IP Library Granted Patent US 10,008,447
Granted Patent B2
US 10,008,447 · App. 14/718,168 · Granted Jun 26, 2018

Solar cell powered integrated circuit device and method therefor

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Quick Facts
Patent No.
US 10,008,447
App. No.
14/718,168
Granted
Jun 26, 2018
Kind
B2
Abstract

A semiconductor device includes a circuitry die and a solar cell die. The circuitry die includes a plurality of interconnect layers on a front side of the circuitry die, a metallization layer on a back side of the circuitry die, and at least one TSV (through substrate via) that makes an electrical connection between a last metal interconnect layer on the front side of the circuitry die and the metallization layer on the back side of the circuitry die. The solar cell die is configured to power the circuitry die. The solar cell die includes a transparent contact on a front side of the solar cell die. A back side of the solar cell die is attached to the back side of the circuitry die and makes electrical contact with the metallization layer on the back side of the circuitry die.

Claims (60)

1. A semiconductor device comprising:

a circuitry die comprising:

a plurality of interconnect layers on a front side of the circuitry die,

a metallization layer on a back side of the circuitry die, and

at least one TSV (through silicon via) filled with a metal plug that contacts and extends from a portion of a last metal interconnect layer on the front side of the circuitry die to the metallization layer on the back side of the circuitry die, wherein

the at least one TSV is surrounded by a non-conductive liner that insulates the TSV from the plurality of interconnect layers except the last metal interconnect layer; and

a solar cell die configured to power the circuitry die, the solar cell die comprising:

a transparent contact on a front side of the solar cell die, wherein

a back side of the solar cell die is attached to the back side of the circuitry die and makes electrical contact with the metallization layer on the back side of the circuitry die.

2. The semiconductor device of claim 1 , further comprising:

wiring external to the circuitry die between the transparent contact of the solar cell die and a contact on the front side of the circuitry die.

3. The semiconductor device of claim 1 , further comprising:

at least one power TSV filled with a metal plug that contacts and extends from another portion of the last metal interconnect layer on the front side of the circuitry die to the transparent contact on the front side of the solar cell die.

4. The semiconductor device of claim 1 , further comprising:

a package having a window, wherein

the circuitry die is attached to an interior surface of the package, and

the solar cell die is exposed to light through the window.

5. The semiconductor device of claim 4 , wherein

the package has a surface area smaller than one square centimeter.

6. The semiconductor device of claim 1 , wherein

the at least one TSV makes electrical contact with at least one of the plurality of interconnect layers.

7. The semiconductor device of claim 1 , wherein

the circuitry die is less than 100 microns thick.

8. The semiconductor device of claim 1 , wherein

the circuitry die further comprises an energy storage capacitor.

9. The semiconductor device of claim 1 , wherein

the circuitry die further comprises antenna circuitry.

10. The semiconductor device of claim 1 , wherein

the circuitry die further comprises data collection circuitry.

11. The semiconductor device of claim 1 , wherein

the circuitry die further comprises external connections configured to be connected to external data collection circuitry.

12. The semiconductor device of claim 1 , wherein

the solar cell die comprises at least one of a group including crystalline silicon solar cells, monocrystalline silicon solar cells, amorphous silicon solar cells, thin film solar cells, single-junction solar cells, and multi-junction solar cells.

13. A semiconductor device comprising:

a circuitry die comprising:

a plurality of interconnect layers on a front side of the circuitry die, and

a metallization layer on a back side of the circuitry die; and

a solar cell die configured to power the circuitry die, the solar cell die comprising:

a transparent contact on a front side of the solar cell die, wherein

a back side of the solar cell die is attached to the back side of the circuitry die and makes electrical contact with the metallization layer on the back side of the circuitry die; and

at least one power TSV (through silicon via) filled with a metal plug that contacts and extends from a portion of a last metal interconnect layer on the front side of the circuitry die to the transparent contact on the front side of the solar cell die, wherein

the at least one power TSV is surrounded by a non-conductive liner that insulates the at least one power TSV from the plurality of interconnect layers except the last metal interconnect layer.

14. The semiconductor device of claim 13 , wherein

the semiconductor device has a surface area smaller than one square centimeter.

15. The semiconductor device of claim 13 , further comprising:

a package having a window, wherein

the circuitry die is attached to an interior surface of the package, and

the solar cell die is exposed to light through the window.

16. The semiconductor device of claim 13 , wherein the circuitry die further comprises:

at least one ground TSV filled with a metal plug that contacts and extends from another portion of the last metal interconnect layer on the front side of the circuitry die to the metallization layer on the back side of the circuitry die.

17. A semiconductor device comprising:

a circuitry wafer comprising:

a plurality of interconnect layers on a front side of the circuitry wafer,

a metallization layer on a back side of the circuitry wafer, and

a plurality of TSVs (through silicon vias) each filled with a metal plug that contacts and extends from a respective portion of a last metal interconnect layer on the front side of the circuitry wafer to the metallization layer on the back side of the circuitry wafer; and

a solar cell wafer comprising:

a transparent contact on a front side of the solar cell wafer, wherein

a back side of the solar cell wafer is attached to the back side of the circuitry wafer and makes electrical contact with the metallization layer on the back side of the circuitry wafer.

18. The semiconductor device of claim 17 , further comprising:

a plurality of power TSVs each filled with a metal plug that contacts and extends from another respective portion of the last metal interconnect layer on the front side of the circuitry wafer to the transparent contact on the front side of the solar cell wafer.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →