IP Library › Granted Patent US 9,739,738
Granted Patent B2
US 9,739,738 · App. 14/723,379 · Granted Aug 22, 2017

Gas sensor element

Inventor: Ekambaram Sambandan (Carlsbad, CA)
Assignee: NITTO DENKO CORPORATION
G01N27/125G01N33/0047G01N33/497H01L29/04H01L29/24G01N2001/2244G01N2033/4975G01N2800/042
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,739,738
App. No.
14/723,379
Granted
Aug 22, 2017
Kind
B2
Abstract

Described herein are sensor elements for detecting the presence of organic materials comprising a boron doped n-type semiconductor material with decrease in resistivity upon organic materials exposure with increase in resistivity upon organic materials exposure.

Claims (22)

1. A method for determining acetone in a subject's breath comprising exposing a mammalian breath sample to a gas sensor, the sensor comprising a gas sensor element comprising:

a first electrode and second electrode, wherein the first electrode and the second electrode are separated by a gap of about 1 to about 10 mils; and

a polycrystalline n-type semiconductor material comprising:

epsilon phase WO 3 that is doped with boron; or

gamma phase WO 3 mixed with CeO 2 ;

wherein the polycrystalline n-type semiconductor material physically contacts both the first and second electrodes; and

wherein the presence of acetone is detected by a change in resistivity across the sensor.

2. The method of claim 1 , wherein the boron is present at about 0.001% to about 1% by weight of the polycrystalline n-type semiconductor material.

3. The method of claim 1 , wherein the polycrystalline n-type semiconductor material is combustion synthesized.

4. The method of claim 1 , wherein the polycrystalline n-type semiconductor is at a temperature of about 190° C. to about 360° C.

5. The method of claim 1 , further comprising a noble metal mixed with the polycrystalline n-type semiconductor material.

6. The method of claim 5 , wherein the noble metal is palladium, gold, platinum or iridium.

7. The method of claim 1 , wherein the gamma phase WO 3 is mixed with CeO 2 .

8. The method of claim 7 , wherein the polycrystalline n-type semiconductor material is exposed to blue light.

9. The method of claim 8 , wherein the polycrystalline n-type semiconductor material is at a temperature of about 10° C. to about 40° C.

10. The method of claim 8 , wherein the gamma phase WO 3 mixed with CeO 2 is about 40-60 molar % WO 3 .

11. The method of claim 1 , wherein the polycrystalline n-type semiconductor material is ball milled.

12. The method of claim 1 , wherein the gas sensor operating temperature is from about 10° C. to about 50° C. and the gas sensor element is exposed to blue light.

13. The method of claim 1 , wherein the gas sensor operating temperature is about 190° C. to about 360° C.

14. The method of claim 13 , wherein the sensor is not exposed to blue light.

15. The method of claim 13 , wherein the gas sensor operating temperature is from about 280° C. to about 360° C., and the gas sensor is more sensitive to isoprene than to acetone.

16. The method of claim 1 , wherein the gas sensor operating temperature is from about 180° C. to about 240° C., and the gas sensor is more sensitive to acetone than to isoprene.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 29, 2015
From: SAMBANDAN, EKAMBARAM
To: NITTO DENKO CORPORATION
Reel/Frame 035931/0541 →
Continuity (3)
Provisional Application 62003753 · May 28, 2014
Provisional Application 62107961 · Jan 26, 2015
Related Publication 20150346190A1 · Dec 3, 2015