Compact Mass Spectrometer

1 . A mass spectrometer, comprising:

an ion source;

an ion trap;

an ion detector;

a pressure regulation system;

a voltage source connected to the ion source, the ion trap, the ion detector, and the pressure regulation system; and

a controller connected to the ion source, the ion trap, the ion detector, and the voltage source,

wherein during operation of the mass spectrometer, the controller is configured to:

activate the ion source to generate ions from gas particles;

activate the ion detector to detect ions generated by the ion source; and

adjust a resolution of the mass spectrometer based on the detected ions.

2 . The mass spectrometer of claim 1 , wherein the controller is connected to the pressure regulation system and configured to adjust the resolution by activating the pressure regulation system to change a gas pressure in at least one of the ion source and the ion trap.

3 . The mass spectrometer of claim 2 , wherein the controller is configured to increase the resolution by activating the pressure regulation system to reduce the gas pressure in the at least one of the ion source and the ion trap.

4 . The mass spectrometer of claim 1 , wherein the controller is configured to:

repeatedly apply an electrical potential using the voltage source to a central electrode of the ion trap to eject ions from the trap, the repeated applications of the electrical potential defining a repetition frequency of the electrical potential, and

adjust the resolution by changing the repetition frequency of the electrical potential.

5 . The mass spectrometer of claim 4 , wherein the controller is configured to increase the resolution by increasing the repetition frequency of the electrical potential.

6 . The mass spectrometer of claim 1 , wherein the controller is configured to adjust the resolution by changing a maximum amplitude of an electrical potential applied to a central electrode of the ion trap by the voltage source.

7 . The mass spectrometer of claim 1 , wherein the controller is configured to:

apply an axial electrical potential difference between electrodes at opposite ends of the ion trap using the voltage source; and

adjust the resolution by changing a magnitude of the axial electrical potential difference.

8 . The mass spectrometer of claim 7 , wherein the controller is configured to increase the resolution by increasing a magnitude of the axial electrical potential difference.

9 . The mass spectrometer of claim 4 , wherein the controller is configured to:

repeatedly apply an electrical potential difference between electrodes of the ion source using the voltage source to generate the ions, the repeated applications of the electrical potential defining a repetition frequency of the ion source; and

adjust the resolution by changing the repetition frequency of the ion source.

10 . The mass spectrometer of claim 9 , wherein the controller is configured to synchronize the repetition frequency of the ion source and the repetition frequency of the electrical potential applied to the central electrode of the ion trap.

11 . The mass spectrometer of claim 1 , wherein the controller is configured to:

repeatedly apply an electrical potential difference between electrodes of the ion source using the voltage source, wherein:

the repeated applications of the electrical potential define a repetition period of the ion source; and

the repetition period comprises a first time interval during which the electrical potential difference is applied between the electrodes of the ion source, and a second time interval during which the electrical potential difference is not applied between the electrodes of the ion source; and

adjust the resolution by adjusting a duty cycle of the ion source, wherein the duty cycle corresponds to a ratio of the first time interval to the repetition period.

12 . The mass spectrometer of claim 11 , wherein the controller is configured to increase the resolution by decreasing the duty cycle of the ion source.

13 . The mass spectrometer of claim 1 , further comprising:

a gas path, wherein the ion source, the ion trap, the ion detector, and the pressure regulation system are connected to the gas path; and

a buffer gas inlet connected to the gas path, and comprising a valve connected to the controller,

wherein the controller is configured to control the valve to adjust a rate at which buffer gas particles are introduced into the gas path through the buffer gas inlet to adjust the resolution.

14 . The mass spectrometer of claim 13 , wherein the controller is configured to increase the rate at which buffer gas particles are introduced into the gas path to increase the resolution.

15 . The mass spectrometer of claim 1 , wherein during operation of the mass spectrometer, the controller is configured to:

repeatedly activate the ion source to generate ions from gas particles, activate the ion detector to detect ions generated by the ion source, and adjust the resolution of the mass spectrometer based on the detected ions, until the resolution of the mass spectrometer reaches a threshold value;

activate the ion detector to detect ions generated from the gas particles when the resolution of the mass spectrometer is at least as large as the threshold value;

determine information about an identity of the gas particles based on ions detected when the resolution of the mass spectrometer is at least as large as the threshold value; and

display the information on a user interface.

16 . The mass spectrometer of claim 15 , wherein the information comprises a chemical name of the gas particles.

17 . The mass spectrometer of claim 15 , wherein the information comprises information about hazards associated with the gas particles.

18 . The mass spectrometer of claim 15 , wherein the information comprises information about a class of substances to which the gas particles correspond.

19 . The mass spectrometer of claim 15 , wherein during operation of the mass spectrometer, the controller is configured to adjust the voltage source so that an electrical potential is applied to a central electrode of the ion trap only when the resolution reaches the threshold value.

20 . The mass spectrometer of claim 1 , wherein during operation of the mass spectrometer, the pressure regulation system is configured to maintain a gas pressure in at least two of the ion source, the ion trap, and the ion detector of between 100 mTorr and 100 Torr.

21 - 45 . (canceled)