Manufacturing method of semiconductor device
A method for manufacturing a semiconductor device includes the steps of forming a first insulating film over a first gate electrode over a substrate while heated at a temperature higher than or equal to 450° C. and lower than the strain point of the substrate, forming a first oxide semiconductor film over the first insulating film, adding oxygen to the first oxide semiconductor film and then forming a second oxide semiconductor film over the first oxide semiconductor film, and performing heat treatment so that part of oxygen contained in the first oxide semiconductor film is transferred to the second oxide semiconductor film.
1. A method for manufacturing a semiconductor device comprising the steps of:
forming a first gate electrode over a substrate;
forming a first insulating film in contact with the first gate electrode while heating the substrate at a temperature higher than or equal to 450° C. and lower than a strain point of the substrate;
forming a first oxide semiconductor film in contact with the first insulating film;
adding oxygen to the first oxide semiconductor film;
forming a second oxide semiconductor film in contact with the first oxide semiconductor film after adding the oxygen to the first oxide semiconductor film;
performing a first heat treatment after forming the second oxide semiconductor film;
etching part of the first insulating film, part of the first oxide semiconductor film, and part of the second oxide semiconductor film, whereby forming a first gate insulating film having a projection, an etched first oxide semiconductor film, and an etched second oxide semiconductor film;
forming a pair of electrodes in contact with the etched second oxide semiconductor film;
forming a third oxide semiconductor film in contact with the etched second oxide semiconductor film and the pair of electrodes;
forming a second gate insulating film in contact with the third oxide semiconductor film; and
forming a second gate electrode in contact with the second gate insulating film.
2. The method for manufacturing the semiconductor device according to claim 1 , wherein the oxygen is added to the first oxide semiconductor film by an ion implantation method, an ion doping method, or a plasma treatment.
3. The method for manufacturing the semiconductor device according to claim 1 ,
wherein after the formation of the third oxide semiconductor film, oxygen is added to the third oxide semiconductor film, and then a second heat treatment is performed, and
wherein the second gate insulating film is formed in contact with the heated third oxide semiconductor film.
4. The method for manufacturing the semiconductor device according to claim 3 , wherein a temperature of the second heat treatment is lower than a temperature at which the first insulating film is formed.
5. The method for manufacturing the semiconductor device according to claim 1 , wherein a temperature of the first heat treatment is lower than a temperature at which the first insulating film is formed.
6. The method for manufacturing the semiconductor device according to claim 1 , wherein each of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film contains In or Ga.
7. The method for manufacturing the semiconductor device according to claim 1 , wherein an energy level at a conduction band minimum of each of the first and third oxide semiconductor films is closer to a vacuum level than that of the second oxide semiconductor film is.
8. The method for manufacturing the semiconductor device according to claim 1 , wherein a difference between an energy level at a conduction band minimum of the second oxide semiconductor film and an energy level at a conduction band minimum of each of the first and third oxide semiconductor films is greater than or equal to 0.05 eV and less than or equal to 2 eV.
9. A method for manufacturing a semiconductor device comprising the steps of:
forming a first gate electrode over a substrate;
forming a first insulating film in contact with the first gate electrode while heating the substrate at a temperature higher than or equal to 450° C. and lower than a strain point of the substrate;
forming a first oxide semiconductor film in contact with the first insulating film;
adding oxygen to the first oxide semiconductor film;
forming a second oxide semiconductor film in contact with the first oxide semiconductor film after adding the oxygen to the first oxide semiconductor film;
performing a first heat treatment after forming the second oxide semiconductor film;
forming a conductive film over the second oxide semiconductor film after performing the first heat treatment;
etching part of the first insulating film, part of the first oxide semiconductor film, part of the second oxide semiconductor film, and part of the conductive film, whereby forming a first gate insulating film having a projection, an etched first oxide semiconductor film, an etched second oxide semiconductor film, and an etched conductive film;
forming a pair of electrodes by etching the etched conductive film;
forming a third oxide semiconductor film in contact with the etched second oxide semiconductor film and the pair of electrodes;
forming a second gate insulating film in contact with the third oxide semiconductor film; and
forming a second gate electrode in contact with the second gate insulating film.
10. The method for manufacturing the semiconductor device according to claim 9 , wherein the oxygen is added to the first oxide semiconductor film by an ion implantation method, an ion doping method, or a plasma treatment.
11. The method for manufacturing the semiconductor device according to claim 9 ,
wherein after the formation of the third oxide semiconductor film, oxygen is added to the third oxide semiconductor film, and then a second heat treatment is performed, and
wherein the second gate insulating film is formed in contact with the heated third oxide semiconductor film.
12. The method for manufacturing the semiconductor device according to claim 11 , wherein a temperature of the second heat treatment is lower than a temperature at which the first insulating film is formed.
13. The method for manufacturing the semiconductor device according to claim 9 , wherein a temperature of the first heat treatment is lower than a temperature at which the first insulating film is formed.
14. The method for manufacturing the semiconductor device according to claim 9 , wherein each of the first oxide semiconductor film, the second oxide semiconductor film, and the third oxide semiconductor film contains In or Ga.
15. The method for manufacturing the semiconductor device according to claim 9 , wherein an energy level at a conduction band minimum of each of the first and third oxide semiconductor films is closer to a vacuum level than that of the second oxide semiconductor film is.
16. The method for manufacturing the semiconductor device according to claim 9 , wherein a difference between an energy level at a conduction band minimum of the second oxide semiconductor film and an energy level at a conduction band minimum of each of the first and third oxide semiconductor films is greater than or equal to 0.05 eV and less than or equal to 2 eV.