface area of the second transparent conducting layer is larger than an upper surface area of the current blocking layer.

11. The system of claim 10 , wherein a contact surface between the second transparent conducting layer and the P electrode is a rough surface.

12. The system of claim 10 , wherein the first transparent conducting layer is about 300-5000 Å thick.

13. The system of claim 10 , wherein the second transparent conducting layer is about 300-5000 Å thick.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 20, 2023
From: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.
To: QUANZHOU SANAN SEMICONDUCTOR TECHNOLOGY CO., LTD.
Reel/Frame 065302/0223 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 20, 2015
From: YIN, LINGFENG; LIN, SUHUI; ZHENG, JIANSEN; HONG, LINGYUAN; LIU, CHUANGUI; OU, YIDE; CHEN, GONG
To: XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD
Reel/Frame 035685/0105 →
Priority Claims (1)
CN 2012 1 0558990 · Dec 21, 2012 · national
Continuity (2)
Continuation PCTCN2013088280 · Dec 2, 2013
Related Publication 20150255682A1 · Sep 10, 2015