IP Library Granted Patent US 10,229,726
Granted Patent B2
US 10,229,726 · App. 14/747,679 · Granted Mar 12, 2019

Memory circuit for reading ferroeletric memory having gain element including feedback capacitor

Inventors: David Eric Schwartz (San Carlos, CA); Tse Nga Ng (Sunnyvale, CA); Ping Mei (San Jose, CA)
Assignee: Palo Alto Research Center Incorporated
G11C11/2273G11C11/221
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Quick Facts
Patent No.
US 10,229,726
App. No.
14/747,679
Granted
Mar 12, 2019
Kind
B2
Abstract

A memory circuit has a ferroelectric memory cell having a word line and a bit line, an input transistor connected to the bit line, a gain element electrically connected the bit line, wherein the gain element includes a feedback capacitor, and an output terminal. A method of reading a memory cell includes applying a voltage to a word line of the memory cell, causing charge to transfer from the memory cell to a feedback capacitor, generating a voltage, amplifying the voltage by applying a gain having a magnitude of less than three, sensing an output voltage at an output node to determine a state of the memory cell, and storing the memory state in a latch.

Claims (32)

1. A memory circuit, comprising:

an output terminal; and

a memory circuit core electrically connected to the output terminal, comprising:

a ferroelectric memory cell between a word line and a bit line;

a voltage generator connected between the word line and a ground; and

a gain element electrically connected to the bit line, wherein the gain element has a feedback capacitor connected between the bit line and the output terminal, and a single transistor connected between the bit line and the output terminal, wherein an output of the memory cell is read at the output terminal.

2. The memory circuit of claim 1 , further comprising a latch electrically connected to the output terminal.

3. The memory circuit of claim 2 , wherein the latch comprises a pair of cross-coupled transistors.

4. The memory circuit of claim 1 , further comprising a reset transistor connected to the bit line of the memory cell.

5. The memory circuit of claim 1 , wherein the feedback capacitor value is selected to cause a bias across the memory cell during a read operation sufficient to write the memory cell.

6. The memory circuit of claim 1 , wherein the memory circuit is implemented in a single transistor polarity.

7. The memory circuit of claim 1 , further comprising at least one power switch connected to the memory circuit to turn off the memory circuit.

8. The memory circuit of claim 1 , wherein the at least one power switch comprises three power switches.

9. The memory circuit of claim 1 , wherein the input transistor comprises a thin film transistor.

10. The memory circuit of claim 9 , wherein the thin film transistor comprises a solution-processed thin film transistor.

11. The memory circuit of claim 1 , wherein the memory circuit comprises an integrated, thin film transistor memory circuit.

12. A method of reading a memory cell, comprising:

applying a voltage to a word line of the memory cell, causing charge to transfer from the memory cell to a feedback capacitor in a gain element, generating a voltage;

amplifying the voltage by applying a gain having a magnitude of less than three using the gain element having the feedback capacitor and a single transistor;

sensing an output voltage at an output terminal to read a state of the memory cell; and

storing the memory state in a latch.

13. The method of claim 12 , wherein applying the voltage to the word line causes the memory cell to be written to a memory state.

14. A memory circuit, comprising:

an output terminal; and

a memory circuit core, comprising:

a ferroelectric memory cell between a word line and a bit line;

an input transistor connected to the bit line; and

a gain element electrically connected the bit line, wherein the gain element has a feedback capacitor connected between the bit line and the output terminal, and a has a gain of three or less, wherein an output of the memory cell is read at the output terminal.

15. The memory circuit of claim 14 , further comprising a latch electrically connected to the output terminal.

16. The memory circuit of claim 15 , wherein the latch comprises a pair of cross-coupled transistors.

17. The memory circuit of claim 14 , further comprising a reset transistor connected to the bit line of the memory cell.

18. The memory circuit of claim 14 , wherein the memory circuit is implemented in a single transistor polarity.

Assignments (9)
SECOND LIEN NOTES PATENT SECURITY AGREEMENT Recorded Jul 2, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 071785/0550 →
FIRST LIEN NOTES PATENT SECURITY AGREEMENT Recorded Apr 11, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 070824/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
SECURITY INTEREST Recorded Feb 13, 2024
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 066741/0001 →
SECURITY INTEREST Recorded Nov 20, 2023
From: XEROX CORPORATION
To: JEFFERIES FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 065628/0019 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVAL OF US PATENTS 9356603, 10026651, 10626048 AND INCLUSION OF US PATENT 7167871 PREVIOUSLY RECORDED ON REEL 064038 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 28, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064161/0001 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064038/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 23, 2015
From: SCHWARTZ, DAVID ERIC; NG, TSE NGA; MEI, PING
To: PALO ALTO RESEARCH CENTER INCORPORATED
Reel/Frame 035885/0904 →
Continuity (1)
Related Publication 20160379703A1 · Dec 29, 2016