IP Library Granted Patent US 10,380,290
Granted Patent B1
US 10,380,290 · App. 14/742,265 · Granted Aug 13, 2019

Systems and methods for parallel transient analysis and simulation

Inventor: Ehsan Rasekh (Cambridge, MA)
Assignee: Ansys, Inc.
G06F17/5036
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Quick Facts
Patent No.
US 10,380,290
App. No.
14/742,265
Granted
Aug 13, 2019
Kind
B1
Abstract

Systems and methods are provided for performing parallel transient simulations for an electrical circuit. A plurality of segments are generated from a simulation length, and simulations are performed using a plurality of processors for the segments to generate simulation results. An output is generated based at least in part on the simulation results.

Claims (79)

1. A processor-implemented system for performing parallel transient simulations for an electrical circuit, the system comprising:

a plurality of data processors configured to:

receive data corresponding to a design of an electrical circuit;

generate a plurality of segments from a simulation period for the electrical circuit, the plurality of segments corresponding to the plurality of data processors, one or more of the segments including one or more overlap time periods;

perform transient simulations for the plurality of segments in parallel to generate simulation results based on the design of the electrical circuit, a part of the simulation results associated with the one or more overlap time periods; and

generate a simulation output for the electrical circuit based at least in part on the simulation results, wherein the simulation output excludes the part of the simulation results associated with the one or more overlap time periods;

a non-transitory computer-readable storage medium configured to store data related to the simulation results, data related to the plurality of segments, and data related to the one or more overlap time periods.

2. The system of claim 1 , wherein each overlap time period has a predetermined duration corresponding to a time constant of the electrical circuit.

3. The system of claim 1 , wherein the plurality of data processors are configured to simultaneously perform transient simulations for the plurality of segments respectively.

4. The system of claim 1 , wherein the plurality of data processors are further configured to:

concatenate the remaining simulation results after the exclusion of the simulation results associated with the one or more overlap time periods for generating the simulation output.

5. The system of claim 1 , wherein the plurality of data processors are further configured to:

exclude the one or more overlap time periods from the plurality of segments; and

concatenate the remaining segments after the exclusion of the one or more overlap time periods for generating the simulation output.

6. The system of claim 1 , wherein:

the simulation length includes a first segment and a second segment, the first segment preceding the second segment, a first overlap time period being added to the beginning of the second segment; and

a first data processor and a second data processor are configured to:

perform transient simulations for the first segment and the second segment in parallel to generate the simulation results;

exclude part of the simulation results associated with the first overlap time period;

and

generate the simulation output based at least in part on the exclusion of the simulation results associated with the first overlap time period.

7. The system of claim 6 , wherein the first data processor and the second data processor are further configured to:

concatenate the remaining simulation results after the exclusion of the simulation results associated with the first overlap time period for generating the simulation output.

8. The system of claim 6 , wherein the first data processor and the second data processor are further configured to:

exclude the first overlap time period from the second segment after the performing of the transient simulations; and

concatenate the first segment and the remaining second segment after the exclusion of the first overlap time period for generating the simulation output.

9. The system of claim 6 , wherein:

the end of the first overlap time period corresponds to the beginning of the second segment; and

the first overlap time period corresponds to a latter part of the first segment.

10. The system of claim 6 , wherein:

the simulation length includes a third segment in addition to the first segment and the second segment, the third segment following the second segment, a second overlap time period being added to the beginning of the third segment; and

a third data processor is further configured to perform transient simulations for the third segment in parallel with the first data processor and the second data processor and exclude part of the simulation results associated with the second overlap time period for generating the simulation output.

11. A processor-implemented system for performing parallel transient simulations for an electrical circuit, the system comprising:

a plurality of data processors configured to:

receive data corresponding to a design of an electrical circuit;

generate a plurality of segments from a simulation period for the electrical circuit, the plurality of segments corresponding to the plurality of data processors, one or more of the segments including one or more overlap time periods;

perform transient simulations for the plurality of segments in parallel to generate simulation results based on the design of the electrical circuit;

calculate one or more error parameters associated with the one or more overlap time periods;

in response to the one or more error parameters not being within a range, adjust the duration of the one or more overlap time periods until the one or more error parameters fall within the range; and

in response to the one or more error parameters being within the range, generate a simulation output based at least in part on the simulation results;

a non-transitory computer-readable storage medium configured to store data related to the simulation results, data related to the one or more error parameters, and data related to the one or more overlap time periods.

12. The system of claim 11 , wherein the plurality of data processors are further configured to use an iterative algorithm to change the duration of the one or more overlap time periods until the error parameters fall within the range.

13. The system of claim 11 , wherein the duration of each overlap time period is equal to or larger than a time constant of the electrical circuit.

14. The system of claim 11 , wherein the plurality of data processors are further configured to calculate the one or more error parameters at the end of the one or more overlap time periods.

15. The system of claim 11 , wherein the plurality of data processors are configured to simultaneously perform transient simulations for the plurality of segments respectively.

16. The system of claim 11 , wherein the plurality of data processors are further configured to:

determine a final duration of the one or more overlap time periods when the one or more error parameters fall within the range;

exclude part of the simulation results associated with the one or more overlap time periods; and

generate the simulation output for the electrical circuit based at least in part on the removal of the simulation results associated with the one or more overlap time periods.

17. The system of claim 11 , wherein the plurality of data processors are further configured to calculate the error parameters associated with the one or more overlap time periods in parallel.

18. The system of claim 11 , wherein the plurality of data processors are further configured to, in response to the one or more error parameters not being within the range,

increase the duration of the one or more overlap time periods;

perform transient simulations for the plurality of segments in parallel; and

calculate the one or more error parameters at the end of the one or more overlap time periods with the increased duration.

19. A processor-implemented method for performing parallel transient simulations for an electrical circuit, the method comprising:

receiving, using a plurality of data processors data corresponding to a design of an electrical circuit;

generating, using the plurality of data processors, a plurality of segments from a simulation period for an electrical circuit, the plurality of segments corresponding to the plurality of data processors, one or more of the segments including one or more overlap time periods;

performing, using the plurality of data processors, transient simulations for the plurality of segments in parallel to generate simulation results based on the design of the electrical circuit, the simulation results being stored in one or more non-transitory computer-readable storage media, a part of the simulation results associated with the one or more overlap time periods; and

generating, using the plurality of data processors, a simulation output for the electrical circuit based at least in part on the simulation results, wherein the simulation output excludes the part of the simulation results associated with the one or more overlap time periods.

20. A processor-implemented method for performing parallel transient simulations for an electrical circuit, the method comprising:

receiving, using a plurality of data processors data corresponding to a design of an electrical circuit;

generating, using a plurality of data processors, a plurality of segments from a simulation period for an electrical circuit, the plurality of segments corresponding to the plurality of data processors, the one or more of the segments including one or more overlap time periods of a duration to one or more of the segments;

performing, using the plurality of data processors, transient simulations for the plurality of segments in parallel to generate simulation results based on the design of the electrical circuit;

calculating, using the plurality of data processors, one or more error parameters associated with the one or more overlap time periods;

in response to the one or more error parameters not being within a range, adjusting the duration of the one or more overlap time periods until the one or more error parameters fall within the range; and

in response to the one or more error parameters being within the range, generating, using the plurality of data processors, a simulation output based at least in part on the simulation results.

21. A non-transitory computer-readable storage medium encoded with instructions for commanding a plurality of data processors to execute operations of a method for performing parallel transient simulations for an electrical circuit, the method comprising:

receiving data corresponding to a design of an electrical circuit;

generating a plurality of segments from a simulation period for the electrical circuit, the plurality of segments corresponding to the plurality of data processors, one or more of the segments including one or more overlap time periods;

performing transient simulations for the plurality of segments in parallel to generate simulation results based on the design of the electrical circuit, a part of the simulation results associated with the one or more overlap time periods; and

generating a simulation output for the electrical circuit based at least in part on the simulation results, wherein the simulation output excludes the part of the simulation results associated with the one or more overlap time periods;

a non-transitory computer-readable storage medium configured to store data related to the simulation results, data related to the plurality of segments, and data related to the one or more overlap time periods.

22. A non-transitory computer-readable storage medium encoded with instructions for commanding a plurality of data processors to execute operations of a method for performing parallel transient simulations for an electrical circuit, the method comprising:

receiving data corresponding to a design of an electrical circuit;

generating a plurality of segments from a simulation period for an electrical circuit, the plurality of segments corresponding to the plurality of data processors, one or more of the segments including one or more overlap time periods of a duration to one or more of the segments;

performing transient simulations for the plurality of segments in parallel to generate simulation results for the electrical circuit;

calculating one or more error parameters associated with the one or more overlap time periods;

in response to the one or more error parameters not being within a range, adjusting the duration of the one or more overlap time periods until the one or more error parameters fall within the range; and

in response to the one or more error parameters being within the range, generating a simulation output based at least in part on the simulation results.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded May 11, 2017
From: SAS IP, INC.; ANSYS, INC.
To: ANSYS, INC.
Reel/Frame 042335/0979 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 9, 2015
From: RASEKH, EHSAN
To: SAS IP, INC.
Reel/Frame 037243/0307 →
Continuity (1)
Provisional Application 62016417 · Jun 24, 2014
Cited By (2)
US 12,265,767 US 12,333,232