IP Library › Granted Patent US 9,455,699
Granted Patent B2
US 9,455,699 · App. 14/746,920 · Granted Sep 27, 2016

Semiconductor integrated circuit device

Inventors: Yusuke Kanno (Kodaira, JP); Hiroyuki Mizuno (Musashino, JP); Yoshihiko Yasu (Kodaira, JP); Kenji Hirose (Tokorozawa, JP); Takahiro Irita (Kodaira, JP)
Assignee: Renesas Electronics Corporation
H03K17/16G06F17/5068H01L23/48H01L23/50H01L23/528H01L27/0207H01L27/11898H03K3/0375G06F17/5072H01L27/00H01L27/02H01L27/0203H01L29/7835H01L2924/0002
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Quick Facts
Patent No.
US 9,455,699
App. No.
14/746,920
Granted
Sep 27, 2016
Kind
B2
Abstract

A semiconductor integrated circuit device having a control signal system for avoiding failure to check an indefinite signal propagation prevention circuit, for facilitating a check included in an automated tool, and for facilitating a power shutdown control inside a chip. In the semiconductor integrated circuit device, power shutdown priorities are provided by independent power domains (Area A to Area I). A method for preventing a power domain having a lower priority from being turned OFF when a circuit having a high priority is turned ON is also provided.

Claims (23)

1. A semiconductor integrated circuit device formed on one chip comprising:

a first functional block connected to a first power supply line and a second power supply line;

a second functional block connected to the first power supply line and a third power supply line and communicating with the first functional block;

a third functional block connected to the first power supply line and a fourth power supply line and communicating with the first functional block;

a first power switch shutting down the first functional block from power supply via the second power supply line;

a second power switch shutting down the second functional block from power supply via the third power supply line; and

a third power switch shutting down the third functional block from power supply via the fourth power supply line,

wherein the first functional block is shut down by the first switch when the second and the third functional blocks are shut down,

wherein the first functional block includes a first well of a first conduction type,

wherein the second functional block includes a second well of the first conduction type,

wherein a third well of a second conduction type separates the first well and the second well.

2. A semiconductor integrated circuit device according to claim 1 ,

wherein the first conduction type is N-type and the second conduction type is P-type.

3. A semiconductor integrated circuit device according to claim 2 ,

wherein a first voltage is supplied to the first power supply line and a second voltage is supplied to the second and the fourth power supply lines.

4. A semiconductor integrated circuit device according to claim 3 ,

wherein the first voltage is higher than the second voltage.

5. A semiconductor integrated circuit device according to claim 1 ,

wherein a signal transmission between the second functional block and the third functional block is performed via the first functional block.

6. A semiconductor integrated circuit device according to claim 5 ,

wherein the signal transmission between the second functional block and the third functional block is performed via a signal relay buffer circuit provided in the first functional block.

7. A semiconductor integrated circuit device according to claim 6 ,

wherein the first functional block comprises a retaining latch circuit that saves a data from one of the second and third functional blocks.

Assignments (1)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
Priority Claims (1)
JP 2005-166714 · Jun 7, 2005 · national
Continuity (7)
Continuation 14187030 · Feb 21, 2014
Continuation 13865662 · Apr 18, 2013
Continuation 13438347 · Apr 3, 2012
Division 13225401 · Sep 2, 2011
Division 12566323 · Sep 24, 2009
Division 11447168 · Jun 6, 2006
Related Publication 20150295572A1 · Oct 15, 2015