IP Library › Granted Patent US 9,748,326
Granted Patent B2
US 9,748,326 · App. 14/720,301 · Granted Aug 29, 2017

Structure of integrated inductor

Inventors: Hsiao-Tsung Yen (Hsinchu, TW); Yuh-Sheng Jean (Hsinchu County, TW); Ta-Hsun Yeh (Hsinchu, TW)
Assignee: REALTEK SEMICONDUCTOR CORPORATION
H01L28/10H01F17/0006H01F17/0013H01F27/2804H01L23/481H01L23/528H01L23/5227H01L23/645H01L24/16H01L25/065H01L25/0657H01F2027/2809H01L2224/16148H01L2225/06513H01L2225/06541H01L2924/0002H01L2924/14211H01L2924/19011H01L2924/19042H01L2924/30107
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,748,326
App. No.
14/720,301
Granted
Aug 29, 2017
Kind
B2
Abstract

This invention discloses a structure of an integrated inductor, comprising: an outer metal segment which comprises a first metal sub-segment and a second metal sub-segment; an inner metal segment which is arranged inside an area surrounded by the outer metal segment and comprises a third metal sub-segment and a fourth metal sub-segment; and at least a connecting structure for connecting the outer metal segment and the inner metal segment. The first metal sub-segment corresponds to the third metal sub-segment, and the first metal sub-segment and the third metal sub-segment belong to different metal layers in a semiconductor structure. The second metal sub-segment corresponds to the fourth metal sub-segment, and the second metal sub-segment and the fourth metal sub-segment belong to different metal layers in a semiconductor structure.

Claims (26)

1. An integrated inductor structure, comprising:

an outer metal segment;

an inner metal segment in an area surrounded by the outer metal segment;

at least a bridging metal segment for connecting the outer metal segment and the inner metal segment; and

at least a connecting structure for connecting the bridging metal segment and the outer metal segment or the inner metal segment;

wherein, the outer metal segment and the inner metal segment are on different metal layers of a semiconductor structure;

wherein the outer metal segment comprises:

a first metal segment connecting a first bridging metal segment through a first connecting structure; and

a second metal segment connecting a second bridging metal segment;

wherein, the first bridging metal segment connects the inner metal segment and the second bridging metal segment connects the inner metal segment through a second connecting structure.

2. The integrated inductor structure of claim 1 , wherein a thickness of a metal layer of the outer metal segment is smaller than a thickness of a metal layer of the inner metal segment.

3. The integrated inductor structure of claim 1 , wherein the outer metal segment and the inner metal segment belong to different dies and the connecting structure is a micro bump.

4. The integrated inductor structure of claim 1 , wherein the outer metal segment is in a first oxide layer, the inner metal segment is in a second oxide layer, a silicon layer is disposed between the first oxide layer and the second oxide layer, and the connecting structure is a through-silicon via.

5. The integrated inductor structure of claim 4 , wherein the first oxide layer, the silicon layer and the second oxide layer form a die and the first oxide layer and the second oxide layer are the front side and the back side of the die, respectively.

6. The integrated inductor structure of claim 1 being a symmetric spiral inductor structure.

7. An integrated inductor structure, comprising:

an outer metal segment;

an inner metal segment in an area surrounded by the outer metal segment;

at least a bridging metal segment for connecting the outer metal segment and the inner metal segment; and

at least a connecting structure for connecting the bridging metal segment and the outer metal segment or the inner metal segment;

wherein, the outer metal segment and the inner metal segment are on different metal layers of a semiconductor structure;

wherein, the outer metal segment is in a first oxide layer, the inner metal segment is in a second oxide layer, a silicon layer is disposed between the first oxide layer and the second oxide layer, and the connecting structure is a through-silicon via;

wherein, the first oxide layer, the silicon layer and the second oxide layer form a die and the first oxide layer and the second oxide layer are the front side and the back side of the die, respectively.

8. The integrated inductor structure of claim 7 , wherein a thickness of a metal layer of the outer metal segment is smaller than a thickness of a metal layer of the inner metal segment.

9. The integrated inductor structure of claim 7 , wherein the outer metal segment and the inner metal segment belong to different dies and the connecting structure is a micro bump.

10. The integrated inductor structure of claim 7 being a symmetric spiral inductor structure.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 22, 2015
From: YEN, HSIAO-TSUNG; JEAN, YUH-SHENG; YEH, TA-HSUN
To: REALTEK SEMICONDUCTOR CORPORATION
Reel/Frame 035701/0727 →
Priority Claims (1)
TW 103134815 A · Oct 6, 2014 · national
Continuity (1)
Related Publication 20160099301A1 · Apr 7, 2016